Patents by Inventor Derek W. Nolan

Derek W. Nolan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • APPARATUSES AND METHODS FOR TESTING SEMICONDUCTOR CIRCUITRY USING MICROELECTROMECHANICAL SYSTEMS SWITCHES
    Publication number: 20220373592
    Abstract: An apparatus is provided that is implemented to enable multiple tests of different types, such as a direct current (DC) test and/or a radio frequency (RF) test of a semiconductor device. The apparatus includes a microelectromechanical systems (MEMS) switch block coupled between the semiconductor device and automatic testing equipment (ATE). The apparatus is configured to enable/disable a DC path or an RF path to switch between a DC test and an RF test without reconfiguring the connections between the semiconductor device and the ATE. The DC path is used to perform a DC contact test for one or more pins of the semiconductor device. The RF path is used to perform an RF test for the semiconductor device.
    Type: Application
    Filed: May 17, 2022
    Publication date: November 24, 2022
    Applicant: Analog Devices International Unlimited Company
    Inventors: Padraig Fitzgerald, Erkan Acar, Patrick M. McGuinness, Randy Oltman, Naveen Dhull, Derek W. Nolan, Eric James Carty