Abstract: Apparatus and methods for calibrating radio frequency transmitters to compensate for common mode local oscillator leakage are provided herein. In certain configurations herein, a transmitter generates a radio frequency transmit signal based on mixing a baseband input signal with a local oscillator signal. The transmitter is calibrated to compensate for common mode local oscillator leakage. Thus, a common mode component of the local oscillator signal is reduced or eliminated from the radio frequency transmit signal, which provides a number of benefits, including lower levels of undesired emissions from the transmitter.

Abstract: Apparatus and methods for calibrating radio frequency transmitters to compensate for common mode local oscillator leakage are provided herein. In certain configurations herein, a transmitter generates a radio frequency transmit signal based on mixing a baseband input signal with a local oscillator signal. The transmitter is calibrated to compensate for common mode local oscillator leakage. Thus, a common mode component of the local oscillator signal is reduced or eliminated from the radio frequency transmit signal, which provides a number of benefits, including lower levels of undesired emissions from the transmitter.

Abstract: Methods and apparatus for substrate modeling are disclosed. In one disclosed method, for example, the substrate modeling comprises determining scalable Z parameters associated with at least two substrate contacts, constructing a matrix of the scalable Z parameters for the at least two substrate contacts, and calculating an inverse of the matrix to determine resistance values associated with the at least two substrate contacts. Computer-readable media containing computer-executable instructions for causing a computer system to perform any of the described methods are also disclosed.

Abstract: Methods and apparatus for substrate modeling are disclosed. In one disclosed method, for example, the substrate modeling comprises determining scalable Z parameters associated with at least two substrate contacts, constructing a matrix of the scalable Z parameters for the at least two substrate contacts, and calculating an inverse of the matrix to determine resistance values associated with the at least two substrate contacts. Computer-readable media containing computer-executable instructions for causing a computer system to perform any of the described methods are also disclosed.