Abstract: A circuit including a first resistor, a second resistor, a current source and a transistor. The first resistor is between a voltage rail and a drive interconnect. The drive interconnect and the voltage rail are electrically connected to the first resistor. The second resistor is between the drive interconnect and ground. Ground and the drive interconnect are electrically connected to the second resistor. The current source is between the voltage rail and the drive interconnect. The drive interconnect and the voltage rail are electrically connected to the current source. The transistor is between the drive interconnect and a sink interconnect. The drive interconnect and the sink interconnect are electrically connected to the transistor.

Abstract: The subject technology is directed to clock calibration systems and methods. In an embodiment, the subject technology provides an apparatus for clock calibration to minimize timing discrepancies between even and odd clock edges. The apparatus includes a first data path configured to generate a first signal, the first signal comprising a first edge and a second edge associated with even and odd clock cycles, respectively. A calibration circuit is coupled to the first data path and configured to determine a timing difference between the first edge and the second edge to calculate even-odd jitter (EOJ). This configuration enables precise calibration to reduce EOJ and ensure accurate synchronization of clock signals in high-speed communication systems.

Abstract: A clock calibrator comprises an input port configured to receive a two-level symbol from a quarter-rate transmitter, the two-level symbol having a period of P unit intervals with a first rising edge launched by one quarter-rate clocks. The clock calibrator includes a clock generator configured to generate four calibration clocks based on the quarter-rate clocks, each calibration clock having the period of P UIs and sequentially having a calibration rising edge delayed by M UIs. The clock calibrator includes a delay-tuner configured to retime the calibration rising edge and a phase detector configured to determine a coarse parameter and a k-th fine parameter based on alignment between the retimed calibration rising edge and the first rising edge with (k?1)M UIs delay. Here P is an integer multiple of 4, M is one less than an integer multiple of 4, and k is selected from 1, 2, 3, and 4.

Abstract: A clock calibrator comprises an input port configured to receive a two-level symbol from a quarter-rate transmitter, the two-level symbol having a period of P unit intervals with a first rising edge launched by one quarter-rate clocks. The clock calibrator includes a clock generator configured to generate four calibration clocks based on the quarter-rate clocks, each calibration clock having the period of P UIs and sequentially having a calibration rising edge delayed by M UIs. The clock calibrator includes a delay-tuner configured to retime the calibration rising edge and a phase detector configured to determine a coarse parameter and a k-th fine parameter based on alignment between the retimed calibration rising edge and the first rising edge with (k?1)M UIs delay. Here P is an integer multiple of 4, M is one less than an integer multiple of 4, and k is selected from 1, 2, 3, and 4.

Abstract: A clock calibrator comprises an input port configured to receive a two-level symbol from a quarter-rate transmitter, the two-level symbol having a period of P unit intervals with a first rising edge launched by one quarter-rate clocks. The clock calibrator includes a clock generator configured to generate four calibration clocks based on the quarter-rate clocks, each calibration clock having the period of P UIs and sequentially having a calibration rising edge delayed by M UIs. The clock calibrator includes a delay-tuner configured to retime the calibration rising edge and a phase detector configured to determine a coarse parameter and a k-th fine parameter based on alignment between the retimed calibration rising edge and the first rising edge with (k?1)M UIs delay. Here P is an integer multiple of 4, M is one less than an integer multiple of 4, and k is selected from 1, 2, 3, and 4.

Abstract: A method and apparatus are provided. The apparatus may be a capacitive element for adjusting a net capacitance of a circuit. The apparatus may be configured to be coupled to the circuit. The apparatus may be configured to adjust the net capacitance of the circuit to decouple common mode and differential loop bandwidth adjustment of the circuit. The capacitive element may include a pair of cross-coupled capacitors configured to be coupled to differential nodes of the circuit, and a pair of negative gain buffers coupled to respective capacitors.

Abstract: A method and apparatus are provided. The apparatus may be a capacitive element for adjusting a net capacitance of a circuit. The apparatus may be configured to be coupled to the circuit. The apparatus may be configured to adjust the net capacitance of the circuit to decouple common mode and differential loop bandwidth adjustment of the circuit. The capacitive element may include a pair of cross-coupled capacitors configured to be coupled to differential nodes of the circuit, and a pair of negative gain buffers coupled to respective capacitors.

Abstract: In an aspect of the disclosure, a method and an apparatus are provided for calibrating a DAC. The apparatus calibrates a first DAC element, provides a residual current error resulting from the calibration, the residual current error being a difference between a calibrated current source of the first DAC element and a reference current source, stores the residual current error of the calibrated first DAC element in a first memory module using at least first and second storage elements coupled to a differential amplifier, and calibrates a second DAC element using the stored residual current error.

Abstract: In an aspect of the disclosure, a method and an apparatus are provided for calibrating a current comparator circuit associated with a DAC element. The apparatus receives an output of a current comparator module, determines calibration data using a finite state machine (FSM) based on the output of the current comparator module, and reduces an offset current at an input of the current comparator module based on the calibration data from the FSM.

Abstract: In an aspect of the disclosure, a method and an apparatus are provided for calibrating a DAC. The apparatus calibrates a first DAC element, provides a residual current error resulting from the calibration, the residual current error being a difference between a calibrated current source of the first DAC element and a reference current source, stores the residual current error of the calibrated first DAC element in a first memory module using at least first and second storage elements coupled to a differential amplifier, and calibrates a second DAC element using the stored residual current error.

Abstract: A digital-to-analog converter (DAC) includes, in part, a multitude of input stages that supply currents to a pair of current summing nodes in response to a digital signal, and an impedance attenuator coupled between the current summing nodes and the output of the DAC. The impedance attenuator is adapted, among other function, to increase the range of impedances of the output load, to account for changes in the output load impedance due to variations in the process, voltage and temperature, and to decouple the impedances seen by the summing nodes from the load impedance. The impedance attenuator further includes a differential-input, differential-output amplifier with programmable common-mode gain bandwidth to control the harmonic distortion of the amplifier. The impedance attenuator optionally includes a pair of cross-coupled capacitors to control the harmonic distortion of the amplifier.

Abstract: A digital-to-analog converter (DAC) includes, in part, a multitude of input stages that supply currents to a pair of current summing nodes in response to a digital signal, and an impedance attenuator coupled between the current summing nodes and the output of the DAC. The impedance attenuator is adapted, among other function, to increase the range of impedances of the output load, to account for changes in the output load impedance due to variations in the process, voltage and temperature, and to decouple the impedances seen by the summing nodes from the load impedance. The impedance attenuator further includes a differential-input, differential-output amplifier with programmable common-mode gain bandwidth to control the harmonic distortion of the amplifier. The impedance attenuator optionally includes a pair of cross-coupled capacitors to control the harmonic distortion of the amplifier.

Abstract: A circuit for digital-to-analog conversion is described. The circuit includes a digital-to-analog converter (DAC). The DAC includes a double cascaded current source and a differential current-mode switch (DCMS). The circuit further includes a direct current (DC) offset stage. The circuit also includes a load attenuator. The double cascaded current source may be between the DCMS and a rail voltage.

Abstract: A circuit for digital-to-analog conversion is described. The circuit includes a digital-to-analog converter (DAC). The DAC includes a double cascaded current source and a differential current-mode switch (DCMS). The circuit further includes a direct current (DC) offset stage. The circuit also includes a load attenuator. The double cascaded current source may be between the DCMS and a rail voltage.