Abstract: A package structure includes: a substrate; a chip arranged on a part of a surface of the substrate; a metal thermal conducting layer arranged on a top surface of the chip; a capacitive structure arranged on another part of the surface of the substrate and arranged to be independent from the chip; and a cover including a first cover layer and a second cover layer connected to the first cover layer. A first opening is defined to extend through the first and the second cover layers. The second cover layer is arranged on a bottom of the first cover layer and perpendicular to the first cover layer. The first cover layer is arranged on the capacitive structure. The chip is received in the first opening. The second cover layer is arranged between the capacitive structure and the chip, and is fixed to the substrate.

Abstract: A package structure includes: a substrate; a chip arranged on a part of a surface of the substrate; a metal thermal conducting layer arranged on a top surface of the chip; a capacitive structure arranged on another part of the surface of the substrate and arranged to be independent from the chip; and a cover including a first cover layer and a second cover layer connected to the first cover layer. A first opening is defined to extend through the first and the second cover layers. The second cover layer is arranged on a bottom of the first cover layer and perpendicular to the first cover layer. The first cover layer is arranged on the capacitive structure. The chip is received in the first opening. The second cover layer is arranged between the capacitive structure and the chip, and is fixed to the substrate.

Abstract: A method of fabricating laminate assemblies determines the ideal weight (W) of underfill to be dispensed, based on the size of the semiconductor die and the gap between the die and the laminate substrate. Underfill is dispensed in a single step in an amount between 1.1W and 1.3W to form fillets that cover at least 15% of the height of the semiconductor die on all four sides of the die. The amount of underfill ensures that the fillet coverage imbalance is 30% or less for each of the pairs of opposing sides of the die, thereby improving solder joint reliability.

Abstract: A method of fabricating laminate assemblies determines the ideal weight (W) of underfill to be dispensed, based on the size of the semiconductor die and the gap between the die and the laminate substrate. Underfill is dispensed in a single step in an amount between 1.1W and 1.3W to form fillets that cover at least 15% of the height of the semiconductor die on all four sides of the die. The amount of underfill ensures that the fillet coverage imbalance is 30% or less for each of the pairs of opposing sides of the die, thereby improving solder joint reliability.

Abstract: A method of manufacturing a flip-chip semiconductor device by attaching a semiconductor die to a substrate using solder comprises the steps of applying a no-clean flux to the semiconductor die and the substrate; heating the solder and the flux in a furnace to bond the semiconductor die to the substrate; and underfilling between the semiconductor die and the substrate. While the solder and flux is being heated, a reducing atmosphere in the furnace is being measured to determine the moisture content. When the moisture content exceeds a threshold amount, a signal will be provided. A reflow furnace for practicing the method is also disclosed.