Abstract: A method for evaluating power characteristics of wind turbines, an apparatus and a storage medium. By means of verifying master control operating data of the wind turbines (1), correcting nacelle wind speed data (2), and calculating a power curve of the wind turbines and a guarantee value for the power curve, a wind turbine power characteristics evaluation result (3) is obtained. The present method economically and efficiently evaluates a power characteristics curve for wind turbines, makes full use of existing operating data of the wind turbine master control system, and performs evaluation of the power characteristics of wind turbines of a same model in a wind farm. The method ensures accuracy and test efficiency, and controls test times within one month, thereby ensuring the reliability and high efficiency of the wind turbines.

Abstract: This invention presents a growth method for GaN based quantum wells red light LED structure by MOCVD epitaxy growth system, GaN based GaN/InGaN quantum wells red light LED structure material is obtained. The In mole fraction (x) for quantum well material InGaN is controlled between 0.1 and 0.5. This invention realizes the lumiscience of long wave length red light in group III nitrides. Aiming at the problem of difficulty in growing high In composition InGaN material, this invention solves this problem by controlling and adjusting the flux of organic Ga source and In source, growth temperature, time, and the flux of ammonia, and the mole ratio of N to Ga. By strictly controlling the conditions such as temperature and the flux ratio of reactant in the whole process, this invention determines the radiation wave length of quantum well, realizes the lumiscience of long wave length, and obtained GaN based GaN/InGaN quantum well red light LED structure.

Abstract: A kind of growth method of non-polarized-plane InN which is growing m-plane InN and In-rich m-plane InGaN on LiA1O2 (100) substrate by the metal organic chemical vapor deposition (MOCVD), and m-plane is one kind of non-polarized-plane, In-rich denotes that the component of In x is higher than 0.3 in InxGa1?xN. The invention synthetically grows m-plane InN and In-rich m-plane InGaN using LiA1O2 (100) as substrate which will be disposed and the buffer by MOCVD. And the non-polarized-plane InN would be produced through choosing appropriate substrate and the technique condition of growth as well as using the design of buffer by MOCVD.