Patents by Inventor Dinesh Nair

Dinesh Nair has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10235477
    Abstract: System and method for creating a machine vision application. A machine vision prototype comprising a plurality of machine vision steps specifying a machine vision image processing algorithm and associated parameters may be stored. The steps may be interpretable by an emulator to perform the specified image processing on an image by emulating or simulating execution of the steps on a hardware accelerator, e.g., a programmable hardware element or graphics processing unit. An emulator may emulate or simulate execution of the steps on the hardware accelerator, thereby generating image processing results, which may be displayed for validation of the emulating or simulating by a user. The prototype may be analyzed, and based on the analyzing, an estimate of resource usage or performance of the image processing algorithm for the hardware accelerator may be determined and displayed, and may be usable for target platform selection or modification of the image processing algorithm.
    Type: Grant
    Filed: July 24, 2015
    Date of Patent: March 19, 2019
    Assignee: National Instruments Corporation
    Inventors: Christophe R. J. Caltagirone, Nicolas F. Vazquez, Dinesh Nair, Bradley D. Buchanan, Jared W. Jenson, Kevin L. Schultz
  • Patent number: 8457414
    Abstract: Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image.
    Type: Grant
    Filed: December 7, 2009
    Date of Patent: June 4, 2013
    Assignees: National Instruments Corporation, Board of Regents of the University of Texas System
    Inventors: Sina Jahanbin, Alan C. Bovik, Eduardo Perez, Dinesh Nair
  • Patent number: 7960542
    Abstract: A process for the purification of an oligonucleotide synthon is provided. The process comprises subjecting an organic solution comprising an oligonucleotide synthon and lower molecular weight impurities to nanofiltration whereby the ratio of an oligonucleotide synthon to lower molecular weight impurities in the solution is increased after the nanofiltration. Preferably, the oligonucleotide synthon is a nucleoside phosphoramidite or nucleoside H-phosphonate. The nanofiltration membrane is preferably a polyimide membrane having a molecular weight cut off of 400.
    Type: Grant
    Filed: December 16, 2003
    Date of Patent: June 14, 2011
    Assignee: Avecia Biotechnology, Inc.
    Inventors: Andrew Timothy Boam, Andrew Guy Livingston, Dinesh Nair, Paul McCormac, Stephen Hargreaves
  • Patent number: 7937665
    Abstract: A system and method for automatically generating a graphical program from a prototyping environment application. By utilizing an application specialized for developing solutions to problems in a particular domain, i.e., a prototyping environment, a user may develop a solution to a problem, i.e., a prototype. The prototype may comprise a series of functions that form an algorithm or process. Once the user has developed the desired prototype, the user may request the prototyping environment to automatically, i.e., programmatically, generate a graphical program implementing the prototype, e.g., in order to run the program independently of the prototyping environment. In various embodiments, the prototyping environment may be operable to generate any of various types of graphical programs. Once the graphical program has been generated, the program may be modified as desired, e.g., in order to include features not available from the prototyping environment that generated the program.
    Type: Grant
    Filed: June 13, 2000
    Date of Patent: May 3, 2011
    Assignee: National Instruments Corporation
    Inventors: Nicolas Vazquez, Jeffrey L. Kodosky, Ram Kudukoli, Kevin L. Schultz, Dinesh Nair, Christophe Caltagirone
  • Publication number: 20110026804
    Abstract: Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image.
    Type: Application
    Filed: December 7, 2009
    Publication date: February 3, 2011
    Inventors: Sina Jahanbin, Alan C. Bovik, Eduardo Perez, Dinesh Nair
  • Patent number: 7397956
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.
    Type: Grant
    Filed: June 15, 2007
    Date of Patent: July 8, 2008
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Nicolas Vazquez, Kevin L. Schultz, Dinesh Nair
  • Patent number: 7340089
    Abstract: A geometric pattern matching method to locate instances of a template image in a target image using a plurality of models with different feature combinations. A learning phase involves learning geometric information about the template image and creating a model for each of a plurality of different respective parent features. Each model comprises a relationship tree from the respective parent feature to one or more other child features, and hence each model may have different feature combinations. In a matching phase, the method may examine a plurality of different models to determine matches in the target image being analyzed. The matching phase may select different models dynamically based on prior matching results.
    Type: Grant
    Filed: January 10, 2005
    Date of Patent: March 4, 2008
    Assignee: National Instruments Corporation
    Inventors: Dinesh Nair, Matthew S. Fisher, Satish V. Kumar, Bruce Smyth, Subramanian Ramamoorthy
  • Publication number: 20070237396
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.
