Patents by Inventor Derek E. Tyler

Derek E. Tyler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140014239
    Abstract: A process for manufacturing copper-nickel-silicon alloys includes the sequential steps of casting the copper alloy; hot working the cast copper-base alloy to effect a first reduction in cross-sectional area; solutionizing the cast copper-base alloy at a temperature and for a time effective to substantially form a single phase alloy; first age annealing the alloy at a temperature and for a time effective to precipitate an amount of a second phase effective to form a multi-phase alloy having silicides; cold working the multi-phase alloy to effect a second reduction in cross-sectional area; and second age annealing the multiphase alloy at a temperature and for a time effective to precipitate additional silicides thereby raising conductivity, wherein the second age annealing temperature is less than the first age annealing temperature.
    Type: Application
    Filed: April 17, 2013
    Publication date: January 16, 2014
    Applicants: Wieland-Werke AG, GBC Metals, LLC
    Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
  • Patent number: 8430979
    Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity contains, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up to 1% of silver.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: April 30, 2013
    Assignee: GBC Metals, LLC
    Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
  • Patent number: 8257515
    Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up 1% of silver. A process to manufacture the alloys of the invention as well as other copper-nickel-silicon alloys includes the sequential steps of (a). casting the copper alloy; (b). hot working the cast copper-base alloy to effect a first reduction in cross-sectional area; (c).
    Type: Grant
    Filed: October 7, 2005
    Date of Patent: September 4, 2012
    Assignees: GBC Metals, LLC, Wieland-Werke, AG
    Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
  • Publication number: 20090183803
    Abstract: A copper base alloy having an improved combination of yield strength and electrical conductivity consisting essentially of between about 1.0 and about 6.0 weight percent Ni, up to about 3.0 weight percent Co, between about 0.5 and about 2.0 weight percent Si, between about 0.01 and about 0.5 weight percent Mg, up to about 1.0 weight percent Cr, up to about 1.0 weight percent Sn, and up to about 1.0 weight percent Mn, the balance being copper and impurities, the alloy processed to have a yield strength of at least about 137 ksi, and an electrical conductivity of at least about 25% IACS.
    Type: Application
    Filed: December 17, 2008
    Publication date: July 23, 2009
    Inventors: Ralph A. Mutschler, Peter William Robinson, Derek E. Tyler, Andrea Kaufler, Hans-Achim Kuhn, Uwe Hofmann
  • Patent number: 7182823
    Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, from 0.5% to 1.5% of silicon, and the balance is copper and inevitable impurities. Further, the total nickel plus cobalt content is from 1.7% to 4.3%, the ratio of nickel to cobalt is from 1.01:1 to 2.6:1, the amount of (Ni+Co)/Si is between 3.5 and 6, the electrical conductivity is in excess of 40% IACS and the yield strength is in excess of 95 ksi. An optional inclusion is up 1% of silver. A process to manufacture the alloy includes the sequential steps of (a). casting; (b). hot working; (c). solutionizing; (d). first age annealing; (e). cold working; and (f). second age annealing wherein the second age annealing temperature is less than the first age annealing temperature.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: February 27, 2007
    Assignee: Olin Corporation
    Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
  • Patent number: 6905782
    Abstract: The present invention is directed to a coated substrate, comprising: an antitarnish layer deposited on a substrate in an amount effective to prevent tarnishing of said coated substrate; and an outer layer deposited onto said antitarnish layer, said outer layer comprising tin or tin alloys having at least 50% by weight tin. The present invention is also directed to coated substrates having a concentration gradient of antitarnish agent diffused into the coating, as well as methods of forming such coated substrates.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: June 14, 2005
    Assignee: Olin Corporation
    Inventors: Christopher P. Laurello, Derek E. Tyler, Szuchain Chen, Julius C. Fister
  • Publication number: 20040166017
    Abstract: An age-hardening copper-base alloy and processing method to make a commercially useful strip product for applications requiring high yield strength and moderately high electrical conductivity, in a strip, plate, wire, foil, tube, powder or cast form. The alloys are particularly suited for use in electrical connectors and interconnections. The alloys contain Cu—Ti—X where X is selected from Ni, Fe, Sn, P, Al, Zn, Si, Pb, Be, Mn, Mg, Ag, As, Sb, Zr, B, Cr and Co. and combinations thereof. The alloys offer excellent combinations of yield strength, and electrical conductivity, with excellent stress relaxation resistance. The yield strength is at least of 105 ksi and the electrical conductivity is at least 50% IACS.
