Patents by Inventor DIAA A. KHALIL
DIAA A. KHALIL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11953377Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device. The spectral sensing device includes a substrate, a spectrometer, and a detector. The substrate includes an ATR element, a microfluidic channel, and a channel interface at a boundary between the ATR element and the microfluidic channel formed therein. The ATR element is configured to receive input light and to direct the input light to the channel interface for total internal reflection of the input light at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light attenuates the light output from the ATR element and the resulting output light may be analyzed using the spectrometer and the detector.Type: GrantFiled: February 15, 2022Date of Patent: April 9, 2024Assignee: SI-WARE SYSTEMSInventors: Yasser M. Sabry, Amr O. Ghoname, Momen Anwar, Diaa Khalil
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Patent number: 11841268Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.Type: GrantFiled: February 1, 2022Date of Patent: December 12, 2023Assignee: SI-WARE SYSTEMSInventors: Yasser M. Sabry, Bassem A. Mortada, Khaled Hassan, Abdelrahman Ahmed Maher Mohamed Elsayed Salem, Diaa Khalil, Mohamed H. Al Haron, Mohammed Ahmed Elsheikh, Ahmed Shebl, Bassam Saadany, Mostafa Medhat, Botros George Iskander Shenouda
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Publication number: 20230393173Abstract: Aspects of the disclosure relate to an apparatus including an opto-electrical probe card platform for wafer-level testing of optical micro-electro-mechanical-systems (MEMS) structures. The probe card platform includes an electrical probe card including alignment needles for aligning with an optical MEMS structure during testing thereof. The probe card platform further includes an optical head configured to direct input light to towards the optical MEMS structure through the electrical probe card and an optical positioner attached to the electrical probe card and configured to align the optical head. The apparatus may further include a camera and a processor configured to process at least one image obtained by the camera and to generate alignment assistance data to assist the optical positioner in aligning the optical head.Type: ApplicationFiled: June 1, 2023Publication date: December 7, 2023Inventors: Tarek Mohamed Zeinah, Bassem Mortada, Momen Anwar, Mohamed Ramadan, Mohamed Hamouda, Yasser M. Sabry, Diaa Khalil, Ahmed Shebl, Bassam Saadany, Ahmed Emad, Mohamed Badr, Moez ElMassry
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Publication number: 20230036551Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.Type: ApplicationFiled: July 28, 2022Publication date: February 2, 2023Inventors: Yasser M. Sabry, Mohamed H. Al Haron, Bassem Mortada, Ahmed Othman, Diaa Khalil, Bassam Saadany, Ahmed Shebl, Botros George Iskander Shenouda
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Publication number: 20220404361Abstract: Aspects relate to a spectroscopic analyzer device that can be used for biological sample detection, and specifically for virus infection detection. The spectroscopic analyzer device includes a spectrometer, such as a micro-electro-mechanical systems (MEMS) based infrared spectrometer, and an artificial intelligence (AI) for screening of viral samples. In addition, the spectroscopic analyzer device includes a light source and a disposable optical component configured to receive a sample and to facilitate light interaction with the sample.Type: ApplicationFiled: June 15, 2022Publication date: December 22, 2022Inventors: Yasser M. Sabry, Momen Anwar, Amr O. Ghoname, Mohamed H. Al Haron, Moustafa Mohamed, Mohamed Kilany, Mazen Erfan, Bassam Saadany, Diaa Khalil, Bassem Mortada, Erik R. Deutsch
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Publication number: 20220260419Abstract: Aspects relate to an integrated and compact attenuated total internal reflection (ATR) spectral sensing device. The spectral sensing device includes a substrate, a spectrometer, and a detector. The substrate includes an ATR element, a microfluidic channel, and a channel interface at a boundary between the ATR element and the microfluidic channel formed therein. The ATR element is configured to receive input light and to direct the input light to the channel interface for total internal reflection of the input light at the channel interface. An evanescent wave produced by a sample contained within the microfluidic channel based on the total internal reflection of the input light attenuates the light output from the ATR element and the resulting output light may be analyzed using the spectrometer and the detector.Type: ApplicationFiled: February 15, 2022Publication date: August 18, 2022Inventors: Yasser M. Sabry, Amr O. Ghoname, Momen Anwar, Diaa Khalil
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Publication number: 20220244101Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.Type: ApplicationFiled: February 1, 2022Publication date: August 4, 2022Inventors: Yasser M. Sabry, Bassem A. Mortada, Khaled Hassan, Abdelrahman Ahmed Maher Mohamed Elsayed Salem, Diaa Khalil, Mohamed H. Al Haron, Mohammed Ahmed Elsheikh, Ahmed Shebl, Bassam Saadany, Mostafa Medhat, Botros George Iskander Shenouda
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Patent number: 10782342Abstract: Aspects relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.Type: GrantFiled: November 20, 2017Date of Patent: September 22, 2020Assignee: SI-WARE SYSTEMSInventors: Bassam Saadany, Mostafa Medhat, Muhammad Nagi, Ahmed Shebl, Yasser M. Sabry, Bassem Mortada, Diaa Khalil
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Publication number: 20180143245Abstract: Aspects of the disclosure relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.Type: ApplicationFiled: November 20, 2017Publication date: May 24, 2018Inventors: Bassam Saadany, Mostafa Medhat, Muhammad Nagi, Ahmed Shebl, Yasser M. Sabry, Bassem Mortada, Diaa Khalil
