Patents by Inventor Derek E. Tyler
Derek E. Tyler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20140014239Abstract: A process for manufacturing copper-nickel-silicon alloys includes the sequential steps of casting the copper alloy; hot working the cast copper-base alloy to effect a first reduction in cross-sectional area; solutionizing the cast copper-base alloy at a temperature and for a time effective to substantially form a single phase alloy; first age annealing the alloy at a temperature and for a time effective to precipitate an amount of a second phase effective to form a multi-phase alloy having silicides; cold working the multi-phase alloy to effect a second reduction in cross-sectional area; and second age annealing the multiphase alloy at a temperature and for a time effective to precipitate additional silicides thereby raising conductivity, wherein the second age annealing temperature is less than the first age annealing temperature.Type: ApplicationFiled: April 17, 2013Publication date: January 16, 2014Applicants: Wieland-Werke AG, GBC Metals, LLCInventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
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Patent number: 8430979Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity contains, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up to 1% of silver.Type: GrantFiled: October 26, 2006Date of Patent: April 30, 2013Assignee: GBC Metals, LLCInventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
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Patent number: 8257515Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up 1% of silver. A process to manufacture the alloys of the invention as well as other copper-nickel-silicon alloys includes the sequential steps of (a). casting the copper alloy; (b). hot working the cast copper-base alloy to effect a first reduction in cross-sectional area; (c).Type: GrantFiled: October 7, 2005Date of Patent: September 4, 2012Assignees: GBC Metals, LLC, Wieland-Werke, AGInventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
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Publication number: 20090183803Abstract: A copper base alloy having an improved combination of yield strength and electrical conductivity consisting essentially of between about 1.0 and about 6.0 weight percent Ni, up to about 3.0 weight percent Co, between about 0.5 and about 2.0 weight percent Si, between about 0.01 and about 0.5 weight percent Mg, up to about 1.0 weight percent Cr, up to about 1.0 weight percent Sn, and up to about 1.0 weight percent Mn, the balance being copper and impurities, the alloy processed to have a yield strength of at least about 137 ksi, and an electrical conductivity of at least about 25% IACS.Type: ApplicationFiled: December 17, 2008Publication date: July 23, 2009Inventors: Ralph A. Mutschler, Peter William Robinson, Derek E. Tyler, Andrea Kaufler, Hans-Achim Kuhn, Uwe Hofmann
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Patent number: 7182823Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, from 0.5% to 1.5% of silicon, and the balance is copper and inevitable impurities. Further, the total nickel plus cobalt content is from 1.7% to 4.3%, the ratio of nickel to cobalt is from 1.01:1 to 2.6:1, the amount of (Ni+Co)/Si is between 3.5 and 6, the electrical conductivity is in excess of 40% IACS and the yield strength is in excess of 95 ksi. An optional inclusion is up 1% of silver. A process to manufacture the alloy includes the sequential steps of (a). casting; (b). hot working; (c). solutionizing; (d). first age annealing; (e). cold working; and (f). second age annealing wherein the second age annealing temperature is less than the first age annealing temperature.Type: GrantFiled: June 30, 2003Date of Patent: February 27, 2007Assignee: Olin CorporationInventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
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Patent number: 6905782Abstract: The present invention is directed to a coated substrate, comprising: an antitarnish layer deposited on a substrate in an amount effective to prevent tarnishing of said coated substrate; and an outer layer deposited onto said antitarnish layer, said outer layer comprising tin or tin alloys having at least 50% by weight tin. The present invention is also directed to coated substrates having a concentration gradient of antitarnish agent diffused into the coating, as well as methods of forming such coated substrates.Type: GrantFiled: August 31, 2004Date of Patent: June 14, 2005Assignee: Olin CorporationInventors: Christopher P. Laurello, Derek E. Tyler, Szuchain Chen, Julius C. Fister
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Publication number: 20040166017Abstract: An age-hardening copper-base alloy and processing method to make a commercially useful strip product for applications requiring high yield strength and moderately high electrical conductivity, in a strip, plate, wire, foil, tube, powder or cast form. The alloys are particularly suited for use in electrical connectors and interconnections. The alloys contain Cu—Ti—X where X is selected from Ni, Fe, Sn, P, Al, Zn, Si, Pb, Be, Mn, Mg, Ag, As, Sb, Zr, B, Cr and Co. and combinations thereof. The alloys offer excellent combinations of yield strength, and electrical conductivity, with excellent stress relaxation resistance. The yield strength is at least of 105 ksi and the electrical conductivity is at least 50% IACS.Type: ApplicationFiled: September 5, 2003Publication date: August 26, 2004Applicants: Olin Corporation, Wieland-Werke AGInventors: Ronald N. Caron, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Doris Humpenoder-Bogel, Hans-Achim Kuhn, Joerg Seeger
