Patents by Inventor Dimitrios Mattheos Goustouridis

Dimitrios Mattheos Goustouridis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6704185
    Abstract: A method for making capacitive silicon pressure sensors and pressure switches with high long-term stability involves fabrication by wafer bonding of a silicon substrate wafer with another silicon wafer where a highly boron-doped diaphragm is defined by a self-aligned doping process through a window defined on an insulating layer. The long-term stability of the device is secured by anisotropically etching the window, e.g. by reactive ion etching, so as to create vertical window walls. The flatness of the diaphragm can be secured by the provision of an insulating film on the backside of the substrate wafer that compensates the stress on the silicon diaphragm created by the insulating layer present between the two wafers. The cavity formed by the window may contain gas or it may be evacuated in which case the fabrication method may also involve a process step facilitating the evacuation of the cavity and sealing the same using metal employed for making electrical connections.
    Type: Grant
    Filed: November 5, 2002
    Date of Patent: March 9, 2004
    Assignees: National Center for Scientific Research
    Inventors: Stavros Emmanuel Chatzandroulis, Dimitrios Mattheos Goustouridis, Dimitris Konstantin Tsoukalas, Pascal Jean Michel Normand
  • Publication number: 20030107868
    Abstract: A method for making capacitive silicon pressure sensors and pressure switches with high long-term stability involves fabrication by wafer bonding of a silicon substrate wafer with another silicon wafer where a highly boron-doped diaphragm is defined by a self-aligned doping process through a window defined on an insulating layer. The long-term stability of the device is secured by anisotropically etching the window, e.g. by reactive ion etching, so as to create vertical window walls. The flatness of the diaphragm can be secured by the provision of an insulating film on the backside of the substrate wafer that compensates the stress on the silicon diaphragm created by the insulating layer present between the two wafers. The cavity formed by the window may contain gas or it may be evacuated in which case the fabrication method may also involve a process step facilitating the evacuation of the cavity and sealing the same using metal employed for making electrical connections.
    Type: Application
    Filed: November 5, 2002
    Publication date: June 12, 2003
    Inventors: Stavros Emmanuel Chatzandroulis, Dimitrios Mattheos Goustouridis, Dimitris Konstantin Tsoukalas