Abstract: A method of quantitative X-ray analysis includes capturing X-ray fluorescence data from a pressed powder sample including a binder. A quantity and/or distribution of binder is assumed and the concentration of various components of the sample is calculated from the measured data and the assumed quantity of binder. Then, the concentration of binder is adjusted and the calculation step repeated until the method converges. The method is allowed to take widely different values of quantity of binder, which may be the concentration of the binder in the sample or alternatively the thickness of an assumed thin layer at the surface of a model used for calculation.

Abstract: Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ?1 to the surface of the sample and measuring a measured intensity Id(?fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ?2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Abstract: Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ?1 to the surface of the sample and measuring a measured intensity Id(?fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ?2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.