Patents by Inventor Devendra Vidhani

Devendra Vidhani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12230248
    Abstract: The present disclosure relates generally to natural language understanding.
    Type: Grant
    Filed: December 8, 2021
    Date of Patent: February 18, 2025
    Assignee: PwC Product Sales LLC
    Inventors: Prakash Chandra, Santosh Gupta, Ajay Nandanwar, Sanjay Verma, Devendra Vidhani
  • Publication number: 20220208177
    Abstract: The present disclosure relates generally to natural language understanding.
    Type: Application
    Filed: December 8, 2021
    Publication date: June 30, 2022
    Applicant: PricewaterhouseCoopers LLP
    Inventors: Prakash CHANDRA, Santosh GUPTA, Ajay NANDANWAR, Sanjay VERMA, Devendra VIDHANI
  • Patent number: 6779166
    Abstract: A method for facilitating the assignment of alternating voltage potentials to a set of shield wires in a routing layer of an integrated circuit involves generating a set of vertices representing at least a portion of the set of shield wires and of edges representing adjacency of at least the portion of the set of shield wires, minimizing a set of edges in the set of vertices to obtain a minimized set of vertices, and assigning a first indicator to one vertex of the minimized set of vertices.
    Type: Grant
    Filed: September 10, 2002
    Date of Patent: August 17, 2004
    Assignee: Sun Microsystems, Inc.
    Inventor: Devendra Vidhani
  • Patent number: 6763503
    Abstract: A method for creating a wire load model using specific interconnect configuration information is provided. Further, a program that creates a wire load model by curve-interconnect fitting parasitic information and interconnect configuration information is provided. Further, a computer system capable of creating an accurate wire load model using parasitic information specific to particular metal layers is provided.
    Type: Grant
    Filed: November 20, 2001
    Date of Patent: July 13, 2004
    Assignee: Sun Microsystems, Inc.
    Inventors: Xiao-Dong Yang, Devendra Vidhani, Georgios Konstadinidis
  • Publication number: 20040049757
    Abstract: A method for facilitating the assignment of alternating voltage potentials to a set of shield wires in a routing layer of an integrated circuit involves generating a set of vertices representing at least a portion of the set of shield wires and of edges representing adjacency of at least the portion of the set of shield wires, minimizing a set of edges in the set of vertices to obtain a minimized set of vertices, and assigning a first indicator to one vertex of the minimized set of vertices.
    Type: Application
    Filed: September 10, 2002
    Publication date: March 11, 2004
    Inventor: Devendra Vidhani
  • Patent number: 6694499
    Abstract: A technique for verifying decoupling capacitance using a maximum flow determination is provided. The technique involves generating a network representing decoupling capacitors and driver elements on an integrated circuit, selectively establishing connections between decoupling capacitors and driver elements, and determining a maximum flow of the network. Using the maximum flow of the network, a designer may then verify whether particular driver elements are receiving sufficient decoupling capacitance and whether particular decoupling capacitors are being used efficiently, and subsequently redesign an integrated circuit as deemed necessary.
    Type: Grant
    Filed: December 4, 2001
    Date of Patent: February 17, 2004
    Assignee: Sun Microsystems, Inc.
    Inventors: Devendra Vidhani, Tyler Thorp
  • Patent number: 6604226
    Abstract: A technique for verifying on-chip decoupling capacitance using transistor and capacitor surface area information is provided. The technique broadly includes determining a surface area of a transistor, determining a surface area of a decoupling capacitor, comparing the surface area of the transistor to the surface area of the decoupling capacitor to obtain a surface area ratio, and verifying whether there is enough decoupling capacitance based on the surface area ratio. Further, the present invention also provides a technique for determining when and how to redesign a microprocessor in order to have sufficient decoupling capacitance.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: August 5, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Tyler Thorp, Devendra Vidhani
  • Publication number: 20030106032
    Abstract: A technique for verifying decoupling capacitance using a maximum flow determination is provided. The technique involves generating a network representing decoupling capacitors and driver elements on an integrated circuit, selectively establishing connections between decoupling capacitors and driver elements, and determining a maximum flow of the network. Using the maximum flow of the network, a designer may then verify whether particular driver elements are receiving sufficient decoupling capacitance and whether particular decoupling capacitors are being used efficiently, and subsequently redesign an integrated circuit as deemed necessary.
    Type: Application
    Filed: December 4, 2001
    Publication date: June 5, 2003
    Inventors: Devendra Vidhani, Tyler Thorp
  • Publication number: 20030097646
    Abstract: A technique for verifying on-chip decoupling capacitance using transistor and capacitor surface area information is provided. The technique broadly includes determining a surface area of a transistor, determining a surface area of a decoupling capacitor, comparing the surface area of the transistor to the surface area of the decoupling capacitor to obtain a surface area ratio, and verifying whether there is enough decoupling capacitance based on the surface area ratio. Further, the present invention also provides a technique for determining when and how to redesign a microprocessor in order to have sufficient decoupling capacitance.
    Type: Application
    Filed: November 21, 2001
    Publication date: May 22, 2003
    Inventors: Tyler Thorp, Devendra Vidhani
  • Publication number: 20020188577
    Abstract: A method for finding a worst case aggressor set of a victim net based on logically exclusive sets is provided. Further, a software tool that finds a worst case aggressor set of a victim net based on logically exclusive sets is provided. Further, a method for formulating a problem to find a worst case aggressor net of a victim net based on a logically exclusive set is provided. Further, a software tool for formulating a problem to find a worst case aggressor net of a victim net based on a logically exclusive set is provided. Further, a method for solving a problem to find a worst case aggressor net based on logically exclusive sets is provided. Further, a software tool for solving a problem to find a worst case aggressor net based on a logically exclusive net is provided.
    Type: Application
    Filed: June 6, 2001
    Publication date: December 12, 2002
    Inventors: Devendra Vidhani, Joseph C. Ferguson