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Publication number: 20040159379Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.Type: ApplicationFiled: February 19, 2004Publication date: August 19, 2004Inventors: Andreas Bogel, Jorg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
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Patent number: 6749699Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.Type: GrantFiled: August 6, 2001Date of Patent: June 15, 2004Assignees: Olin Corporation, Wieland-Werke AGInventors: Andreas Bögel, Jörg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
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Publication number: 20040079456Abstract: A copper alloy having an improved combination of yield strength and electrical conductivity consists essentially of, by weight, from 1% to 2.5% of nickel, from 0.5% to 2.0% of cobalt, with a total nickel plus cobalt content of from 1.7% to 4.3%, from 0.5% to 1.5% of silicon with a ratio of (Ni+Co)/Si of between 3.5 and 6, and the balance copper and inevitable impurities wherein the wrought copper alloy has an electrical conductivity in excess of 40% IACS. A further increase in the combination of yield strength and electrical conductivity as well as enhanced resistance to stress relaxation is obtained by a further inclusion of up 1% of silver.Type: ApplicationFiled: June 30, 2003Publication date: April 29, 2004Applicants: Onlin Corporation, Wieland Werke A.G.Inventors: Frank N. Mandigo, Peter W. Robinson, Derek E. Tyler, Andreas Boegel, Hans-Achim Kuhn, Frank M. Keppeler, Joerg Seeger
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Patent number: 6569543Abstract: A composite material includes a structural carrier layer and a relatively thin metal foil layer separated by a release layer. The release layer, that may be an admixture of a metal such as nickel or chromium and a non-metal such as chromium oxide, nickel oxide, chromium phosphate or nickel phosphate, provides a release force for the metal foil layer from the carrier strip that is typically on the order of 0.1 pound per inch to 2 pounds per inch. This provides sufficient adhesion to prevent premature separation of the metal foil layer from the carrier layer, but easy removal of the carrier layer when desired. The metal foil layer may be electrolytically formed copper having a low height profile, on the order of 0.5 micron to 2.7 microns, bond strength enhancing agent coating a side of the metal foil layer. The enhanced surface is subsequently bonded to a dielectric and the carrier layer then removed.Type: GrantFiled: February 15, 2001Date of Patent: May 27, 2003Assignee: Olin CorporationInventors: William R. Brenneman, Szuchain F. Chen, Derek E. Tyler
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Publication number: 20020160219Abstract: A composite material includes a structural carrier layer and a relatively thin metal foil layer separated by a release layer. The release layer, that may be an admixture of a metal such as nickel or chromium and a non-metal such as chromium oxide, nickel oxide, chromium phosphate or nickel phosphate, provides a release force for the metal foil layer from the carrier strip that is typically on the order of 0.1 pound per inch to 2 pounds per inch. This provides sufficient adhesion to prevent premature separation of the metal foil layer from the carrier layer, but easy removal of the carrier layer when desired. The metal foil layer may be electrolytically formed copper having a low height profile, on the order of 0.5 micron to 2.7 microns, bond strength enhancing agent coating a side of the metal foil layer. The enhanced surface is subsequently bonded to a dielectric and the carrier layer then removed.Type: ApplicationFiled: February 15, 2001Publication date: October 31, 2002Applicant: Olin CorporationInventors: William L. Brenneman, Szuchain F. Chen, Derek E. Tyler
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Publication number: 20020039542Abstract: A copper alloy that consists essentially of, by weight, from 0.15% to 0.7% of chromium, from 0.005% to 0.3% of silver, from 0.01% to 0.15% of titanium, from 0.01% to 0.10% of silicon, up to 0.2% of iron, up to 0.5% of tin, and the balance copper and inevitable impurities has high strength, a yield strength in excess of 80 ksi, and high electrical conductivity, in excess of 80% IACS. The alloy further has substantially isotropic bend characteristics when the processing route includes a solution heat anneal above 850° C. and subsequent cold rolling into sheet, strip or foil interspersed by bell annealing. As a result, the alloy is particularly suited for forming into box-type electrical connectors for both automotive or multimedia applications. The alloy is also suitable for forming into a rod, wire or section.Type: ApplicationFiled: August 6, 2001Publication date: April 4, 2002Inventors: Andreas Bogel, Jorg Seeger, Hans-Achim Kuhn, John F. Breedis, Ronald N. Caron, Derek E. Tyler
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Patent number: 6083633Abstract: An electrical conductor has a copper base substrate coated with a tin base coating layer. To inhibit the formation of a copper/tin intermetallic and the resultant depletion of the free, unreacted, tin utilized as an oxidation and corrosion barrier, a barrier is interposed between the substrate and the coating. In a first embodiment, the barrier is formed from multiple constituent layers, at least one of which is copper. The thickness ("y") of the copper layer is dependent on the anticipated service temperature and satisfies the equation y=(-1.52+0.0871x+0.00859 t).+-.50% where t=anticipated time at the service temperature, x=anticipated service temperature (Celsius), and y=the thickness of the copper layer in microinches. In a second embodiment, the barrier layer is formed from one or more constituent layers, at least one of which is iron or iron base.Type: GrantFiled: June 16, 1997Date of Patent: July 4, 2000Assignee: Olin CorporationInventors: Julius C. Fister, Szuchain F. Chen, Christoper P. Laurello, Arvind Parthasarathi, Derek E. Tyler
