Patents by Inventor Diago Fukuma

Diago Fukuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100106427
    Abstract: A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.
    Type: Application
    Filed: October 26, 2009
    Publication date: April 29, 2010
    Applicant: SYSMEX CORPORATION
    Inventors: Diago Fukuma, Takaaki Nagai, Masaharu Shibata