Patents by Inventor Deric J. Gray

Deric J. Gray has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for direct measurement of absorption and scattering coefficients in situ
    Patent number: 7057730
    Abstract: An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: June 6, 2006
    Assignee: The Texas A&M University System
    Inventors: Edward S. Fry, George W. Kattawar, Deric J. Gray, Xianzhen Zhao, Zheng Lu
  • Apparatus and method for direct measurement of absorption and scattering coefficients in situ
    Publication number: 20040141179
    Abstract: An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.
    Type: Application
    Filed: November 17, 2003
    Publication date: July 22, 2004
    Inventors: Edward S. Fry, George W. Kattawar, Deric J. Gray, Xianzhen Zhao, Zheng Lu
  • Apparatus and method for direct measurement of absorption and scattering coefficients in situ
    Patent number: RE41682
    Abstract: An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials cavity and the transparent material respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.
    Type: Grant
    Filed: June 6, 2008
    Date of Patent: September 14, 2010
    Assignee: The Texas A&M University System
    Inventors: Edward S. Fry, George S. Kattawar, Deric J. Gray, Xianzhen Zhao, Zheng Lu