Abstract: The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.

Abstract: The invention relates to a combined method in which a high-resolution image of a sample surface is recorded by means of scanning force microscopy and the locally high-resolution, chemical nature (which is correlated with this) of the sample surface is measured by means of mass spectroscopy. The surface is chemically analyzed on the basis of laser desorption of a restricted surface area. For this purpose, the surface is illuminated in a pulsed form at each point of interest using the optical near-field principle. The optical near-field principle guarantees analysis with a position resolution which is not diffraction-limited. A hollow tip of the measurement probe that is used allows unambiguous association between the chemical analysis and a selected surface area. The highly symmetrical arrangement allows good transmission of the molecular ions that are produced.

Abstract: The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.

Abstract: The invention concerns a device and a method for a scanning probe microscope, in particular, an atomic force scanning microscope. The invention is characterized in that it comprises a measuring device (100) including a lateral displacement mechanism (1) for displacing a measuring probe (5) in a plane, a vertical displacement mechanism (4) for displacing the measuring probe in a plane perpendicular to said plane, and sample-holder (11) for receiving a sample to be measured (6). An optical path (10) of the condenser is formed through the measuring device (100), so that the sample-holder (11) is arranged in the region of one end of the optical path (10) of the condenser.

Abstract: The invention relates to a method of and an apparatus for studying properties, especially physical properties of a surfactant. A fluid is introduced in the form of a sample volume in another fluid which is immiscible with said fluid so that an interface is formed between the one fluid and the other fluid, at least in a partial area of a surface of the sample volume. The sample volume is configured so as to be axially symmetrical around a given defining axis, whereby the interface is formed axially symmetrically with respect to the given defining axis. The surfactant is spread across the interface to form a surface film in the area of the interface with the surfactant. Thereupon the surface film can by studied microscopically.