Patents by Inventor DINESH V. PHATAK

DINESH V. PHATAK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230017658
    Abstract: A crop residue monitoring system may include a harvester, a camera to capture an image of crop residue generated by the harvester, an analytical unit to derive a value for a crop residue parameter of the crop residue based upon an optical analysis of the image and a control unit to adjust a subsequent field operation based upon the value of the crop residue parameter.
    Type: Application
    Filed: September 15, 2022
    Publication date: January 19, 2023
    Inventors: Nathan R. Vandike, Brian J. Gilmore, Dinesh V. Phatak, David L. Wells, Mahesh S. Bothe
  • Patent number: 11510364
    Abstract: A crop residue monitoring system may include a harvester, a camera to capture an image of crop residue generated by the harvester, an analytical unit to derive a value for a crop residue parameter of the crop residue based upon an optical analysis of the image and a control unit to adjust a subsequent field operation based upon the value of the crop residue parameter.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: November 29, 2022
    Assignee: DEERE & COMPANY
    Inventors: Nathan R. Vandike, Brian J. Gilmore, Dinesh V. Phatak, David L. Wells, Mahesh S. Bothe
  • Publication number: 20210015039
    Abstract: A crop residue monitoring system may include a harvester, a camera to capture an image of crop residue generated by the harvester, an analytical unit to derive a value for a crop residue parameter of the crop residue based upon an optical analysis of the image and a control unit to adjust a subsequent field operation based upon the value of the crop residue parameter.
    Type: Application
    Filed: July 19, 2019
    Publication date: January 21, 2021
    Inventors: Nathan R. Vandike, Brian J. Gilmore, Dinesh V. Phatak, David L. Wells, Mahesh S. Bothe
  • Patent number: 10459023
    Abstract: A system and method for determining electrical stress in an electrical power system of a work vehicle. The work vehicle includes a plurality of electrical power circuits, wherein each of the electrical power circuits is operatively connected to one of a plurality of electrical devices, such as a motor. One or more controllers are each operatively connected to one or more of the plurality of devices to determine a change to an operating characteristic of the connected device. In one embodiment, a current sensor is coupled to each of the devices to sense current drawn by the device over a period of time. Each of the controllers is configured to compare the value of the sensed current to a predetermined value of current to determine a rise in temperature of the device. The determined rise in temperature is used to determine fault conditions occurring in the devices and associated wiring harnesses.
    Type: Grant
    Filed: April 20, 2017
    Date of Patent: October 29, 2019
    Assignee: DEERE & COMPANY
    Inventors: Atul Kolhe, Amandeep Singh Jassal, Dinesh V. Phatak
  • Publication number: 20180306850
    Abstract: A system and method for determining electrical stress in an electrical power system of a work vehicle. The work vehicle includes a plurality of electrical power circuits, wherein each of the electrical power circuits is operatively connected to one of a plurality of electrical devices, such as a motor. One or more controllers are each operatively connected to one or more of the plurality of devices to determine a change to an operating characteristic of the connected device. In one embodiment, a current sensor is coupled to each of the devices to sense current drawn by the device over a period of time. Each of the controllers is configured to compare the value of the sensed current to a predetermined value of current to determine a rise in temperature of the device. The determined rise in temperature is used to determine fault conditions occurring in the devices and associated wiring harnesses.
    Type: Application
    Filed: April 20, 2017
    Publication date: October 25, 2018
    Inventors: ATUL KOLHE, AMANDEEP SINGH JASSAL, DINESH V. PHATAK