Abstract: A method of non-destructively determining the amount of ultraviolet degradation of a surface and/or paint adhesion characteristics of the surface corresponding with UV damage including determining a physical property of a composite material/surfacing film by providing a series of composite materials/surfacing films which are subjected to increasing UV light exposure to create a set of UV damage standards, collecting mid-IR spectra on those standards, performing data pre-processing and then multivariate calibration on the spectra of the composite materials/surfacing films, and using that calibration to predict the UV damage for samples in question.

Abstract: A method of non-destructively determining the amount of ultraviolet degradation of a surface and/or paint adhesion characteristics of the surface corresponding with UV damage including determining a physical property of a composite material/surfacing film by providing a series of composite materials/surfacing films which are subjected to increasing UV light experience to create a set of UV damage standards, collecting mid-IR spectra on those standards, performing data pre-processing and then multivariate calibration on the spectra of the composite materials/surfacing films, and using that calibration to predict the UV damage for samples in question.

Abstract: A method is provided for identifying contaminants on a surface. In one embodiment, an infrared beam is transmitted onto a sample. A first infrared absorbance of the sample is determined at a first wave number. A second infrared absorbance of the sample is determined at a second wave number. The first absorbance is correlated to a first absorbance peak of a contaminant. The presence of a predetermined level of the contaminant is confirmed by correlating the second infrared absorbance to a second absorbance peak of the contaminant.

Abstract: Apparatus and methods of determining the chemical properties of a composite material using infrared spectroscopy are disclosed. In one embodiment, an apparatus for determining the chemical properties of a composite material includes an infrared source configured to project infrared energy towards an optical interface positioned on a surface of the composite material. An infrared detector then receives infrared energy gathered by the optical interface. One or more optical filters operable to transmit a respective range of wavelengths are positioned in the reflected beam.

Abstract: A non-destructive method determines an amount of heat exposure to a resin-fiber composite substrate. A value of infrared energy reflected by a composite substrate is determined. The value of infrared energy reflected, or conversely absorbed, is correlated to a degree or amount of heat exposure. According to an aspect of the present invention, one method utilizes an infrared spectrometer to determine infrared absorbance of a composite substrate. The infrared energy of the reflected beam is then compared with the pre-determined value of infrared energy reflected off a reference heat damaged composite substrate to determine the amount of heat exposure.

Abstract: Amount of coating cure or contamination is determined. An infrared beam is transmitted into a crystal. The beam reflects off an internal face at an angle higher than critical reflection angle to generate total reflection at the crystal face. The beam exits the crystal, is filtered at two wavelengths, and is detected to give values Io1 and Io2 of infrared energy reflected without coating. A coated sample contacts an outside face of the crystal. An evanescent wave penetrates the sample where the beam reflects from internal crystal face. The beam is partially absorbed by sample, exits the crystal, is filtered at two wavelengths, and is detected to give values Ic1 and Ic2 of infrared energy reflected with coating. Absorbance values A1 and A2 at two wavelengths are A1=?log10(Ic1/Io1) and A2=?log10(Ic2/Io2). Amount of cure or contamination is proportional to ratio or difference between A1 and A2.

Abstract: Amount of opaque coating on a substrate is determined. An infrared beam is transmitted into the opaque coating on the substrate. Infrared beams scattered by the opaque coating are collected and detected at a first wavelength and a second wavelength. Infrared energy Ic1 and Ic2 of the collected infrared beams at the first and second wavelengths, respectively, are compared with predetermined values of infrared energy Io1 and Io2 of collected infrared beams at the first and second wavelengths, respectively, that are scattered by a reference substrate without the opaque coating to determine absorbance values A1 and A2 for the opaque coating at the first and second wavelengths, respectively. Absorbance values A1 and A2 at the first and second wavelengths are given by equations A1=?log10(Ic1/Io1) and A2=?log10(Ic2/Io2). A difference A1?A2 is correlated to an opaque coating amount.

Abstract: Amount of coating cure or contamination is determined. An infrared beam is transmitted into a crystal. The beam reflects off an internal face at an angle higher than critical reflection angle to generate total reflection at the crystal face. The beam exits the crystal, is filtered at two wavelengths, and is detected to give values Io1 and Io2 of infrared energy reflected without coating. A coated sample contacts an outside face of the crystal. An evanescent wave penetrates the sample where the beam reflects from internal crystal face. The beam is partially absorbed by sample, exits the crystal, is filtered at two wavelengths, and is detected to give values Ic1 and Ic2 of infrared energy reflected with coating. Absorbance values A1 and A2 at two wavelengths are A1=−log10(Ic1/Io1) and A2=−log10(Ic2/Io2). Amount of cure or contamination is proportional to ratio or difference between A1 and A2.

Abstract: Amount of opaque coating on a substrate is determined. An infrared beam is transmitted into the opaque coating on the substrate. Infrared beams scattered by the opaque coating are collected and detected at a first wavelength and a second wavelength. Infrared energy Ic1 and Ic2 of the collected infrared beams at the first and second wavelengths, respectively, are compared with predetermined values of infrared energy Io1 and Io2 of collected infrared beams at the first and second wavelengths, respectively, that are scattered by a reference substrate without the opaque coating to determine absorbance values A1 and A2 for the opaque coating at the first and second wavelengths, respectively. Absorbance values A1 and A2 at the first and second wavelengths are given by equations A1=−log10(Ic1/Io1) and A2=−log10(IC2/Io2). A difference A1−A2 is correlated to an opaque coating amount.