    Type: Application
    Filed: June 15, 2007
    Publication date: October 11, 2007
    Inventors: Lothar Wenzel, Nicolas Vazquez, Kevin Schultz, Dinesh Nair
  • Patent number: 7233699
    Abstract: A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.
    Type: Grant
    Filed: March 18, 2002
    Date of Patent: June 19, 2007
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Nicolas Vazquez, Kevin L. Schultz, Dinesh Nair
  • Patent number: 7233700
    Abstract: A system and method for selecting a best match of a received input signal from a set of candidate signals, wherein two or more of the candidate signals are uncorrelated. In a preprocessing phase a signal transform (UST) is determined from the candidate signals. The UST converts each candidate signal to a generalized frequency domain. The UST is applied at a generalized frequency to each candidate signal to calculate corresponding generalized frequency component values (GFCVs) for each candidate signal. At runtime, the input signal of interest is received, and the UST is applied at the generalized frequency to the input signal of interest to calculate a corresponding GFCV. The best match is determined between the GFCV of the input signal of interest and the GFCVs of each of the set of candidate signals. Finally, information indicating the best match candidate signal from the set of candidate signals is output.
    Type: Grant
    Filed: April 14, 2005
    Date of Patent: June 19, 2007
    Assignee: National Instuments Corporation
    Inventors: Ram Rajagopal, Lothar Wenzel, Dinesh Nair, Darren Schmidt
  • Patent number: 7171048
    Abstract: System and method for determining the presence of an object of interest in a target data set. Portions of a target data set may be located that match an object of interest, e.g., in a template data set, with respect to various information, e.g., edge or boundary information. The invention includes improved methods for mapping point sets or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target data set despite of or using various types of topological transformations of the object of interest in the target data set. One or more mapping operators are determined based on template curves and/or example target curves. Pattern matching is performed on one or more target data sets using the mapping operator(s) to generate pattern matching results, and the pattern matching results output.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: January 30, 2007
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Satish V. Kumar, Darren R. Schmidt, Kevin M. Crotty, Matthew S. Fisher, Dinesh Nair
  • Patent number: 7158677
    Abstract: System and method for determining the presence of an object of interest from a template image in an acquired target image, despite of or using various types of affine transformations of the object of interest in the target image. A template image discrete curve is determined from the template image corresponding to the object of interest, and a template curve canonical transform calculated based on the curve. The canonical transform is applied to the template curve to generate a mapped template curve. The target image is received, a target image discrete curve determined, and a target curve canonical transform computed based on the target curve canonical transform. The target canonical transform is applied to the target curve to generate a mapped target curve. Geometric pattern matching is performed using the mapped template and target image discrete curves to generate pattern matching results, and the pattern matching results are output.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: January 2, 2007
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Dinesh Nair
  • Patent number: 7139432
    Abstract: System and method for determining the presence of an object of interest in a target image. Regions of a target image may be located that match an object of interest, e.g., in a template image, with respect to various information, e.g., luminance, color and/or other types of boundary information. The invention includes improved methods for mapping point sequences (e.g., pixel sequences) or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target image despite of or using various types of topological transformations of the object of interest in the target image. One or more mapping operators are determined based on template curves and/or example target curves. Pattern matching is performed on one or more target images using the mapping operator(s) to generate pattern matching results, and the pattern matching results output.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: November 21, 2006
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Satish V. Kumar, Darren R. Schmidt, Kevin M. Crotty, Matthew S. Fisher, Dinesh Nair
  • Patent number: 7136505
    Abstract: System and method for determining a mapping operator for use in a pattern matching application, where the mapping operator enhances differences between respective objects of interest and background objects, e.g., objects not of interest. First and second information is received regarding an object of interest and objects that may appear with the object of interest in an acquired target data set, respectively. The mapping operator is determined using the first information and the second information by determining a template discrete curve characterizing the object of interest, determining one or more target discrete curves characterizing the background objects, and generating a mapping operator that enhances differences between the mapped template discrete curve and the mapped target discrete curves. The operator is stored in a memory and is operable to be used in a pattern matching application to locate instances of the object of interest in acquired target data sets or images.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: November 14, 2006
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Satish V. Kumar, Darren R. Schmidt, Kevin M. Crotty, Matthew S. Fisher, Dinesh Nair
  • Patent number: 7133538
    Abstract: System and method for determining the presence of an object of interest in a target image. Regions of a target image may be located that match an object of interest, e.g., in a template image, with respect to various information, e.g., luminance, color and/or other types of boundary information. The invention includes improved methods for mapping point sets or curves to new point sets or curves for curve matching. The method determines the presence of an object of interest in a target image despite of or using various types of topological transformations of the object of interest in the target image. A plurality of mapping operators are determined based on template curves and/or example target curves, e.g., background object curves. Pattern matching is performed on one or more target images using the mapping operators to generate pattern matching results, and the pattern matching results output.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: November 7, 2006
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Satish V. Kumar, Darren R. Schmidt, Kevin M. Crotty, Matthew S. Fisher, Dinesh Nair
  • Patent number: 7127100
    Abstract: A system and method for analyzing an image. The system may comprise a computer which includes a CPU and a memory medium which is operable to store one or more programs executable by the CPU to perform the method. The method may include: 1) receiving data describing an n-dimensional image, wherein the image is defined in a bounded n-dimensional space, wherein the image is embedded in an m-dimensional real space via an embedding function x( ), and wherein m>n; 2) determining a diffeomorphism (f,g) of the n-dimensional space; 3) computing the inverse transform (f?1,g?1) of the determined diffeomorphism (f,g); 4) selecting a plurality of points in the n-dimensional space; 5) mapping the plurality of points onto the image using x(f?1,g?1) thereby generating a mapped plurality of points on the image; and 6) analyzing the mapped plurality of points to determine characteristics of the image.
