Patents by Inventor Dipakkumar S. Patel

Dipakkumar S. Patel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9403259
    Abstract: A method is provided for removing material from a workpiece using a material removal device and a measurement device. The method includes measuring a first dimension of the workpiece at a location with the measurement device. A jet of water is directed from the material removal device to the location to remove material from the workpiece at the location. A second dimension of the workpiece at the location is measured with the measurement device. The first dimension is compared to the second dimension to determine a measured thickness of the material removed from the workpiece at the location.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: August 2, 2016
    Assignee: United Technologies Corporation
    Inventors: John E. Markowski, Anthony G. Ruglio, Dipakkumar S. Patel, Keith E. Lockyer
  • Publication number: 20140273747
    Abstract: A method is provided for removing material from a workpiece using a material removal device and a measurement device. The method includes measuring a first dimension of the workpiece at a location with the measurement device. A jet of water is directed from the material removal device to the location to remove material from the workpiece at the location. A second dimension of the workpiece at the location is measured with the measurement device. The first dimension is compared to the second dimension to determine a measured thickness of the material removed from the workpiece at the location.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 18, 2014
    Applicant: United Technologies Corporation
    Inventors: John E. Markowski, Anthony G. Ruglio, Dipakkumar S. Patel, Keith E. Lockyer
  • Patent number: 7824730
    Abstract: A method of measuring a coating deposits a layer of coating on an object. A laser beam is projected on the layer of the coating. A reflection of the project laser beam is received by the laser sensor. From this information, the thickness of the layer of the coating on the object is determined. A value related to the thickness of the layer of the coating may then be compared to a desired value.
    Type: Grant
    Filed: August 31, 2007
    Date of Patent: November 2, 2010
    Assignee: United Technologies Corporation
    Inventors: Anthony G. Ruglio, Keith E. Lockyer, John E. Markowski, Dipakkumar S. Patel
  • Publication number: 20090061075
    Abstract: A method of measuring a coating deposits a layer of coating on an object. A laser beam is projected on the layer of the coating. A reflection of the project laser beam is received by the laser sensor. From this information, the thickness of the layer of the coating on the object is determined. A value related to the thickness of the layer of the coating may then be compared to a desired value.
    Type: Application
    Filed: August 31, 2007
    Publication date: March 5, 2009
    Inventors: Anthony G. Ruglio, Keith E. Lockyer, John E. Markowski, Dipakkumar S. Patel