    Type: Application
    Filed: September 5, 2003
    Publication date: August 26, 2004
    Applicants: Olin Corporation, Wieland-Werke AG
    Inventors: Ronald N. Caron, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Doris Humpenoder-Bogel, Hans-Achim Kuhn, Joerg Seeger
  • Publication number: 20040159379
    Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.
    Type: Application
    Filed: February 19, 2004
    Publication date: August 19, 2004
    Inventors: Andreas Bogel, Jorg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
  • Patent number: 6749699
    Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: June 15, 2004
    Assignees: Olin Corporation, Wieland-Werke AG
    Inventors: Andreas Bögel, Jörg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
  • Publication number: 20040079456
    Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up 1% of silver.
    Type: Application
    Filed: June 30, 2003
    Publication date: April 29, 2004
    Applicants: Onlin Corporation, Wieland Werke A.G.
    Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
  • Patent number: 6569543
    Abstract: A composite material includes a structural carrier layer and a relatively thin metal foil layer separated by a release layer. The release layer, that may be an admixture of a metal such as nickel or chromium and a non-metal such as chromium oxide, nickel oxide, chromium phosphate or nickel phosphate, provides a release force for the metal foil layer from the carrier strip that is typically on the order of 0.1 pound per inch to 2 pounds per inch. This provides sufficient adhesion to prevent premature separation of the metal foil layer from the carrier layer, but easy removal of the carrier layer when desired. The metal foil layer may be electrolytically formed copper having a low height profile, on the order of 0.5 micron to 2.7 microns, bond strength enhancing agent coating a side of the metal foil layer. The enhanced surface is subsequently bonded to a dielectric and the carrier layer then removed.
    Type: Grant
    Filed: February 15, 2001
    Date of Patent: May 27, 2003
    Assignee: Olin Corporation
    Inventors: William R. Brenneman, Szuchain F. Chen, Derek E. Tyler
  • Publication number: 20020160219
    Abstract: A composite material includes a structural carrier layer and a relatively thin metal foil layer separated by a release layer. The release layer, that may be an admixture of a metal such as nickel or chromium and a non-metal such as chromium oxide, nickel oxide, chromium phosphate or nickel phosphate, provides a release force for the metal foil layer from the carrier strip that is typically on the order of 0.1 pound per inch to 2 pounds per inch. This provides sufficient adhesion to prevent premature separation of the metal foil layer from the carrier layer, but easy removal of the carrier layer when desired. The metal foil layer may be electrolytically formed copper having a low height profile, on the order of 0.5 micron to 2.7 microns, bond strength enhancing agent coating a side of the metal foil layer. The enhanced surface is subsequently bonded to a dielectric and the carrier layer then removed.
    Type: Application
    Filed: February 15, 2001
    Publication date: October 31, 2002
    Applicant: Olin Corporation
    Inventors: William L. Brenneman, Szuchain F. Chen, Derek E. Tyler
  • Publication number: 20020039542
    Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.
    Type: Application
    Filed: August 6, 2001
    Publication date: April 4, 2002
    Inventors: Andreas Bogel, Jorg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
  • Patent number: 6083633
    Abstract: An electrical conductor has a copper base substrate coated with a tin base coating layer. To inhibit the formation of a copper/tin intermetallic and the resultant depletion of the free, unreacted, tin utilized as an oxidation and corrosion barrier, a barrier is interposed between the substrate and the coating. In a first embodiment, the barrier is formed from multiple constituent layers, at least one of which is copper. The thickness ("y") of the copper layer is dependent on the anticipated service temperature and satisfies the equation y=(-1.52+0.0871x+0.00859 t).+-.50% where t=anticipated time at the service temperature, x=anticipated service temperature (Celsius), and y=the thickness of the copper layer in microinches. In a second embodiment, the barrier layer is formed from one or more constituent layers, at least one of which is iron or iron base.
    Type: Grant
    Filed: June 16, 1997
    Date of Patent: July 4, 2000
    Assignee: Olin Corporation
    Inventors: Julius C. Fister, Szuchain F. Chen, Christoper P. Laurello, Arvind Parthasarathi, Derek E. Tyler
  • Patent number: 5950064
    Abstract: There is provided a lead-free projectile, such as a bullet or a ballistic shot, formed by liquid phase sintering or liquid phase bonding of a first particulate having a density greater than lead, a second, ductile, particulate having a melting temperature in excess of 400.degree. C. and a binder having a fluidity temperature that is less than the melting temperature of the second particulate. Unlike solid phase sintering that tends to produce articles having a porosity of about 20%, by volume, liquid phase sintering and liquid phase bonding achieve close to 0% porosity. Reducing the porosity level decreases the amount of high density, first particulate, required to achieve a density close to that of lead. Since the high density particulate tends to be the most expensive component of the projectile, this significantly reduces the cost of the projectile. The reduced porosity also allows for an increase in the amount of the second, ductile, component.
