Abstract: A perovskite optical element includes a light guiding unit and a luminescent layer. The light guiding unit is configured to conduct light and serves as a resonant cavity. The luminescent layer is a thin film made of perovskite material and clads the light guiding unit. The luminescent layer is configured to be excited by an excitation module to emit light. The light is conducted and output by the light guiding unit. A manufacturing method of a perovskite optical element includes preparing a dip coating solution; dipping a single crystal optical fiber in the dip coating solution for one hour, removing the single crystal optical fiber out of the dip coating solution, and drying the single crystal optical fiber; and placing the single crystal optical fiber into a tube furnace, heating the crystal optical fiber, and introducing synthetic molecules into the tube furnace.

Abstract: A perovskite optical element includes a light guiding unit and a luminescent layer. The light guiding unit is configured to conduct light and serves as a resonant cavity. The luminescent layer is a thin film made of perovskite material and clads the light guiding unit. The luminescent layer is configured to be excited by an excitation module to emit light. The light is conducted and output by the light guiding unit. A manufacturing method of a perovskite optical element includes preparing a dip coating solution; dipping a single crystal optical fiber in the dip coating solution for one hour, removing the single crystal optical fiber out of the dip coating solution, and drying the single crystal optical fiber; and placing the single crystal optical fiber into a tube furnace, heating the crystal optical fiber, and introducing synthetic molecules into the tube furnace.

Abstract: The present invention relates to a humanity interface development system of a testing program of a circuit board, essentially including: building configuration of objects to be tested, defining footing of objects to be tested, using a program generator, building data of the testing chapters, building documents and figure files of objects to be tested, building reference data, building intercepted data of coordinates of positions of the parts, building relationships of items to failure rates of parts, and linking and compiling files, thereby forming a humanity interface, to build a data base required by the testing programs simultaneously, for testing the same circuit board in a large amount manner, thereby achieving the purpose of convenience and utility.

Abstract: A method for making negative thermal expansion material zirconium tungstate (ZrW2O8) comprise: (a)forming a gel wrapped solid product comprising a water-soluble zirconium compound, preferably zirconium oxyhalides or zirconium oxynitrates and a water-insoluble tungsten compound, preferably tungsten powder or tungsten oxide powder; and (b)heating the gel wrapped solid product to a temperature sufficient to form ZrW2O8; the temperature required for forming zirconium tungstate should be at least about 1165° C.; the upper limit of the temperature should be about 1250° C., and preferably should be about 1180˜1200° C.; and the time needed for the formation of zirconium tungstate is less than about 5 hours; this method has the advantages on enhancing the selectivity of the reactants, simplifying production process, reducing the cost of reagent, and facilitating the mass production for making ZrW2O8.

Abstract: The present invention relates to a humanity interface development system of a testing program of a circuit board, essentially including: building configuration of objects to be tested, defining footing of objects to be tested, using a program generator, building data of the testing chapters, building documents and figure files of objects to be tested, building reference data, building intercepted data of coordinates of positions of the parts, building relationships of items to failure rates of parts, and linking and compiling files, thereby forming a humanity interface, to build a data base required by the testing programs simultaneously, for testing the same circuit board in a large amount manner, thereby achieving the purpose of convenience and utility.