Patents by Inventor Dietmar Runge
Dietmar Runge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 7859278Abstract: A probe holder in which the probe needle has a slight horizontal offset under the action of a vertical force comprises a probe holder for a probe needle, wherein the holder is adapted, for fastening and electrical contact-connection, on a carrier device of a test apparatus and has a holder arm having a needle holder at the free end thereof to fasten the probe needle, and a fastening arm for connecting the holder arm to the carrier device. The holder arm and fastening arm are connected to one another by a parallel guide whereby horizontal offset of the needle tip on account of external forces can be reduced or even prevented making it easier for the probe needle to carry out a vertical yielding movement, with almost no rotation of the probe needle about a horizontal axis.Type: GrantFiled: February 13, 2007Date of Patent: December 28, 2010Assignee: SUSS MicroTec Test Systems GmbHInventors: Dietmar Runge, Stojan Kanev, Claus Dietrich
-
Patent number: 7463044Abstract: An adapter for positioning of contact tips has a location surface for locating a contact tip and a base element with a base for setting the adapter on a mounting surface. A positioning element is in mechanical contact with and mobile relative to the base element. The location surface can be positioned relative to the base, in at least one positioning direction, by the positioning element which includes a gearing for converting rotary movement to translational movement in the positioning direction.Type: GrantFiled: September 12, 2006Date of Patent: December 9, 2008Assignee: SUSS Microtec Test Systems GmbHInventors: Steffen Schott, Stefan Kreissig, Axel Becker, Dietmar Runge
-
Publication number: 20080122465Abstract: A probe holder in which the probe needle has a slight horizontal offset under the action of a vertical force comprises a probe holder for a probe needle, wherein the holder is adapted, for fastening and electrical contact-connection, on a carrier device of a test apparatus and has a holder arm having a needle holder at the free end thereof to fasten the probe needle, and a fastening arm for connecting the holder arm to the carrier device. The holder arm and fastening arm are connected to one another by a parallel guide whereby horizontal offset of the needle tip on account of external forces can be reduced or even prevented making it easier for the probe needle to carry out a vertical yielding movement, with almost no rotation of the probe needle about a horizontal axis.Type: ApplicationFiled: February 13, 2007Publication date: May 29, 2008Applicant: SUSS MICROTEC TEST SYSTEMS GMBHInventors: Dietmar RUNGE, Stojan KANEV, Claus DIETRICH
-
Publication number: 20070296402Abstract: An adapter for positioning of contact tips has a location surface for locating a contact tip and a base element with a base for setting the adapter on a mounting surface. A positioning element is in mechanical contact with and mobile relative to the base element. The location surface can be positioned relative to the base, in at least one positioning direction, by the positioning element which includes a gearing for converting rotary movement to translational movement in the positioning direction.Type: ApplicationFiled: September 12, 2006Publication date: December 27, 2007Applicant: SUSS MICROTEC TEST SYSTEMS GMBHInventors: Steffen Schott, Stefan Kreissig, Axel Becker, Dietmar Runge
-
Patent number: 7282930Abstract: A device for testing thin elements, such as wafers or individual substrates, while at the same time offering a facility for inspecting the reverse side of the thin elements is provided in which any deflection of the substrate as a consequence of high contact power of the probe card is avoided and which is also suitable for substrate diameters of 200 mm and above. The device includes a stable plate with a central opening positioned on the basic construction, a frame which can be moved and/or turned on the plate in an x/y direction and, if required, in a theta direction, a highly-rigid substrate support which can be mounted in the frame, and substrates which can be mounted on the substrate support, wherein the mounting is effected through a vacuum, using mechanical elements (clamping ring, clamping foil or other suitable clamping elements), gel pack pads, or adhesive etc.Type: GrantFiled: December 21, 2005Date of Patent: October 16, 2007Assignee: Suss Microtec Test Systems GmbHInventors: Uwe Beier, Dietmar Runge, Stefan Kreissig, Steffen Grauer, Matthias Rottka, Botho Hirschfeld, Joerg Kiesewetter
-
Publication number: 20070139067Abstract: A device for testing thin elements, such as wafers or individual substrates, while at the same time offering a facility for inspecting the reverse side of the thin elements is provided in which any deflection of the substrate as a consequence of high contact power of the probe card is avoided and which is also suitable for substrate diameters of 200 mm and above. The device includes a stable plate with a central opening positioned on the basic construction, a frame which can be moved and/or turned on the plate in an x/y direction and, if required, in a theta direction, a highly-rigid substrate support which can be mounted in the frame, and substrates which can be mounted on the substrate support, wherein the mounting is effected through a vacuum, using mechanical elements (clamping ring, clamping foil or other suitable clamping elements), gel pack pads, or adhesive etc.Type: ApplicationFiled: December 21, 2005Publication date: June 21, 2007Applicant: SUSS MicroTec Test Systems GmbHInventors: Uwe Beier, Dietmar Runge, Stefan Kreissig, Steffen Grauer, Matthias Rottka, Botho Hirschfeld, Joerg Kiesewetter
