Abstract: A unit cell of an interwoven lattice structure having an interwoven point therein. The unit cell includes first, second, third, and fourth struts each having an interwoven node offset from the interwoven point. The first strut has a first interwoven node offset from a first diagonal unit cell plane in a first distance and first direction. The second strut has a second interwoven node offset from the first diagonal unit cell plane in a second distance and second direction opposite the first direction. The third strut has a third interwoven node offset from a second diagonal unit cell plane in a third distance and third direction. The fourth strut has a fourth interwoven node offset from the second diagonal unit cell plane in a fourth distance and fourth direction opposite the third direction. The first and second diagonal unit cell planes both pass through the interwoven point.

Abstract: Apparatus, systems, and methods are provided to generate markings on the surface of a die or substrate. The markings represent information. The markings can be annealed onto the surface of the die or substrate using a laser. Another embodiment can use an out-of-focus laser beam to mark a solder resist material.

Abstract: Apparatus, systems, and methods are provided to generate markings on the surface of a die or substrate. The markings represent information. The markings can be annealed onto the surface of the die or substrate using a laser. Another embodiment can use an out-of-focus laser beam to mark a solder resist material.