Patents by Inventor Didier Theron

Didier Theron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8952891
    Abstract: A system for detecting responses of a MEMS resonator device includes first and second signal sources, a signal divider and a frequency mixer. The first signal source provides a first signal and the second signal source provides a second signal that electrostatically drives the MEMS resonator device, causing mechanical vibration. The signal divider divides the first signal into a probe signal and a local oscillator (LO) signal, the probe signal being applied to the MEMS resonator device and reflected by a capacitance of the MEMS resonator device. A reflection coefficient is modulated onto the reflected probe signal at the mechanical resonance frequency by variations in the capacitance induced by the mechanical vibration of the MEMS resonator device. The frequency mixer mixes the reflected probe signal and the LO signal and outputs an intermediate frequency (IF) signal, which represents modulation of the reflection coefficient, providing an image of the mechanical vibration.
    Type: Grant
    Filed: May 11, 2012
    Date of Patent: February 10, 2015
    Assignee: Keysight Technologies, Inc.
    Inventors: Hassan Tanbakuchi, Bernard Legrand, Damien Ducatteau, Didier Theron
  • Patent number: 8763160
    Abstract: During a measurement in KFM mode of the surface potential of a material (P), a detection point (1) is arranged above a surface (S) of the material. Two piezoelectric actuators (2, 5) are used to monitor a mean distance of the detection point relative to the surface of the material and a mechanical oscillation of said point. During the measurement, a control voltage is applied between control electrodes (2a, 2b) of the piezoelectric actuator (2) which is dedicated to the mechanical oscillation of the detection point (1), said control voltage not having an alternative component to an angular frequency of electrical energization of said detection point. A result of the KFM measurement is therefore separate from operating parameters such as a projection angle used to perform closed-loop control and a value of the angular frequency of electrical energization. The invention thus provides absolute measurements of surface potentials.
    Type: Grant
    Filed: February 9, 2011
    Date of Patent: June 24, 2014
    Assignees: Centre National de la Recherche Scientifique—CNRS, Universite des Sciences et Technologies de Lille
    Inventors: Thierry Melin, Didier Theron, Sophie Barbet, Dominique Deresmes, Heinrich Diesinger
  • Publication number: 20130169341
    Abstract: A system for detecting responses of a MEMS resonator device includes first and second signal sources, a signal divider and a frequency mixer. The first signal source provides a first signal and the second signal source provides a second signal that electrostatically drives the MEMS resonator device, causing mechanical vibration. The signal divider divides the first signal into a probe signal and a local oscillator (LO) signal, the probe signal being applied to the MEMS resonator device and reflected by a capacitance of the MEMS resonator device. A reflection coefficient is modulated onto the reflected probe signal at the mechanical resonance frequency by variations in the capacitance induced by the mechanical vibration of the MEMS resonator device. The frequency mixer mixes the reflected probe signal and the LO signal and outputs an intermediate frequency (IF) signal, which represents modulation of the reflection coefficient, providing an image of the mechanical vibration.
    Type: Application
    Filed: May 11, 2012
    Publication date: July 4, 2013
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Hassan Tanbakuchi, Bernard Legrand, Damien Ducatteau, Didier Theron
  • Publication number: 20120304342
    Abstract: During a measurement in KFM mode of the surface potential of a material (P), a detection point (1) is arranged above a surface (S) of the material. Two piezoelectric actuators (2, 5) are used to monitor a mean distance of the detection point relative to the surface of the material and a mechanical oscillation of said point. During the measurement, a control voltage is applied between control electrodes (2a, 2b) of the piezoelectric actuator (2) which is dedicated to the mechanical oscillation of the detection point (1), said control voltage not having an alternative component to an angular frequency of electrical energisation of said detection point. A result of the KFM measurement is therefore separate from operating parameters such as a projection angle used to perform closed-loop control and a value of the angular frequency of electrical energisation. The invention thus provides absolute measurements of surface potentials.
    Type: Application
    Filed: February 9, 2011
    Publication date: November 29, 2012
    Applicant: UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LILLE
    Inventors: Thierry Melin, Didier Theron, Sophie Barbet, Dominique Deresmes, Heinrich Diesinger
  • Patent number: 4114715
    Abstract: Pipes undergoing torsion stresses at one fixed extremity, the other extremity being flexibly supported, and in particular, exhaust pipes for motor vehicles. The concentration of stresses at the fixed end are eliminated and distributed in the center of the pipe by reinforcing its moment of inertia and its rigidity at the fixed extremity, and by creating a series of localized zones with a reduced moment of inertia in the center area, where the stresses undergone by the pipe at its fixed end are distributed in limited fashion. The invention is especially applicable to the exhaust pipes of internal combustion engines.
    Type: Grant
    Filed: June 1, 1976
    Date of Patent: September 19, 1978
    Assignee: Regie Nationale des Usines Renault
    Inventor: Didier Theron