Patents by Inventor Derek Decker

Derek Decker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ASYMMETRIC QUADRATURE INTERFEROMETRY FOR THIN FILM INTERFERENCE SUPPRESSION IN OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20260029341
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
    Type: Application
    Filed: August 4, 2025
    Publication date: January 29, 2026
    Inventors: Craig Prater, Derek Decker, David Grigg
  • WIDE AREA OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20260029340
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Application
    Filed: July 31, 2025
    Publication date: January 29, 2026
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL IMAGING AND SPECTROSCOPY
    Publication number: 20260002817
    Abstract: A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
    Type: Application
    Filed: June 30, 2025
    Publication date: January 1, 2026
    Inventors: Craig Prater, Derek Decker, David Grigg
  • Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy
    Patent number: 12405215
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
    Type: Grant
    Filed: April 14, 2023
    Date of Patent: September 2, 2025
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, David Grigg
  • Wide area optical photothermal infrared spectroscopy
    Patent number: 12399117
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Grant
    Filed: October 30, 2023
    Date of Patent: August 26, 2025
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • Method and apparatus for high performance wide field photothermal imaging and spectroscopy
    Patent number: 12372401
    Abstract: A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
    Type: Grant
    Filed: February 1, 2021
    Date of Patent: July 29, 2025
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, David Grigg
  • Asymmetric interferometric optical photothermal infrared spectroscopy
    Patent number: 12276603
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Grant
    Filed: August 18, 2023
    Date of Patent: April 15, 2025
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, David Grigg, Derek Decker
  • PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULATION
    Publication number: 20250003797
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Application
    Filed: September 16, 2024
    Publication date: January 2, 2025
    Inventors: Derek Decker, Craig Prater
  • Photothermal infrared spectroscopy utilizing spatial light manipulation
    Patent number: 12140475
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: May 3, 2023
    Date of Patent: November 12, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater
  • ASYMMETRIC QUADRATURE INTERFEROMETRY FOR THIN FILM INTERFERENCE SUPPRESSION IN OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20240353324
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
    Type: Application
    Filed: April 14, 2023
    Publication date: October 24, 2024
    Inventors: Craig Prater, Derek Decker, David Grigg
  • Photothermal infrared spectroscopy utilizing spatial light manipulation
    Patent number: 12066328
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: September 28, 2022
    Date of Patent: August 20, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater
  • WIDE AREA OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20240060885
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Application
    Filed: October 30, 2023
    Publication date: February 22, 2024
    Applicant: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • ASYMMETRIC INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20240044782
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Application
    Filed: August 18, 2023
    Publication date: February 8, 2024
    Inventors: Craig Prater, David Grigg, Derek Decker
  • Wide area optical photothermal infrared spectroscopy
    Patent number: 11879837
    Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
    Type: Grant
    Filed: May 31, 2019
    Date of Patent: January 23, 2024
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Craig Prater, Derek Decker, Roshan Shetty
  • PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULATION
    Publication number: 20240011830
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Application
    Filed: May 3, 2023
    Publication date: January 11, 2024
    Inventors: Derek Decker, Craig Prater
  • Interferometric optical photothermal infrared spectroscopy
    Patent number: 11774354
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Grant
    Filed: September 28, 2022
    Date of Patent: October 3, 2023
    Assignee: Photothermal Spectroscopy Corp
    Inventors: Craig Prater, David Grigg, Derek Decker
  • INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
    Publication number: 20230236118
    Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
    Type: Application
    Filed: September 28, 2022
    Publication date: July 27, 2023
    Inventors: Craig Prater, David Grigg, Derek Decker
  • PHOTOTHERMAL INFRARED SPECTROSCOPY UTILIZING SPATIAL LIGHT MANIPULATION
    Publication number: 20230131208
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Application
    Filed: September 28, 2022
    Publication date: April 27, 2023
    Inventors: Derek Decker, Craig Prater
  • METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL IMAGING AND SPECTROSCOPY
    Publication number: 20230063843
    Abstract: A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
    Type: Application
    Filed: February 1, 2021
    Publication date: March 2, 2023
    Inventors: Craig Prater, Derek Decker, David Grigg
  • Photothermal infrared spectroscopy utilizing spatial light manipulation
    Patent number: 11486761
    Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
    Type: Grant
    Filed: May 31, 2019
    Date of Patent: November 1, 2022
    Assignee: Photothermal Spectroscopy Corp.
    Inventors: Derek Decker, Craig Prater