Abstract: Potential errors that might result from operating logic and/or memory circuits at an insufficient operating voltage are identified by electrically altering nodes of replica or operational circuits so that the electrically altered nodes are susceptible to errors. The electrically altered nodes in an embodiment are controlled using parametric drivers. A minimized operating voltage can be selected by operating at a marginal operating voltage and detecting a voltage threshold at which errors in the electrically altered nodes are detected, for example.

Abstract: Potential errors that might result from operating logic and/or memory circuits at an insufficient operating voltage are identified by electrically altering nodes of replica or operational circuits so that the electrically altered nodes are susceptible to errors. The electrically altered nodes in an embodiment are controlled using parametric drivers. A minimized operating voltage can be selected by operating at a marginal operating voltage and detecting a voltage threshold at which errors in the electrically altered nodes are detected, for example.

Abstract: Potential errors that might result from operating logic and/or memory circuits at an insufficient operating voltage are identified by electrically altering nodes of replica or operational circuits so that the electrically altered nodes are susceptible to errors. The electrically altered nodes in an embodiment are controlled using parametric drivers. A minimized operating voltage can be selected by operating at a marginal operating voltage and detecting a voltage threshold at which errors in the electrically altered nodes are detected, for example.

Abstract: A digital storage element comprises a master transparent latch that receives functional data signals from data input ports and scan data signals from a scan input port. The data input ports are coupled to a two-input, one-output multiplexer adapted to receive the functional data signals and to selectively output one of the functional data signals. The digital storage element also comprises a slave transparent latch coupled to the master transparent latch, the slave transparent latch comprising dedicated functional data and scan data output ports. While operating in a scan mode, a first clock signal is used by the slave transparent latch and a second clock signal is used by the master transparent latch, wherein the first and second clock signals are non-overlapping.

Abstract: Potential errors that might result from operating logic and/or memory circuits at an insufficient operating voltage are identified by electrically altering nodes of replica or operational circuits so that the electrically altered nodes are susceptible to errors. The electrically altered nodes in an embodiment are controlled using parametric drivers. A minimized operating voltage can be selected by operating at a marginal operating voltage and detecting a voltage threshold at which errors in the electrically altered nodes are detected, for example.

Abstract: Improving routability of an integrated circuit (IC) design without impacting the area is described. A local region of congestion of an IC design is determined according to a design parameter. A cell with a specified level of complexity is identified within the local region of congestion. An alternative cell is algorithmically created with a same logic function as the cell by adding an access point to the alternative cell. The cell is then replaced with the alternative cell within the local region of congestion.

Abstract: A memory cell supporting scan-based tests and with reduced time delay in functional mode. The memory cell generates separate clocks for latching functional and scan data into a storage element contained in the memory cell. The use of separate clock signals permits transmission of scan data and functional data via separate paths, thereby eliminating additional circuitry that are otherwise needed to multiplex such scan and functional data through a same path. The absence of such additional circuitry reduces the time delays from input to output. The structure of the memory cell provided also permits easy addition of logic functions without substantially affecting operating speeds.

Abstract: Improving the routability of integrated circuit (IC) design without impacting the area. A local region of congestion of an IC design is determined according to a design parameter. A cell with a specified level of complexity is identified within the local region of congestion. An alternative cell is algorithmically created with a same logic function as the cell by adding an access point to the alternative cell. The cell is then replaced with the alternative cell within the local region of congestion.

Abstract: In a method and apparatus for data retention, a first latch latches a data input and a second latch that is coupled to the first latch retains the data input while the first latch is inoperative in a standby power mode. The second latch includes a second latch inverter having an inverter input and an inverter output. A switching circuit, which may be implemented as a tristate inverter, is coupled to the inverter output, the inverter input, and a retention signal. The switching circuit is operable in the standby power mode to assert a logic state at the inverter input responsive to the retention signal. The logic state is in accordance with the data input retained in the standby power mode. A standby power source is operable to provide power in the standby power mode to the second latch inverter, the switching circuit and the retention input.

Abstract: A digital storage element (e.g., a flip-flop or a latch) includes a master transparent latch that receives functional data from a data input port and scan data from a scan input port and a slave transparent latch coupled to the master transparent latch. The slave transparent latch includes dedicated functional data and scan data output ports. The digital storage element operates in a functional mode and in a scan mode. While in the scan mode, a first clock signal is used by the slave transparent latch and a second clock signal is used by the master transparent latch. The first and second clock signals are non-overlapping and, as such, avoid the digital storage element from creating hold violations.

Abstract: In a method and apparatus for data retention, a first latch latches a data input and a second latch that is coupled to the first latch retains the data input while the first latch is inoperative in a standby power mode. The second latch includes a second latch inverter having an inverter input and an inverter output. A switching circuit, which may be implemented as a tristate inverter, is coupled to the inverter output, the inverter input, and a retention signal. The switching circuit is operable in the standby power mode to assert a logic state at the inverter input responsive to the retention signal. The logic state is in accordance with the data input retained in the standby power mode. A standby power source is operable to provide power in the standby power mode to the second latch inverter, the switching circuit and the retention input.

Abstract: A digital storage element (e.g., a flip-flop or a latch) comprise a master transparent latch that receives functional data from a data input port and scan data from a scan input port and a slave transparent latch coupled to the master transparent latch. The slave transparent latch comprises dedicated functional data and scan data output ports. A clock gating element is also included that gates off a clock to the slave latch, and not the master transparent latch, based on an enable signal that is asserted to disable use of the digital storage element.

Abstract: A digital storage element comprises a master transparent latch that receives functional data from a data input port and scan data from a scan input port and a slave transparent latch coupled to the master transparent latch. The slave transparent latch comprises dedicated functional data and scan data output ports. The master and slave transparent latches have opposite transparent polarities when in a functional mode and have the same polarities (e.g., positive level sense) when in a scan mode. The transparent polarity of a transparent latch defines the state of a clock to that latch for which the transparent latch is transparent.

Abstract: A memory cell supporting scan-based tests and with reduced time delay in functional mode. The memory cell generates separate clocks for latching functional and scan data into a storage element contained in the memory cell. The use of separate clock signals permits transmission of scan data and functional data via separate paths, thereby eliminating additional circuitry that are otherwise needed to multiplex such scan and functional data through a same path. The absence of such additional circuitry reduces the time delays from input to output. The structure of the memory cell provided also permits easy addition of logic functions without substantially affecting operating speeds.

Abstract: A digital storage element comprises a master transparent latch that receives functional data signals from data input ports and scan data signals from a scan input port, the data input ports coupled to a four-input, one-output multiplexer adapted to receive the functional data signals and to selectively output one of the functional data signals. The digital storage element also comprises a slave transparent latch coupled to the master transparent latch, the slave transparent latch comprising dedicated functional data and scan data output ports. While operating in a scan mode, a first clock signal is used by the slave transparent latch and a second clock signal is used by the master transparent latch, wherein the first and second clock signals are non-overlapping.

Abstract: A digital storage element comprises a master transparent latch that receives functional data signals from data input ports and scan data signals from a scan input port, the data input ports coupled to a four-input, one-output multiplexer that receives the functional data signals and selectively outputs one of the functional data signals. The element comprises a slave transparent latch coupled to the master transparent latch and comprising dedicated functional and scan data output ports. While operating in a scan mode, a first clock signal is used by the slave transparent latch and a second clock signal is used by the master transparent latch, wherein the first and second clock signals are non-overlapping. A first transistor is coupled to the master transparent latch and a second transistor is coupled to the slave transparent latch. When activated, the first or second transistor resets the element.