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Patent number: 9970819Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.Type: GrantFiled: January 28, 2016Date of Patent: May 15, 2018Assignee: Si-Ware SystemsInventors: Diaa Khalil, Bassam A. Saadany, Yasser M. Sabry
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Patent number: 9793478Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.Type: GrantFiled: July 6, 2016Date of Patent: October 17, 2017Assignee: SI-WARE SYSTEMSInventors: Yasser M. Sabry, Diaa Khalil, Tarik E. Bourouina, Momen Anwar
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Publication number: 20170012199Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.Type: ApplicationFiled: July 6, 2016Publication date: January 12, 2017Inventors: Yasser M. Sabry, Diaa Khalil, Tarik E. Bourouina, Momen Anwar
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Publication number: 20160282184Abstract: A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.Type: ApplicationFiled: January 28, 2016Publication date: September 29, 2016Inventors: Diaa Khalil, Bassam A. Saadany, Yasser M. Sabry
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Patent number: 8792105Abstract: An interferometer includes a variable optical path length reference mirror to produce a final interferogram from a combination of interferograms. Each of the interferograms is generated at a different optical path length of the reference mirror.Type: GrantFiled: January 19, 2011Date of Patent: July 29, 2014Assignee: Si-Ware SystemsInventors: Diaa A. Khalil, Bassam A. Saadany
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Patent number: 8531675Abstract: A Micro Electro-Mechanical System (MEMS) spectrometer architecture compensates for verticality and dispersion problems using balancing interfaces. A MEMS spectrometer/interferometer includes a beam splitter formed on a first surface of a first medium at an interface between the first medium and a second medium, a first mirror formed on a second surface of the first medium, a second mirror formed on a third surface of the first medium and balancing interfaces designed to minimize both a difference in tilt angles between the surfaces and a difference in phase errors between beams reflected from the first and second mirrors.Type: GrantFiled: September 8, 2010Date of Patent: September 10, 2013Assignee: Si-Ware Systems, Inc.Inventors: Diaa A. Khalil, Bassem Mortada, Mohamed Nabil, Mostafa Medhat, Bassam A. Saadany
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Patent number: 8508745Abstract: A Mach-Zehnder MEMS interferometer is achieved using two half plane beam splitters formed at respective edges of a first medium. The first beam splitter is optically coupled to receive an incident beam and operates to split the incident beam into two beams, a first one propagating in the first medium towards the second beam splitter and a second one propagating in a second medium. A moveable mirror in the second medium reflects the second beam back towards the second beam splitter to cause interference of the two beams.Type: GrantFiled: August 3, 2010Date of Patent: August 13, 2013Assignee: Si-Ware SystemsInventors: Bassam A. Saadany, Diaa A. Khalil, Tarik E. Bourouina
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Patent number: 8411340Abstract: An optical microscanner achieves wide rotation angles utilizing a curved reflector. The optical microscanner includes a moveable mirror for receiving an incident beam and reflecting the incident beam to produce a reflected beam and a Micro Electro-Mechanical System (MEMS) actuator that causes a linear displacement of the moveable mirror. The curved reflector produces an angular rotation of the reflected beam based on the linear displacement of the moveable mirror.Type: GrantFiled: April 16, 2010Date of Patent: April 2, 2013Assignee: Si-Ware SystemsInventors: Diaa A. Khalil, Hisham Haddara
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Publication number: 20120320936Abstract: A MEMS-based swept laser source is formed from two coupled cavities. The first cavity includes a first mirror and a fully reflective moveable mirror and operates to tune the output wavelength of the laser. The second cavity is optically coupled to the first cavity and includes an active gain medium, the first mirror and a second mirror. The second cavity further has a length substantially greater than the first cavity such that there are multiple longitudinal modes of the second cavity within a transmission bandwidth of the first cavity output.Type: ApplicationFiled: June 20, 2012Publication date: December 20, 2012Applicant: SI-WARE SYSTEMSInventors: Bassam A. Saadany, Mohamed Sadek, Haitham Omran, Diaa A. Khalil
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Publication number: 20110176138Abstract: An interferometer includes a variable optical path length reference mirror to produce a final interferogram from a combination of interferograms. Each of the interferograms is generated at a different optical path length of the reference mirror.Type: ApplicationFiled: January 19, 2011Publication date: July 21, 2011Applicant: SI-WARE SYSTEMSInventors: Diaa Khalil, Bassam A. Saadany
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Publication number: 20110058180Abstract: A Micro Electro-Mechanical System (MEMS) spectrometer architecture compensates for verticality and dispersion problems using balancing interfaces. A MEMS spectrometer/interferometer includes a beam splitter formed on a first surface of a first medium at an interface between the first medium and a second medium, a first mirror formed on a second surface of the first medium, a second mirror formed on a third surface of the first medium and balancing interfaces designed to minimize both a difference in tilt angles between the surfaces and a difference in phase errors between beams reflected from the first and second mirrors.Type: ApplicationFiled: September 8, 2010Publication date: March 10, 2011Applicant: SI-WARE SYSTEMSInventors: Diaa A. Khalil, Bassem Mortada, Mohamed Nabil, Mostafa Medhat, Bassam A. Saadany