    Type: Grant
    Filed: January 17, 1997
    Date of Patent: September 7, 1999
    Assignee: Olin Corporation
    Inventors: Peter W. Robinson, Brian Mravic, Derek E. Tyler
  • Patent number: 5882442
    Abstract: There is provided a phosphor bronze alloy having a grain structure that is refined by the addition of a controlled amount of iron. Direct chill cast alloys containing from 1.5% to 2.5%, by weight tin, from 1.65% to 2.65% iron, from 0.03% to 0.35% phosphorous and the remainder copper and inevitable impurities have an as-cast average crystalline grain size of less than 100 microns and are readily hot worked. When the iron content is too low, the average crystalline grain size increases and the alloy cracks during hot working. When the iron content is too high, iron stringers form, detrimentally impacting both the appearance and properties of a wrought strip.
    Type: Grant
    Filed: February 9, 1996
    Date of Patent: March 16, 1999
    Assignee: Olin Corporation
    Inventors: Ronald N. Caron, John F. Breedis, W. Gary Watson, William Brenneman, Richard P. Vierod, Dennis R. Brauer, Derek E. Tyler
  • Patent number: 5608267
    Abstract: There is provided a molded plastic electronic package having improved thermal dissipation. A thermal dissipator, such as a heat spreader or a heat slug is partially encapsulated in the molding resin. The thermal dissipator has a density less than that of copper and a coefficient of thermal conductivity that is constant or increases as the package periphery is approached.
    Type: Grant
    Filed: July 18, 1994
    Date of Patent: March 4, 1997
    Assignee: Olin Corporation
    Inventors: Deepak Mahulikar, Derek E. Tyler, Jeffrey S. Braden, James M. Popplewell
  • Patent number: 5472796
    Abstract: There is provided a metallic composite useful for coinage. The core is formed from a copper alloy that contains between 50% and 99.0% copper, has a room temperature electrical conductivity in excess of 25% IACS an initial yield strength in excess of 10,000 psi and a dynamic softening response onset at a temperature in the range of 200.degree. C.-400.degree. C. The cladding layers have an initial yield strength more than that of the core and a gold color. The strengthening response of the core during cladding is similar to that of the cladding layers making the metallic composites resistant to corrugation. Reducing corrugation increases the sensitivity of electromagnetic coin discriminators.
    Type: Grant
    Filed: January 13, 1995
    Date of Patent: December 5, 1995
    Assignee: Olin Corporation
    Inventors: John F. Breedis, Derek E. Tyler
  • Patent number: 5399805
    Abstract: There is provided an electronic package where the package components define a cavity. A semiconductor device and a portion of a leadframe occupy part of the cavity. Substantially the remainder of the cavity is filled with a compliant polymer, such as a silicone gel. Since the cavity is no longer susceptible to gross leak failure, the seal width of adhesives used to assemble the package may be reduced, thereby increasing the area available for mounting the semiconductor device.
    Type: Grant
    Filed: September 27, 1993
    Date of Patent: March 21, 1995
    Assignee: Olin Corporation
    Inventors: Derek E. Tyler, Deepak Mahulikar, Anthony M. Pasqualoni, Jeffrey S. Braden, Paul R. Hoffman
  • Patent number: 5381847
    Abstract: There is provided an apparatus and method for the manufacture of metallic articles. A molten metal stream is disrupted, such as by gas atomization, to form a plurality of molten metal droplets. The molten metal droplets pass through a cooling zone having a length sufficient to allow up to about 30 volume percent of each of the droplets to solidify. A mold then receives and completes solidification of the metal droplets. When under about 30 volume percent of the droplets is solid, the droplets retain liquid characteristics and readily flow within the mold.
    Type: Grant
    Filed: June 10, 1993
    Date of Patent: January 17, 1995
    Assignee: Olin Corporation
    Inventors: Sankaranarayanan Ashok, Derek E. Tyler, William G. Watson, Harvey P. Cheskis, George A. List