    Type: Grant
    Filed: June 25, 2001
    Date of Patent: October 24, 2006
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Dinesh Nair, Ram Rajagopal
  • Patent number: 7120301
    Abstract: System and method for re-sampling discrete curves, thereby efficiently characterizing point sets or curves in a space. The method may also provide improved means for mapping point sets or curves to new point sets or curves for curve matching. A weight vector or function is determined based on a plurality of discrete curves, e.g., from one or more template data sets or images. The weight function enhances differences between weighted discrete curves. A set of orthonormal polynomials is determined based on the computed weight function, where the set of orthonormal polynomials comprises a set of orthogonal eigenfunctions of a Sturm-Liouville differential equation. Values for a plurality of zeros for one of the set of orthonormal polynomials is determined that comprise resampling points for the plurality of discrete curves. Each of the plurality of discrete curves is resampled based on the determined values of the plurality of zeros.
    Type: Grant
    Filed: October 3, 2002
    Date of Patent: October 10, 2006
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Satish V. Kumar, Darren R. Schmidt, Kevin M. Crotty, Matthew S. Fisher, Dinesh Nair
  • Publication number: 20060135760
    Abstract: A process for the purification of an oligonucleotide synthon is provided. The process comprises subjecting an organic solution comprising an oligonucleotide synthon and lower molecular weight impurities to nanofiltration whereby the ratio of an oligonucleotide synthon to lower molecular weight impurities in the solution is increased after the nanofiltration. Preferably, the oligonucleotide synthon is a nucleoside phosphoramidite or nucleoside H-phosphonate. The nanofiltration membrane is preferably a polyimide membrane having a molecular weight cut off of 400.
    Type: Application
    Filed: December 16, 2003
    Publication date: June 22, 2006
    Inventors: Andrew Boam, Andrew Livingston, Dinesh Nair, Paul McCormac, Stephen Hargreaves
  • Patent number: 7046842
    Abstract: A system and method for measuring the similarity of multiple-color images and for locating regions of a target image having color information that matches, at least to a degree, the color information of a template image. A color characterization method operates to characterize the colors of an image and to measure the similarity between multiple-color images. For each image pixel, the method determines a color category or bin for the respective pixel based on HSI values of the respective pixel, wherein the color category is one of a plurality of possible color categories in HSI color space. In various embodiments, the weight of the pixel may be fractionally distributed across a plurality of color categories, e.g., as determined by applying fuzzy pixel classification with a fuzzy membership function. The percentage of pixels assigned to each category is then determined. The percentage of pixels in each color category is then used as a color feature vector to represent the color information of the color image.
    Type: Grant
    Filed: December 13, 2000
    Date of Patent: May 16, 2006
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair, Darren Schmidt
  • Patent number: 7039229
    Abstract: A system and method for locating regions in a target image matching a template image with respect to color and pattern information. The template image is characterized with regard to pattern and color. A first-pass search is made using color information from the color characterization of the template image to find color match candidate locations preferably via a hill-climbing technique. For each color match candidate location, a luminance pattern matching search is performed, optionally using a hill-climbing technique, on a region proximal to the location, producing final match regions. For each final match region a hue plane pattern match score may be calculated using pixel samples from the interior of each pattern. A final color match score may be calculated for each final match region. A final score is calculated from luminance pattern match, color match, and possibly hue pattern match, scores, and the scores and sum output.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: May 2, 2006
    Assignee: National Instruments Corporation
    Inventors: Siming Lin, Dinesh Nair, Darren R. Schmidt