Patents by Inventor Dietmar Ley

Dietmar Ley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5648850
    Abstract: The invention pertains to a method and a device for carrying out the quality control of an object (10) that comprises at least one transparent layer (18). According to this method and this device, at least one light beam (41) of a light source (42) is projected onto the object (10) at an angle (.alpha.) and is received by at least one photosensitive receiver (53). According to the invention, it is proposed that the light beam that emerges from the object be split before it is projected onto the first photosensitive receiver (53), with part of the light beam being deflected in the direction toward a second photosensitive receiver (62). This measure makes it possible to expose simultaneously two different photosensitive receivers (53, 62) so as to display different defects of an object (10).
    Type: Grant
    Filed: September 21, 1995
    Date of Patent: July 15, 1997
    Assignee: Basler GmbH
    Inventors: Norbert Basler, Jurgen Klicker, Dietmar Ley