Patents by Inventor Dinesh Kabra
Dinesh Kabra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240130210Abstract: An organic light-emitting diode (OLED) deposition system includes two deposition chambers, a transfer chamber between the two deposition chambers, a metrology system having one or more sensors to perform measurements of the workpiece within the transfer chamber, and a control system to cause the system to form an organic light-emitting diode layer stack on the workpiece. Vacuum is maintained around the workpiece while the workpiece is transferred between the two deposition chambers and while retaining the workpiece within the transfer chamber. The control system is configured to cause the two deposition chambers to deposit two layers of organic material onto the workpiece, and to receive a first plurality of measurements of the workpiece in the transfer chamber from the metrology system.Type: ApplicationFiled: December 22, 2023Publication date: April 18, 2024Inventors: Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd J. Egan, Dinesh Kabra, Gangadhar Banappanavar
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Patent number: 11927535Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.Type: GrantFiled: March 31, 2023Date of Patent: March 12, 2024Assignee: Applied Materials, Inc.Inventors: Avishek Ghosh, Byung-Sung Kwak, Todd Egan, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
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Patent number: 11889740Abstract: An organic light-emitting diode (OLED) deposition system includes two deposition chambers, a transfer chamber between the two deposition chambers, a metrology system having one or more sensors to perform measurements of the workpiece within the transfer chamber, and a control system to cause the system to form an organic light-emitting diode layer stack on the workpiece. Vacuum is maintained around the workpiece while the workpiece is transferred between the two deposition chambers and while retaining the workpiece within the transfer chamber. The control system is configured to cause the two deposition chambers to deposit two layers of organic material onto the workpiece, and to receive a first plurality of measurements of the workpiece in the transfer chamber from the metrology system.Type: GrantFiled: January 19, 2021Date of Patent: January 30, 2024Assignee: Applied Materials, Inc.Inventors: Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
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Patent number: 11856833Abstract: An organic light-emitting diode (OLED) deposition system includes two deposition chambers, a transfer chamber between the two deposition chambers, a metrology system having one or more sensors to perform measurements of the workpiece within the transfer chamber, and a control system to cause the system to form an organic light-emitting diode layer stack on the workpiece. Vacuum is maintained around the workpiece while the workpiece is transferred between the two deposition chambers and while retaining the workpiece within the transfer chamber. The control system is configured to cause the two deposition chambers to deposit two layers of organic material onto the workpiece, and to receive a first plurality of measurements of the workpiece in the transfer chamber from the metrology system.Type: GrantFiled: January 19, 2021Date of Patent: December 26, 2023Assignee: Applied Materials, Inc.Inventors: Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd J. Egan, Dinesh Kabra, Gangadhar Banappanavar
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Publication number: 20230320183Abstract: An organic light-emitting diode (OLED) deposition system includes two deposition chambers, a transfer chamber between the two deposition chambers, a metrology system having one or more sensors to perform measurements of the workpiece within the transfer chamber, and a control system to cause the system to form an organic light-emitting diode layer stack on the workpiece. Vacuum is maintained around the workpiece while the workpiece is transferred between the two deposition chambers and while retaining the workpiece within the transfer chamber. The control system is configured to cause the two deposition chambers to deposit two layers of organic material onto the workpiece, and to receive a first plurality of measurements of the workpiece in the transfer chamber from the metrology system.Type: ApplicationFiled: June 8, 2023Publication date: October 5, 2023Inventors: Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
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Publication number: 20230266247Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.Type: ApplicationFiled: March 31, 2023Publication date: August 24, 2023Inventors: Avishek GHOSH, Byung-Sung KWAK, Todd EGAN, Robert Jan VISSER, Gangadhar BANAPPANAVAR, Dinesh KABRA
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Patent number: 11662317Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.Type: GrantFiled: March 1, 2021Date of Patent: May 30, 2023Assignee: Applied Materials, Inc.Inventors: Avishek Ghosh, Byung-Sung Kwak, Todd Egan, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
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Publication number: 20220325398Abstract: A hybrid halide perovskite film and methods of forming a hybrid halide perovskite film on a substrate are described. The film is formed on the substrate by depositing an organic solution on a substrate, heating the substrate and the organic solution to form an organic layer on the substrate, depositing an inorganic layer on the organic layer, and heating the substrate having the inorganic layer thereon to form a hybrid halide perovskite film. In some embodiments, the hybrid halide perovskite film comprises a CH[NH2]2+MX3 compound, where M is selected from the group consisting of Sn, Pb, Bi, Mg and Mn, and where X is selected from the group consisting of I, Br and Cl. In other embodiments, the hybrid halide perovskite film comprises a FAMX3 compound. Methods of forming a piezoelectric device are also disclosed.Type: ApplicationFiled: April 13, 2021Publication date: October 13, 2022Applicant: Applied Materials, Inc.Inventors: Vijay Bhan Sharma, Abhijeet Laxman Sangle, Ankur Anant Kadam, Suresh Chand Seth, Richa Pandey, Dinesh Kabra, Valipe Ramgopal Rao
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Publication number: 20210208077Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.Type: ApplicationFiled: March 1, 2021Publication date: July 8, 2021Inventors: Avishek GHOSH, Byung-Sung KWAK, Todd EGAN, Robert Jan VISSER, Gangadhar BANAPPANAVAR, Dinesh KABRA
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Patent number: 10935492Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.Type: GrantFiled: January 25, 2019Date of Patent: March 2, 2021Assignee: APPLIED MATERIALS, INC.Inventors: Avishek Ghosh, Byung-Sung Kwak, Todd Egan, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra
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Patent number: 8546791Abstract: A light emissive or photovoltaic device comprising: a cathode structure for injecting electrons, the cathode structure having one or more constituent regions; an anode structure for injecting holes, the anode structure having one or more constituent regions; and an organic light emissive component located between the anode structure and the cathode structure; the refractive indices and the thicknesses of the or each constituent region of the cathode and anode structures and of the light emissive component being such that the emission or absorption spectrum of the device is substantially angularly dependent.Type: GrantFiled: June 18, 2009Date of Patent: October 1, 2013Assignee: Cambridge Enterprise LimitedInventors: Richard Henry Friend, Dinesh Kabra, Bernard Wenger, Henry Snaith, Myoung Hoon Song
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Publication number: 20130069043Abstract: An electro optic device comprising a first electrode and a second electrode and an emissive layer located between the first and second electrodes, the emissive layer comprising a polymeric semiconductor, or semiconducting and luminescent material having a thickness of 200 nm to 3000 nm.Type: ApplicationFiled: January 12, 2011Publication date: March 21, 2013Applicant: CAMBRIDGE ENTERPRISE LIMITEDInventors: Richard H. Friend, Henry Snaith, Dinesh Kabra, Myoung Hoon Song, Li Ping Lu
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Publication number: 20110140091Abstract: A light emissive or photovoltaic device comprising: a cathode structure for injecting electrons, the cathode structure having one or more constituent regions; an anode structure for injecting holes, the anode structure having one or more constituent regions; and an organic light emissive component located between the anode structure and the cathode structure; the refractive indices and the thicknesses of the or each constituent region of the cathode and anode structures and of the light emissive component being such that the emission or absorption spectrum of the device is substantially angularly dependent.Type: ApplicationFiled: June 18, 2009Publication date: June 16, 2011Applicant: CAMBRIDGE ENTERPRISE LIMITEDInventors: Richard H. Friend, Dinesh Kabra, Bernard Wenger, Henry Snaith, Myoung Hoon Song