-
Patent number: 7038441Abstract: The invention, which relates to a test apparatus with loading device which has a chuck, which is provided with a bearing surface for a test substrate and with a chuck drive, by means of which the chuck can be displaced with a working area, and which has a receiving means for receiving test substrates, which can be displaced from a working area of the chuck to a receiving position outside the working area, is based on the object of increasing the accuracy of the movement of the chuck. Moreover, in the case of test apparatus with a controlled atmosphere, a further object is to prevent the chuck from being exposed to the open-air atmosphere.Type: GrantFiled: October 2, 2003Date of Patent: May 2, 2006Assignee: SUSS MicroTec Testsystems GmbHInventors: Karsten Stoll, Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Dietmar Runge
-
Publication number: 20040108847Abstract: The invention, which relates to a test apparatus with loading device which has a chuck, which is provided with a bearing surface for a test substrate and with a chuck drive, by means of which the chuck can be displaced with a working area, and which has a receiving means for receiving test substrates, which can be displaced from a working area of the chuck to a receiving position outside the working area, is based on the object of increasing the accuracy of the movement of the chuck. Moreover, in the case of test apparatus with a controlled atmosphere, a further object is to prevent the chuck from being exposed to the open-air atmosphere.Type: ApplicationFiled: October 2, 2003Publication date: June 10, 2004Inventors: Karsten Stoll, Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Dietmar Runge
-
Patent number: 6688156Abstract: The invention relates to a tester for pressure sensors in the wafer compound or isolated pressure sensors having a recess for the pressure sensors as well as means for electrical contacting of the electrical connections of at least one of the pressure sensors. The invention is intended to make it possible to test pressure sensors still in a wafer compound for their function. According to the invention, a pressure head is provided which has an interior space open on one side, the open face of which is capable of being mounted on the pressure sensor in such a way that the interior space is tightly sealed by the latter. In this way a static or dynamic pressure of specified amount and duration can be exerted on the sensor element at least so that the sensor element is moved out of its resting position. At the same time, the electrical connections of the selected pressure sensor are connected with an electrical evaluation unit.Type: GrantFiled: January 4, 2001Date of Patent: February 10, 2004Assignee: Karl Suss Dresden GmbHInventors: Claus Dietrich, Botho Hirschfeld, Dietmar Runge, Michael Teich, Stefan Schneidewind
-
Publication number: 20020152794Abstract: The invention relates to a tester for pressure sensors (1) in the wafer compound or isolated pressure sensors having a recess for the pressure sensors as well as means for electrical contacting (7) of the electrical connections of at least one of the pressure sensors. The invention is intended to make it possible to test pressure sensors still in a wafer compound for their function. According to the invention, a pressure head (9) is provided which has an interior space (10) open on one side, the open face (11) of which is capable of being mounted on the pressure sensor (1) in such a way that the interior space (10) is tightly sealed by the latter. In this way a static or dynamic pressure of specified amount and duration can be exerted on the sensor element (4) at least so that the sensor element (4) is moved out of its resting position. At the same time, the electrical connections (7) of the selected pressure sensor (1) are connected with an electrical evaluation unit (21).Type: ApplicationFiled: January 4, 2001Publication date: October 24, 2002Inventors: Claus Dietrich, Botho Hirschfeld, Dietmar Runge, Michael Teich, Stefan Schneidewind
-
Patent number: 6373272Abstract: The present invention provides an apparatus for the testing of semiconductor structures. The apparatus is provided with a chuck for holding a semiconductor wafer and with needle holders for contact needles, the chuck being provided with a fastening device for the semiconductor wafer and being movable for positioning, controlled using a positioning device, in relation to the contact needles. The object of the present invention is to detect faults, in good time and reliably, of non-serviceable or not fully serviceable chips before separation to avoid unnecessary work for separating and assembling defective chips. The object is attained in that the chuck has a receiving area exposing upwards a lower surface of the semiconductor wafer and a receiving plane therefor. The receiving plane is arranged above the needle carrier, and the contact needles point upwards in such a manner that they contact contact islands of the semiconductor chips on the downwardly directed upper surface of the semiconductor wafer.Type: GrantFiled: September 16, 1998Date of Patent: April 16, 2002Assignee: Karl Suss Dresden GmbHInventors: Reinhard Welsch, Claus Dietrich, Thomas Huelsmann, Dietmar Runge