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Patent number: 5950064Abstract: There is provided a lead-free projectile, such as a bullet or a ballistic shot, formed by liquid phase sintering or liquid phase bonding of a first particulate having a density greater than lead, a second, ductile, particulate having a melting temperature in excess of 400.degree. C. and a binder having a fluidity temperature that is less than the melting temperature of the second particulate. Unlike solid phase sintering that tends to produce articles having a porosity of about 20%, by volume, liquid phase sintering and liquid phase bonding achieve close to 0% porosity. Reducing the porosity level decreases the amount of high density, first particulate, required to achieve a density close to that of lead. Since the high density particulate tends to be the most expensive component of the projectile, this significantly reduces the cost of the projectile. The reduced porosity also allows for an increase in the amount of the second, ductile, component.Type: GrantFiled: January 17, 1997Date of Patent: September 7, 1999Assignee: Olin CorporationInventors: Peter W. Robinson, Brian Mravic, Derek E. Tyler
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Patent number: 5882442Abstract: There is provided a phosphor bronze alloy having a grain structure that is refined by the addition of a controlled amount of iron. Direct chill cast alloys containing from 1.5% to 2.5%, by weight tin, from 1.65% to 2.65% iron, from 0.03% to 0.35% phosphorous and the remainder copper and inevitable impurities have an as-cast average crystalline grain size of less than 100 microns and are readily hot worked. When the iron content is too low, the average crystalline grain size increases and the alloy cracks during hot working. When the iron content is too high, iron stringers form, detrimentally impacting both the appearance and properties of a wrought strip.Type: GrantFiled: February 9, 1996Date of Patent: March 16, 1999Assignee: Olin CorporationInventors: Ronald N. Caron, John F. Breedis, W. Gary Watson, William Brenneman, Richard P. Vierod, Dennis R. Brauer, Derek E. Tyler
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Patent number: 5608267Abstract: There is provided a molded plastic electronic package having improved thermal dissipation. A thermal dissipator, such as a heat spreader or a heat slug is partially encapsulated in the molding resin. The thermal dissipator has a density less than that of copper and a coefficient of thermal conductivity that is constant or increases as the package periphery is approached.Type: GrantFiled: July 18, 1994Date of Patent: March 4, 1997Assignee: Olin CorporationInventors: Deepak Mahulikar, Derek E. Tyler, Jeffrey S. Braden, James M. Popplewell
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Patent number: 5472796Abstract: There is provided a metallic composite useful for coinage. The core is formed from a copper alloy that contains between 50% and 99.0% copper, has a room temperature electrical conductivity in excess of 25% IACS an initial yield strength in excess of 10,000 psi and a dynamic softening response onset at a temperature in the range of 200.degree. C.-400.degree. C. The cladding layers have an initial yield strength more than that of the core and a gold color. The strengthening response of the core during cladding is similar to that of the cladding layers making the metallic composites resistant to corrugation. Reducing corrugation increases the sensitivity of electromagnetic coin discriminators.Type: GrantFiled: January 13, 1995Date of Patent: December 5, 1995Assignee: Olin CorporationInventors: John F. Breedis, Derek E. Tyler
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Patent number: 5399805Abstract: There is provided an electronic package where the package components define a cavity. A semiconductor device and a portion of a leadframe occupy part of the cavity. Substantially the remainder of the cavity is filled with a compliant polymer, such as a silicone gel. Since the cavity is no longer susceptible to gross leak failure, the seal width of adhesives used to assemble the package may be reduced, thereby increasing the area available for mounting the semiconductor device.Type: GrantFiled: September 27, 1993Date of Patent: March 21, 1995Assignee: Olin CorporationInventors: Derek E. Tyler, Deepak Mahulikar, Anthony M. Pasqualoni, Jeffrey S. Braden, Paul R. Hoffman
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Patent number: 5381847Abstract: There is provided an apparatus and method for the manufacture of metallic articles. A molten metal stream is disrupted, such as by gas atomization, to form a plurality of molten metal droplets. The molten metal droplets pass through a cooling zone having a length sufficient to allow up to about 30 volume percent of each of the droplets to solidify. A mold then receives and completes solidification of the metal droplets. When under about 30 volume percent of the droplets is solid, the droplets retain liquid characteristics and readily flow within the mold.Type: GrantFiled: June 10, 1993Date of Patent: January 17, 1995Assignee: Olin CorporationInventors: Sankaranarayanan Ashok, Derek E. Tyler, William G. Watson, Harvey P. Cheskis, George A. List