Patents by Inventor DireenTech, Inc.

DireenTech, Inc. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130187814
    Abstract: A scanning measurement apparatus and method comprising a device under test for receiving or transmitting a signal, a measurement probe, a robot for moving the device or the probe relative to one another to scan continuously over a two-dimensional planar, cylindrical or spherical surface in a three-dimensional space, and a controller for obtaining measurement samples at generalized grid points on the two-dimensional surface computing characteristic coefficients from the measured values, wherein the characteristic coefficients are recovered using a conjugate gradient method, using in part an unequally spaced fast Fourier transform or using a conjugate gradient method and an unequally spaced fast Fourier transform.
    Type: Application
    Filed: January 4, 2013
    Publication date: July 25, 2013
    Applicant: DireenTech, Inc.
    Inventor: DireenTech, Inc.