Abstract: State definition and retention circuits are described. In one embodiment, a circuit includes two cross-connected PMOS transistors, first, second, and third NMOS transistors coupled to the PMOS transistors, an inverter circuit, and an output transistor connected to the PMOS transistors and to an output terminal of the circuit. The second NMOS transistor is connected to an input terminal of the circuit. A drain terminal and a gate terminal of the third NMOS transistor are connected to gate terminals of the PMOS transistors. The inverter circuit is coupled to the first and second NMOS transistors and to the input terminal. The inverter circuit is connected between a first power supply and a first base voltage. The PMOS transistors, the NMOS transistors, and the output transistor are connected between a second power supply and a second base voltage. Other embodiments are also described.

Abstract: State definition and retention circuits are described. In one embodiment, a circuit includes two cross-connected PMOS transistors, first, second, and third NMOS transistors coupled to the PMOS transistors, an inverter circuit, and an output transistor connected to the PMOS transistors and to an output terminal of the circuit. The second NMOS transistor is connected to an input terminal of the circuit. A drain terminal and a gate terminal of the third NMOS transistor are connected to gate terminals of the PMOS transistors. The inverter circuit is coupled to the first and second NMOS transistors and to the input terminal. The inverter circuit is connected between a first power supply and a first base voltage. The PMOS transistors, the NMOS transistors, and the output transistor are connected between a second power supply and a second base voltage. Other embodiments are also described.

Abstract: An electronic device is provided with a high-voltage tolerant circuit. The high-voltage tolerant circuit comprises an input terminal for receiving an input signal (VIN), a first node (A) and a second node (B), wherein the second node (B) is coupled to an input of a receiver (R). The high-voltage tolerant circuit furthermore comprises a first NMOS transistor (N1) and a first PMOS transistor (P1) coupled in parallel between the input terminal and the second node(B). Furthermore, a second PMOS transistor (P2) is coupled between the input terminal and node A and a second NMOS transistor is coupled with one of its terminals to the first node. The gate of the first NMOS transistor (N2) is coupled to a supply voltage (VDDE). The gate of the first PMOS transistor (P1) is coupled to the first node (A). The gate of the second NMOS transistor (N2) and the gate of the second PMOS transistor (P2) are coupled to the supply voltage (VDDE).

Abstract: A high voltage tolerant bus holder circuit and method of operating the bus holder circuit utilizes first and second control transistors connected in parallel between a control terminal of a pull-up transistor and a bus. The first control transistor is used to turn on the pull-up transistor during a pull-up mode of operation. The second control transistor is used to turn off the pull-down transistor when a voltage on the bus exceeds a threshold.

Abstract: The invention relates to a CMOS input circuit for receiving low-swing input signals, which is an alternative to the CMOS input circuits as known from the prior art.

Abstract: The invention relates to a CMOS input circuit for receiving low-swing input signals, which is an alternative to the CMOS input circuits as known from the prior art.

Abstract: An electronic circuit is provided comprising an input (VIN) for coupling a circuit of a first voltage domain to the electronic circuit, and a first, second, third and fourth transistor coupled between a supply voltage (VDD) and a voltage (VSS). The third transistor (M1) is coupled between the voltage (VSS) and a first node (tn). The second transistor (M2) is coupled between a second node (tp) and the output (VOUT). The third transistor (M3) is coupled between the first node (tn) and the output (VOUT). The fourth transistor (M4) is coupled between the supply voltage (VDD) and the second node (tp). A first reference voltage generating unit (RC) receives the voltage at the first node (tn) and the voltage (VSS) as input, and its output is coupled to the gate of the second transistor (M2). A second reference voltage generating unit (RD) receives the supply voltage (VDD) and the voltage of the second node (tp) as input, and its output is coupled to the gate of the third transistor (M3).

Abstract: An electronic device is provided with a high-voltage tolerant circuit. The high-voltage tolerant circuit comprises an input terminal for receiving an input signal (VIN), a first node (A) and a second node (B), wherein the second node (B) is coupled to an input of a receiver (R). The high-voltage tolerant circuit furthermore comprises a first NMOS transistor (N1) and a first PMOS transistor (P1) coupled in parallel between the input terminal and the second node (B). Furthermore, a second PMOS transistor (P2) is coupled between the input terminal and node A and a second NMOS transistor is coupled with one of its terminals to the first node. The gate of the first NMOS transistor (N2) is coupled to a supply voltage (VDDE). The gate of the first PMOS transistor (P1) is coupled to the first node (A). The gate of the second NMOS transistor (N2) and the gate of the second PMOS transistor (P2) are coupled to the supply voltage (VDDE).

Abstract: An electronic circuit is provided comprising an input (VIN) for coupling a circuit of a first voltage domain to the electronic circuit, and a first, second, third and fourth transistor coupled between a supply voltage (VDD) and a voltage (VSS). The third transistor (M1) is coupled between the voltage (VSS) and a first node (tn). The second transistor (M2) is coupled between a second node (tp) and the output (VOUT). The third transistor (M3) is coupled between the first node (tn) and the output (VOUT). The fourth transistor (M4) is coupled between the supply voltage (VDD) and the second node (tp). A first reference voltage generating unit (RC) receives the voltage at the first node (tn) and the voltage (VSS) as input, and its output is coupled to the gate of the second transistor (M2). A second reference voltage generating unit (RD) receives the supply voltage (VDD) and the voltage of the second node (tp) as input, and its output is coupled to the gate of the third transistor (M3).

Abstract: A constant voltage generator device provides a first and a second transistor having their main current path coupled serially via a common terminal for providing a constant output voltage at the common terminal of said transistors. The device provides one or more potential dividers having a plurality of serially connected resistive elements. A first voltage is obtained from a first combination of resistive elements of the potential divider and a second voltage obtained from a second combination of resistive elements of the potential divider. The first and the second voltages are supplied to the first and the second voltage at the control terminals of the first and the second transistors, respectively.