Abstract: A projector for an arrangement for three-dimensional optical measurement of objects (6) with the aid of a topometric measuring method in which images of projection patterns (2) projected onto an object (6) are acquired and evaluated, the projector having an illumination unit (4) and a carrier (1), provided with projection patterns (2), for projecting the light structures. The object is achieved by virtue of the fact that projection patterns (2) are arranged on the carrier (1) in the form of repeating geometrical individual structures, and the carrier (1) with the projection patterns (2) is movably arranged in such a way that during the movement and illumination selected regions of the projection pattern (2) are displaced into the beam path (7) between the illumination unit (4) and object (6), and a stripe-shaped pattern is imaged on the object (6) by means of the movement unsharpness.

Abstract: The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.

Abstract: The device 1 is described for three-dimensional optical measurement of objects 2 using a topometric measurement method, in which images of projection patterns which have been projected onto an object 2 are recorded and evaluated. The device 1 has a projector 3 with a light source, an image recording unit 5 and an image evaluation unit 6. The light source for the projector 3 is an arc lamp 4, and the image recording unit 5 is designed for synchronization of image recording with the light intensity of the arc lamp 4.

Abstract: A projector for an arrangement for three-dimensional optical measurement of objects (6) with the aid of a topometric measuring method in which images of projection patterns (2) projected onto an object (6) are acquired and evaluated, the projector having an illumination unit (4) and a carrier (1), provided with projection patterns (2), for projecting the light structures. The object is achieved by virtue of the fact that projection patterns (2) are arranged on the carrier (1) in the form of repeating geometrical individual structures, and the carrier (1) with the projection patterns (2) is movably arranged in such a way that during the movement and illumination selected regions of the projection pattern (2) are displaced into the beam path (7) between the illumination unit (4) and object (6), and a stripe-shaped pattern is imaged on the object (6) by means of the movement unsharpness.

Abstract: The invention relates to a flatness measurement and control system for metal strip, which makes it possible to obtain improved strip or coil quality by a simple and effective measurement of departures from flatness and to control the finishing parameters through the evaluation of a line pattern on the strip surface or on the end face of a coil as it is coiled.

Abstract: The invention relates to a flatness measurement and control system for metal strip, which makes it possible to obtain improved strip or coil quality by a simple and effective measurement of departures from flatness and to control the finishing parameters through the evaluation of a line pattern on the strip surface or on the end face of a coil as it is coiled.

Abstract: The invention relates to a flatness measurement and control system for metal strip, which makes it possible to obtain improved strip or coil quality by a simple and effective measurement of departures from flatness and to control the finishing parameters through the evaluation of a line pattern on the strip surface or on the end face of a coil as it is coiled.