Patents by Inventor Deron Walters
Deron Walters has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10705114Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: July 2, 2019Date of Patent: July 7, 2020Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20190324054Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: July 2, 2019Publication date: October 24, 2019Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Patent number: 10338096Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: October 31, 2017Date of Patent: July 2, 2019Assignee: Oxford Instruments Asylum Research IncInventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20190064211Abstract: A scanning probe microscope has a probe configured to move across the surface of a sample to be monitored. A scanner, to which the probe is mounted, moves the probe across the sample surface such that the probe is deflected in accordance with the structure of the sample surface. A beam system directs a light beam at the probe during the movement of the probe across the sample surface and a detector monitors the deflection of the probe using the light beam. The arrangement is such that the scanner is physically independent of the beam system.Type: ApplicationFiled: August 31, 2017Publication date: February 28, 2019Inventors: David A. Grigg, Deron Walters, Haigang Zhang, Jason Cleveland
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Patent number: 10054612Abstract: An optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: GrantFiled: July 5, 2016Date of Patent: August 21, 2018Assignee: Oxford Instruments Asylum Research IncInventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20180128853Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: October 31, 2017Publication date: May 10, 2018Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Patent number: 9804193Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: GrantFiled: November 3, 2015Date of Patent: October 31, 2017Assignee: Oxford Instruments Asylum Research, IncInventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20170254834Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: March 22, 2017Publication date: September 7, 2017Inventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales, Anil Gannepalli
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Publication number: 20160313368Abstract: An optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: ApplicationFiled: July 5, 2016Publication date: October 27, 2016Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Patent number: 9383386Abstract: This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: GrantFiled: March 12, 2014Date of Patent: July 5, 2016Assignee: OXFORD INSTRUMENTS ASYLUM RESEARCH, INC.Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20160169937Abstract: This invention relates to a metrological scanning probe microscope system combining an SPM which employs an optical lever arrangement to measure displacement of the probe indirectly with another SPM which measures the displacement of the probe directly through the use of an interferometric detection scheme.Type: ApplicationFiled: November 3, 2015Publication date: June 16, 2016Inventors: Aleksander Labuda, Deron Walters, Jason Cleveland, Roger Proksch
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Publication number: 20140317790Abstract: This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.Type: ApplicationFiled: March 12, 2014Publication date: October 23, 2014Inventors: Aleksander Labuda, Jason Cleveland, Deron Walters, Roger Proksch
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Publication number: 20140223612Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.Type: ApplicationFiled: February 5, 2013Publication date: August 7, 2014Applicant: ASYLUM CORPORATIONInventors: Roger Proksch, Mario Viani, Jason Cleveland, Maarten Rutgers, Matthew Klonowski, Deron Walters, James Hodgson, Jonathan Hensel, Paul Costales
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Publication number: 20080210370Abstract: The present invention is directed to the creation of macroscopic materials and objects comprising aligned nanotube segments. The invention entails aligning single-wall carbon nanotube (SWNT) segments that are suspended in a fluid medium and then removing the aligned segments from suspension in a way that macroscopic, ordered assemblies of SWNT are formed. The invention is further directed to controlling the natural proclivity or nanotube segments to self assemble into or ordered structures by modifying the environment of the nanotubes and the history of that environment prior to and during the process. The materials and objects are “macroscopic” in that they are large enough to be seen without the aid of a microscope or of the dimensions of such objects.Type: ApplicationFiled: August 16, 2007Publication date: September 4, 2008Inventors: Richard E. Smalley, Daniel T. Colbert, Ken A. Smith, Deron A. Walters, Michael J. Casavant, Chad B. Huffman, Boris I. Yakobson, Robert H. Hauge, Rajesh Kumar Saini, Wan-Ting Chiang, Xiao Chuan Qin
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Publication number: 20050169830Abstract: The present invention is directed to the creation of macroscopic materials and objects comprising aligned nanotube segments. The invention entails aligning single-wall carbon nanotube (SWNT) segments that are suspended in a fluid medium and then removing the aligned segments from suspension in a way that macroscopic, ordered assemblies of SWNT are formed. The invention is further directed to controlling the natural proclivity of nanotube segments to self assemble into ordered structures by modifying the environment of the nanotubes and the history of that environment prior to and during the process. The materials and objects are “macroscopic” in that they are large enough to be seen without the aid of a microscope or of the dimensions of such objects.Type: ApplicationFiled: January 16, 2004Publication date: August 4, 2005Applicant: William Marsh Rice UniversityInventors: Smalley Richard, Daniel Colbert, Kenneth Smith, Deron Walters, Michael Casavant, Chad Huffman, Boris Yakobson, Robert Hauge, Rajesh Saini, Wan-Ting Chiang, Xiao Qin
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Patent number: 6790425Abstract: The present invention is directed to the creation of macroscopic materials and objects comprising aligned nanotube segments. The invention entails aligning single-wall carbon nanotube (SWNT) segments that are suspended in a fluid medium and then removing the aligned segments from suspension in a way that macroscopic, ordered assemblies of SWNT are formed. The invention is further directed to controlling the natural proclivity of nanotube segments to self assemble into ordered structures by modifying the environment of the nanotubes and the history of that environment prior to and during the process. The materials and objects are “macroscopic” in that they are large enough to be seen without the aid of a microscope or of the dimensions of such objects.Type: GrantFiled: July 24, 2001Date of Patent: September 14, 2004Assignee: Wiliam Marsh Rice UniversityInventors: Richard E. Smalley, Daniel T. Colbert, Ken A. Smith, Deron A. Walters, Michael J. Casavant, Chad B. Huffman, Boris I. Yakobson, Robert H. Hague, Rajesh Kumar Saini, Wan-Ting Chiang
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Publication number: 20030143327Abstract: A method of producing a carbon nanotube is disclosed. The carbon nanotube is used with an atomic force microscope that includes a cantilever having a tip culminating with an apex. A catalytic material is deposited onto the apex of the tip of the atomic force microscope, and the catalytic material is subjected to chemical vapor deposition. This initiates growth of the carbon nanotube such that the carbon nanotube extends from the apex of the tip.Type: ApplicationFiled: December 5, 2002Publication date: July 31, 2003Inventors: Rudiger Schlaf, Deron A. Walters, Zhifeng Ren
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Patent number: 5581082Abstract: A combined scanning probe and scanning energy microscope, in which the same scanning system is used for both the scanning probe and scanning energy images. A sample is translated substantially along a horizontal plane either between or below the probe of a scanning probe microscope and the objective of a scanning energy microscope. The probe collects topographic or other information. The objective focuses a fixed beam of energy to a small spot on the sample, then collects energy from the same spot and transmits it to a detector. A vertical translator connected to the probe or sample support provides the vertical motion necessary to maintain them in close proximity. The images produced by the two microscopes are in substantial direct registration with each other. The invention is exemplified by a combined atomic force and confocal laser scanning microscope with a translated sample.Type: GrantFiled: March 28, 1995Date of Patent: December 3, 1996Assignee: The Regents of the University of CaliforniaInventors: Paul K. Hansma, Deron A. Walters, Paul E. Hillner