Abstract: A detection system for a multilayer film is provided. The detection system for a multilayer film includes a light source device, a first image capture device, a second image capture device and an image processing device. The light source device projects a pair of parallel incident light to a transparent multilayer film obliquely. The pair of parallel incident light is projected onto the transparent multilayer film for producing and enabling a forward scattered light and a back scattered light to be projected therefrom. The first image capture device captures the back scattered light to produce a first image. The second image capture device captures the forward scattered light to produce a second image. The image processing device is coupled to the first image capture device and the second image capture device. The image processing device is used to compares and detect the differences between the second image and the first image.

Abstract: A detection system for a multilayer film is provided. The detection system for a multilayer film includes a light source device, a first image capture device, a second image capture device and an image processing device. The light source device projects a pair of parallel incident light to a transparent multilayer film obliquely. The pair of parallel incident light is projected onto the transparent multilayer film for producing and enabling a forward scattered light and a back scattered light to be projected therefrom. The first image capture device captures the back scattered light to produce a first image. The second image capture device captures the forward scattered light to produce a second image. The image processing device is coupled to the first image capture device and the second image capture device. The image processing device is used to compares and detect the differences between the second image and the first image.

Abstract: An embodiment of the invention provides an apparatus for measuring a conductive pattern on a substrate, which includes a first electro-optical modulator surrounding at least one first detecting roller; transmission rollers for transferring the substrate and allowing direct contact of the substrate and the first electro-optical modulator; a voltage supplier for providing a bias between the first electro-optical modulator and the substrate; and a first image detecting system for receiving a first detecting light reflected from a first surface of the substrate.

Abstract: The disclosure relates to an electro optical sensor, which comprises a light source generating device, an electro optical modulator, a supporting module, and an image capturing module. The light source generating device emits a light beam. After the electro optical modulator modulates the light beam, the modulated light beam emits onto a subject. The supporting module includes a transparent substrate, supporting the subject and allowing the modulated light beam to incidentally emit into the transparent substrate. The image capturing module converts the light beam reflected from the supporting module into a video signal.

Abstract: An embodiment of the invention provides an apparatus for measuring a conductive pattern on a substrate, which includes: a first electro-optical modulator surrounding at least one first detecting roller; transmission rollers for transferring the substrate and allowing direct contact of the substrate and the first electro-optical modulator; a voltage supplier for providing a bias between the first electro-optical modulator and the substrate; and a first image detecting system for receiving a first detecting light reflected from a first surface of the substrate.

Abstract: A differential interference contrast microscope (DIC microscope) suitable for inspecting a specimen inside a measurement area comprises a light source, a beam splitter, a first and second polarizer, a first and second DIC prism, a wave plate, and an image sensor, wherein the beam splitter reflects the beam generated from the light source to the measurement area, and the beam be reflected from the measurement area passes through the beam splitter to the image sensor. The first polarizer is located between the light source and the beam splitter, and the second polarizer is located between the beam splitter and the image sensor. The first DIC prism, the wave-plate and the second DIC prism are located between the beam splitter and the measurement area in order. The included angle between the principal axis of the first DIC prism and the principal axis of the second DIC prism is 90 degree.

Abstract: An imaging system comprises a light source module configured to generate a combination beam, a controller configured to control the light source module, an image-capturing module configured to capture the reflected beam by a sample. The light source module comprises a plurality of light-emitting devices configured to emit lights of different wavelengths, and the controller is configured to drive the light-emitting devices to emit the lights to form the combination beam consisting of at least two lights of different wavelengths. An imaging method comprises the steps of forming a first combination beam consisting essentially of at least two lights of different wavelengths, capturing the reflected first combination beam by a sample to have a first image, forming a second combination beam consisting of at least two lights of different wavelengths and capturing the reflected second combination beam by the sample to have a second image.

Abstract: An imaging system comprises a light source module configured to generate a combination beam, a controller configured to control the light source module, an image-capturing module configured to capture the reflected beam by a sample. The light source module comprises a plurality of light-emitting devices configured to emit lights of different wavelengths, and the controller is configured to drive the light-emitting devices to emit the lights to form the combination beam consisting of at least two lights of different wavelengths. An imaging method comprises the steps of forming a first combination beam consisting essentially of at least two lights of different wavelengths, capturing the reflected first combination beam by a sample to have a first image, forming a second combination beam consisting of at least two lights of different wavelengths and capturing the reflected second combination beam by the sample to have a second image.

Abstract: The present invention discloses a biochip detection system for detecting a biochip labeled with multiple fluorophores. The biochip detection system comprises a broadband light source for generating a light beam, a stand for supporting the biochip, a light integrator positioned between the broadband light source and the biochip, a lens set for adjusting the cross-sectional area of the light beam, a first filter module positioned on the optical path of the light beam, a detector, e.g., CCD camera, photodiode array, for detecting a fluorescence beam emitted from the biochip, and a second filter module positioned on the optical path of the fluorescence beam. The light integrator can be a light tunnel, a lens array or a holographic diffuser for uniforming the intensity distribution of the light beam and changing the cross-sectional shape of the light beam into a rectangle.