Patents by Inventor Dinesh Khanna

Dinesh Khanna has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10662183
    Abstract: Disclosed herein are inhibitors of gene transcription mediated by myocardin-related transcription factor and serum response factor, or both myocardin-related transcription factor and serum response factor (“MRTF/SRF”), and methods for their use in treating or preventing cancer and fibrosis. In particular, disclosed herein are compounds of Formula (I) and Formula (II), and pharmaceutically acceptable salts thereof: wherein the substituents are as described.
    Type: Grant
    Filed: November 6, 2015
    Date of Patent: May 26, 2020
    Assignees: THE REGENTS OF THE UNIVERSITY OF MICHIGAN, BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY
    Inventors: Scott D. Larsen, Richard Neubig, Andrew Haak, Kim Hutchings, Walajapet Rajeswaran, Dinesh Khanna, Erika Mathes Lisabeth
  • Publication number: 20110014858
    Abstract: The present invention provides polishing pads for use in CMP processes. In one embodiment, a pad comprises a surface defining a plurality of grooves with landing surfaces separating the grooves, the landing surfaces together defining a substantially coplanar polishing surface, each groove having a depth of at least about 10 mil and a width, WG, with any two adjacent grooves being separated from each other a landing surface having a width, WL, wherein the quotient WL/WG is less than or equal to 3. In a preferred embodiment, the surface of the pad defines a series of concentric substantially circular grooves. In an alternative embodiment, the surface of the pad defines a spiral groove having a depth of at least about 10 mil and a width WG, and a spiral landing surface outlining spiral groove the having a width, WL, wherein the spiral landing surface defines a substantially coplanar polishing surface and the quotient WL/WG is less than or equal to 3.
    Type: Application
    Filed: July 16, 2010
    Publication date: January 20, 2011
    Inventors: Ching-Ming TSAI, Fred Sun, Sheng-Huan Liu, Jia-Cheng Hsu, Ananth Naman, Hao-Kuang Chiu, Dinesh Khanna
  • Publication number: 20070266641
    Abstract: The invention provides a chemical-mechanical polishing composition particularly useful in polishing tungsten-containing substrates. The composition comprises a tungsten etchant, an inhibitor of tungsten etching, and water, wherein the inhibitor of tungsten polishing is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom.
    Type: Application
    Filed: July 26, 2007
    Publication date: November 22, 2007
    Inventors: Robert Vacassy, Dinesh Khanna, Alexander Simpson
  • Patent number: 7294576
    Abstract: The invention provides a method of preparing a chemical-mechanical polishing composition for polishing a substrate with at least a first layer and a second layer. The method comprises providing both a first chemical-mechanical polishing composition comprising an abrasive with a selectivity for a first layer as compared to a second layer and a second chemical-mechanical polishing composition comprising an abrasive with different selectivity for the first layer as compared to the second layer, wherein the second chemical-mechanical polishing composition is stable in the presence of the first chemical-mechanical polishing composition, and mixing the first and second chemical-mechanical polishing compositions in a ratio to achieve a final selectivity for the first layer as compared to the second layer. The invention further provides a method of chemically-mechanically polishing a substrate.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: November 13, 2007
    Assignee: Cabot Microelectronics Corporation
    Inventors: Zhan Chen, Robert Vacassy, Benjamin Bayer, Dinesh Khanna
  • Publication number: 20070214728
    Abstract: The invention provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of a composition comprising a tungsten etchant, an inhibitor of tungsten etching, and water, wherein the inhibitor of tungsten polishing is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention further provides a chemical-mechanical polishing composition particularly useful in polishing tungsten-containing substrates.
    Type: Application
    Filed: February 1, 2007
    Publication date: September 20, 2007
    Applicant: Cabot Microelectronics Corporation
    Inventors: Robert Vacassy, Dinesh Khanna, Alexander Simpson
  • Publication number: 20050282391
    Abstract: The invention provides a method of chemically-mechanically polishing a substrate comprising tungsten through use of a composition comprising a tungsten etchant, an inhibitor of tungsten etching, and water, wherein the inhibitor of tungsten polishing is a polymer, copolymer, or polymer blend comprising at least one repeating group comprising at least one nitrogen-containing heterocyclic ring or a tertiary or quaternary nitrogen atom. The invention further provides a chemical-mechanical polishing composition particularly useful in polishing tungsten-containing substrates.
    Type: Application
    Filed: June 16, 2004
    Publication date: December 22, 2005
    Applicant: Cabot Microelectronics Corporation
    Inventors: Robert Vacassy, Dinesh Khanna, Alexander Simpson
  • Patent number: 4822868
    Abstract: This invention is directed to novel, linear polycarbonamides derived from the condensation of 4,4'-bis[2-(4-carboxyphenyl)hexafluoroisopropyl]diphenyl ether or a derivative thereof with a primary diamine; preferably an aromatic diamine. The novel, linear polycarbonamides of the invention are useful in preparing molded and extruded articles, films and fibers having high thermal stability, resistance to soiling, excellent mechanical properties, good transparency and radiation stability. In addition, they may be processed into useful articles at lower processing temperatures than the comparable polycarbonamides of the prior art.
    Type: Grant
    Filed: November 24, 1987
    Date of Patent: April 18, 1989
    Assignee: Hoechst Celanese Corporation
    Inventors: Werner H. Mueller, Dinesh Khanna