Abstract: A method for adjusting a primary side of an X-ray diffractometer wherein the primary side comprises a collimator, X-ray optics, an X-ray source, in particular an X-ray tube, wherein the collimator, the X-ray optics and the X-ray source are mounted directly or indirectly on a base structure, and wherein the orientation and position of the X-ray optics and the position of the X-ray source are adjusted relative to the base structure, wherein the method is characterized in that the orientation and position of the X-ray optics and the position of the X-ray tube relative to the base structure are measured and set at predetermined target values, so that with these set target values, X-ray radiation emanating from the X-ray source and conditioned by the X-ray optics is detectable at the output end of the collimator.

Abstract: A method for adjusting the primary side of an X-ray diffractometer wherein the primary side comprises a collimator, an X-ray optics, an X-ray source, in particular an X-ray tube, wherein the collimator, the X-ray optics and the X-ray source are mounted directly or indirectly on a base structure, and wherein the orientation and position of the X-ray optics and the position of the X-ray source are adjusted relative to the base structure, is characterized in that the orientation and position of the X-ray optics and the position of the X-ray tube relative to the base structure are measured and set at predetermined target values, so that with these set target values, X-ray radiation emanating from the X-ray source and conditioned by the X-ray optics is detectable at the output end of the collimator.

Abstract: An X-ray optical system with two X-ray mirrors (A,B) for imaging an X-ray source (S) on a target region is characterized in that the X-ray mirrors (A,B) are mutually tilted by an angle other than 90° such that the combined region of acceptance of the X-ray mirror (A,B) is adjusted to the shape of the X-ray source (S) and/or the target region. This increases the intensity of the focused X-ray radiation on the sample for a given emission of the X-ray source (S) power using a few, technically simple modifications.

Abstract: An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qx of the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (Oa) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qzA between first collimator (bl) and X-ray source (Q) is: qzA=Qx/tan ?x, wherein ?x is the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl).

Abstract: An X-ray diffractometer comprising an X-ray source (10) from which X-rays are guided to a sample (11) to be investigated, an X-ray detector (12) for receiving X-rays diffracted or scattered from or reflected by the sample (11), and a goniometer for adjustment of sequential relative angular positions between the X-ray source (10), the sample (11) and the X-ray detector (12) for detecting X-ray diffraction lines, X-ray scattered signals or X-ray reflectograms of the sample (11) to be investigated, wherein the X-rays can be guided at least sectionally along different optical paths, is characterized in that the X-rays can be guided from a position 1 to a position 2 along n≧2 different switchable optical paths, wherein the different optical paths are rigidly disposed relative to each other between position 1 and position 2 and form a unit (13), wherein the sample (11) assumes either position 1 or position 2 and wherein the switching over between the different optical paths can be effected by turning the unit (1

Abstract: An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qx of the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (Oa) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qzA between first collimator (bl) and X-ray source (Q) is:

Abstract: An X-ray optical system with two X-ray mirrors (A,B) for imaging an X-ray source (S) on a target region is characterized in that the X-ray mirrors (A,B) are mutually tilted by an angle other than 90° such that the combined region of acceptance of the X-ray mirror (A,B) is adjusted to the shape of the X-ray source (S) and/or the target region. This increases the intensity of the focused X-ray radiation on the sample for a given emission of the X-ray source (S) power using a few, technically simple modifications.

Abstract: An X-ray diffractometer comprising an X-ray source (10) from which X-rays are guided to a sample (11) to be investigated, an X-ray detector (12) for receiving X-rays diffracted or scattered from or reflected by the sample (11), and a goniometer for adjustment of sequential relative angular positions between the X-ray source (10), the sample (11) and the X-ray detector (12) for detecting X-ray diffraction lines, X-ray scattered signals or X-ray reflectograms of the sample (11) to be investigated, wherein the X-rays can be guided at least sectionally along different optical paths, is characterized in that the X-rays can be guided from a position 1 to a position 2 along n≧2 different switchable optical paths, wherein the different optical paths are rigidly disposed relative to each other between position 1 and position 2 and form a unit (13), wherein the sample (11) assumes either position 1 or position 2 and wherein the switching over between the different optical paths can be effected by turning the unit (1