Patents by Inventor Dillon K. Inouye
Dillon K. Inouye has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20120096008Abstract: A data structure indexes identifiers corresponding to parameter patterns. The presence of an identifier in the data structure indicates that the corresponding parameter pattern may be present in a set of parameter patterns, while absence of the indicator can be used to indicate that the corresponding parameter pattern is not present. The data structure includes a first field which includes small parameter pattern records. Each parameter pattern record corresponds to an identifier corresponding to a parameter pattern. If the record corresponding to the identifier is set or present, the identifier is included in the first field. One or more additional fields are hierarchically below the first field. Each of the additional fields includes identifiers for a subset of information in the first field. The absence of an identifier corresponding to a parameter pattern at any level in all of the hierarchical threads indicates that the parameter pattern is not present.Type: ApplicationFiled: December 6, 2011Publication date: April 19, 2012Applicant: PERFECT SEARCH CORPORATIONInventors: Dillon K. Inouye, Jeanne B. Inouye, Ronald P. Millett, John C. Higgins
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Patent number: 7774347Abstract: Determining intersection points of parameter patterns. Parameter patterns are specified in a query. A method includes identifying a first parameter pattern from the query as occurring less often in the index than one other parameter pattern in the query. The data store is searched until a present location of the data store has been identified as including the first parameter pattern. Then the data store is searched for a location of another parameter pattern. If the present location is identified as including the another parameter pattern, then an indication is provided identifying an intersection. Otherwise, the method includes continuing searching remaining portions of the data store to find a location of the another parameter pattern at a new present location. At least one of the acts of searching above includes eliminating at least a portion of records of the data store from searching without being searched prior to being eliminated.Type: GrantFiled: August 30, 2007Date of Patent: August 10, 2010Assignee: Perfect Search CorporationInventors: Ronald P. Millett, Dillon K. Inouye, John C. Higgins
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Patent number: 7774353Abstract: Searching a data store for parameter patterns specified in a query. A method includes receiving a query from a user including N parameter patterns. One or more alternatives are associated to one or more of the N parameter patterns. One or more templates are created. Each of the templates describes a number of microsearches. Each of the microsearches includes one or more of the N parameter patterns or the alternatives. Microsearches described by at least one of the one or more templates are enumerated. One or more sub-microsearches are performed by searching for parameter patterns and/or alternatives. Each sub-microsearch may have less than all terms needed for a full microsearch. Based on the results of the one or more sub-microsearches, one or more microsearches are eliminated from searching. The data store is searched using one or more of the remaining microsearches.Type: GrantFiled: August 30, 2007Date of Patent: August 10, 2010Assignee: Perfect Search CorporationInventors: Ronald P. Millett, Dillon K. Inouye, John C. Higgins, John P. Pratt
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Patent number: 7644082Abstract: Abbreviated index of parameter patterns. An abbreviated index includes indicators that a parameter pattern may be in a set of parameter patterns. To create the abbreviated index, indicators for overlapping parameter patterns of a given parameter pattern are placed in the index. Different patterns may have the same indicator, so the abbreviated index does not necessarily give an absolute indication of the presence of a parameter pattern in the set of parameter patterns, but rather may give an indication of the possible inclusion of a parameter pattern. The use of indicators for overlapping patterns can be used to increase confidence as to the existence of a given parameter pattern in the set of parameter patterns. The absence of an indicator for a parameter pattern or an overlapping parameter pattern will indicate with certainty that the parameter pattern is not present in the set of parameter patterns.Type: GrantFiled: March 2, 2007Date of Patent: January 5, 2010Assignee: Perfect Search CorporationInventors: Ronald P. Millett, Dillon K. Inouye
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Publication number: 20090307184Abstract: Hyperspace index data structure. A data structure indexes identifiers corresponding to parameter patterns. The presence of an identifier in the data structure indicates that the corresponding parameter pattern may be present in a set of parameter patterns, while absence of the indicator can be used to indicate that the corresponding parameter pattern is not present. The data structure includes a first field which includes binary bits or groups of small parameter pattern keyed records. Each binary bit or parameter pattern keyed record corresponds to an identifier corresponding to a parameter pattern. If the bit or record corresponding to the identifier is set or present, the identifier is included in the first field. One or more additional fields are hierarchically below the first data field. Each of the additional fields includes identifiers for a subset of information in the first field.Type: ApplicationFiled: March 2, 2007Publication date: December 10, 2009Inventors: Dillon K. Inouye, Ronald P. Millett, John C. Higgins
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Publication number: 20090063454Abstract: Determining intersection points of parameter patterns. Parameter patterns are specified in a query. A method includes identifying a first parameter pattern from the query as occurring less often in the index than one other parameter pattern in the query. The data store is searched until a present location of the data store has been identified as including the first parameter pattern. Then the data store is searched for a location of another parameter pattern. If the present location is identified as including the another parameter pattern, then an indication is provided identifying an intersection. Otherwise, the method includes continuing searching remaining portions of the data store to find a location of the another parameter pattern at a new present location. At least one of the acts of searching above includes eliminating at least a portion of records of the data store from searching without being searched prior to being eliminated.Type: ApplicationFiled: August 30, 2007Publication date: March 5, 2009Applicant: PERFECT SEARCH CORPORATIONInventors: Ronald P. Millett, Dillon K. Inouye, John C. Higgins
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Publication number: 20090063479Abstract: Searching a data store for parameter patterns specified in a query. A method includes receiving a query from a user including N parameter patterns. One or more alternatives are associated to one or more of the N parameter patterns. One or more templates are created. Each of the templates describes a number of microsearches. Each of the microsearches includes one or more of the N parameter patterns or the alternatives. Microsearches described by at least one of the one or more templates are enumerated. One or more sub-microsearches are performed by searching for parameter patterns and/or alternatives. Each sub-microsearch may have less than all terms needed for a full microsearch. Based on the results of the one or more sub-microsearches, one or more microsearches are eliminated from searching. The data store is searched using one or more of the remaining microsearches.Type: ApplicationFiled: August 30, 2007Publication date: March 5, 2009Applicant: PERFECT SEARCH CORPORATIONInventors: Ronald P. Millett, Dillon K. Inouye, John C. Higgins, John P. Pratt