Abstract: Embodiments contained in the disclosure provide a method for memory built-in self-testing (MBIST). The method begins when a testing program is loaded, which may be from an MBIST controller. Once the testing program is loaded MBIST testing begins. During testing, memory failures are determined and written to a failure indicator register. The writing to the failure indicator register occurs in parallel with the ongoing MBIST testing. An apparatus is also provided. The apparatus includes a memory data read/write block, a memory register, a memory addressor, and a memory read/write controller. The apparatus communicates with the memories under test through a memory address and data bus.

Abstract: Embodiments contained in the disclosure provide a method for memory built-in self-testing (MBIST). The method begins when a testing program is loaded, which may be from an MBIST controller. Once the testing program is loaded MBIST testing begins. During testing, memory failures are determined and written to a failure indicator register. The writing to the failure indicator register occurs in parallel with the ongoing MBIST testing. An apparatus is also provided. The apparatus includes a memory data read/write block, a memory register, a memory addressor, and a memory read/write controller. The apparatus communicates with the memories under test through a memory address and data bus.

Abstract: A method and apparatus for testing secure blocks is provided. The method begins when instructions for testing a secure memory are loaded using a parallel testing interface. Instructions for testing the non-secure memory may be resident on the device as Built-In-Self-Test (BIST) instructions. In that case, the instructions are then accessed through the standard test access. Testing occurs simultaneously for the secure memory and the non-secure memory using both the parallel interface and the standard test interface. Testing both the secure memory blocks and the non-secure memory blocks using the parallel and standard test interfaces saves time during the test process.