Patents by Inventor Diane E. Deterline

Diane E. Deterline has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7869050
    Abstract: A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
    Type: Grant
    Filed: August 13, 2009
    Date of Patent: January 11, 2011
    Assignee: Eoir Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline
  • Systems and Methods for Comparative Interferogram Spectrometry
    Publication number: 20090296097
    Abstract: A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
    Type: Application
    Filed: August 13, 2009
    Publication date: December 3, 2009
    Applicant: EOIR TECHNOLOGIES, INC.
    Inventors: George G. He, Diane E. Deterline
  • Systems and methods for comparative interferogram spectrometry
    Patent number: 7593112
    Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: September 22, 2009
    Assignee: EOIR Technologies, Inc.
    Inventors: George G. He, Diane E. Deterline
  • Systems and methods for comparative interferogram spectrometry
    Publication number: 20080084564
    Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.
    Type: Application
    Filed: October 2, 2006
    Publication date: April 10, 2008
    Inventors: George G. He, Diane E. Deterline