Patents by Inventor Di Lin

Di Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180356642
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium for managing beam shaping in gradient refractive index (GRIN) media are provided. In one aspect, a method includes specifying a field evolution throughout a gradient-index (GRIN) medium and generating a refractive index profile of the GRIN medium based on the specified field evolution in the GRIN medium. Diffraction effects are considered in solving for the refractive index profile. The index profile is found by specifying a desired beam transformation throughout the GRIN medium and solving a series of phase retrieval problems. The GRIN medium can be two-dimensional (2D) or three-dimensional (3D).
    Type: Application
    Filed: June 8, 2018
    Publication date: December 13, 2018
    Inventors: James Robert Leger, William Minster Kunkel, Di Lin
  • Patent number: 6834109
    Abstract: The present invention includes a method and system for compensating for cross-talk interference in communication systems. The method includes estimation of the interfering signals. Further, the method includes performing a compensation operation on at least one interfering signal.
    Type: Grant
    Filed: November 10, 2000
    Date of Patent: December 21, 2004
    Assignee: Tokyo Electron Limited
    Inventors: Thomas E. Paré, Jr., Michail Tsatsanis, Ioannis Kanellakopoulos, Mark Alan Erickson, Cecilia Gabriela Galarza, James W. Waite, Daniel Joseph Hernandez, Sunil C. Shah, Ming Gu, Norman Man Leung Yuen, Heberly Rosario, Di Lin, Fernando Lopez-de-Victoria
  • Patent number: 6818917
    Abstract: An infrared photodetector structure with voltage-tunable and -switchable photoresponses constructed of superlattices and blocking barriers. The photoresponses of the double-superlattice structure are also insensitive to the operating temperature changes. By using GaAs/AlxGa1-xAs system, the feasibility of this idea is verified. In the embodiment, the photoresponses can be switched between 6˜8.5 and 7.5˜12 m by the bias polarity and are also tunable by the bias magnitude in each detection wavelength range. In addition, the photoresponses are insensitive to operating temperatures ranging from 20 to 80 K. For the SLIP with few periods, the responsivity may be higher than the one with many periods and the operational temperature is higher. These results show the invention can be useful in the design of multicolor imaging systems.
    Type: Grant
    Filed: March 12, 2003
    Date of Patent: November 16, 2004
    Assignees: National Taiwan University, Integrated Crystal Technology Inc.
    Inventors: Chieh-Hsiung Kuan, Hsin-Cheng Chen, Chun-Chi Chen, Sheng-Di Lin, Jen-Hsiang Lu
  • Publication number: 20040178421
    Abstract: An infrared photodetector structure with voltage-tunable and -switchable photoresponses constructed of superlattices and blocking barriers. The photoresponses of the double-superlattice structure are also insensitive to the operating temperature changes. By using GaAs/AlxGa1-xAs system, the feasibility of this idea is verified. In the embodiment, the photoresponses can be switched between 6˜8.5 and 7.5˜12 m by the bias polarity and are also tunable by the bias magnitude in each detection wavelength range. In addition, the photoresponses are insensitive to operating temperatures ranging from 20 to 80 K. For the SLIP with few periods, the responsivity may be higher than the one with many periods and the operational temperature is higher. These results show the invention can be useful in the design of multicolor imaging systems.
    Type: Application
    Filed: March 12, 2003
    Publication date: September 16, 2004
    Applicant: National Taiwan University and Integrated Crystal Technology Incorporation
    Inventors: Chieh-Hsiung Kuan, Hsin-Cheng Chen, Chun-Chi Chen, Sheng-Di Lin, Jen-Hsiang Lu
  • Publication number: 20030194614
    Abstract: A method of forming a phase shift mask is disclosed. After providing a substrate with a shifter layer and a Cr layer, a first photoresist layer is formed on the Cr layer. Thereafter, a position of a shifter pattern is defined by using E-beam writing process and then a develop process is performed. After that, a first Cr pattern is formed by using an etching process to etch the Cr layer. After removing the first photoresist layer, the shifter pattern is formed by using an etching process to etch the shifter layer. After forming a second photoresist layer, an exposure process of conventional photolithography is performed by means of a boarder mask to define a position of a second Cr pattern. After performing a develop process, the second Cr pattern is formed by using an etching process to etch the first Cr pattern.
    Type: Application
    Filed: April 10, 2002
    Publication date: October 16, 2003
    Inventor: Hsin-Di Lin
  • Patent number: D469568
    Type: Grant
    Filed: January 24, 2002
    Date of Patent: January 28, 2003
    Assignee: Spec Enterprise Inc.
    Inventor: Jin Di Lin
  • Patent number: D469919
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: February 4, 2003
    Assignee: Spec Enterprise Inc.
    Inventor: Jin Di Lin