Abstract: The present disclosure describes a scan latch which utilizes dynamic interface nodes to facilitate full scan operation with a reduced number of transistors. A scan latch slave stage is coupled to a storage node of a storage device to capture data from that device. The scan latch slave device has an output driver with an input node coupled by a pass gate to the storage node. A scan clock line is coupled to the pass gate and to an enable input of the output driver. A slave scan clock signal received on the scan clock line enables the output driver and controls the pass gate. A master stage which may be utilized with the scan latch slave stage has a tri-state input device coupled to a serial input. The tri-state input device is controlled by a master scan clock and has an output coupled to the storage node.