Abstract: An arrangement for optical emission spectrometry with a spectrochemical source, which during operation emits non-directed radiation, and with a spectrometer having at least one entry aperture arranged at a side next to the source, at least one dispersive element and at least one detector, which are arranged such that during operation part of the radiation emitted in the direction of the entry aperture from the source enters the spectrometer through the entry aperture, from the entry aperture falls indirectly or directly on the dispersive element(s), is split up according to wavelengths and is registered by the at least one detector. A mirror may be arranged at a side of the source opposed to the entry aperture at a distance from the source to reflect at least one part of the radiation, not emitted in the direction of the entry aperture from the source, in the direction of the entry aperture.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Abstract: A Plasma Emission Transfer and Modification Device allowing for alteration of the plasma shape or characteristics for e.g. optimized viewing of relevant Plasma zones or improved coupling of a Plasma to the subsequent spectrometer optics, at the same time avoiding negative effects (e.g. heat transfer from the spectro-chemical source into subsequent system components) is described.

Abstract: A Plasma Emission Transfer and Modification Device allowing for alteration of the plasma shape or characteristics for e.g. optimized viewing of relevant Plasma zones or improved coupling of a Plasma to the subsequent spectrometer optics, at the same time avoiding negative effects (e.g. heat transfer from the spectro-chemical source into subsequent system components) is described.

Abstract: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, an ion optics to separate ions out of a plasma beam, a Mattauch Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before the entrance slit, and a solid state multi channel detector substantially separated from ground potential and separated from the potential of the magnet is introduced.

Abstract: An apparatus for detecting particles, comprising a plurality of electrically conductive structures disposed on a support element. The structures are electrically insulated from one another and each structure can be electrically connected to an electronic read-out device. The structures receive a beam of particles in a direction forming an angle of incidence with the support element. A trough is disposed between each two successive structures as viewed in the beam direction. And at least partial overlap exists between each two successive structures. The apparatus can be disposed in the focal plane of a mass spectrometer.

Abstract: An ICP mass spectrometer comprising an ICP ion source, a mass analyzer having a magnetic sector field, a detector, an extraction element in the form of an ion funnel for transferring the generated ions into the mass analyzer and arranged between the ICP ion source and the mass analyzer, and a transport optics arranged between the ion funnel and the mass analyzer.

Abstract: The invention relates to an apparatus for detecting particles, comprising a support element (1) and a plurality of electrically conductive structures (2) arranged on the support element (1), wherein the structures (2) are electrically insulated from each other and wherein each of the structures (2) can be electrically connected to an electronic read-out device, wherein an angle of incidence (?) is given between a beam direction of the particles and the support element (1), wherein a trough (3) is in each case arranged between a first structure (2) and a structure (2) adjacent to the first structure in the beam direction, wherein there is an at least partial overlap of the first structure (2) and the adjacent structure (2) in the beam direction.

Abstract: An ICP mass spectrometer comprising an ICP ion source, a mass analyzer having a magnetic sector field, a detector, an extraction element in the form of an ion funnel for transferring the generated ions into the mass analyzer and arranged between the ICP ion source and the mass analyzer, and a transport optics arranged between the ion funnel and the mass analyzer.