Patents by Inventor Dirk Beque

Dirk Beque has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9805481
    Abstract: Reconstructing under-sampled PCT data includes obtaining under-sampled scan data of a subject-under-test, the object scan performed on a phase contrast computed tomography (PCT) system, performing a regularized Fourier analysis on the under-sampled scan data, correcting for one or more PCT system contributions to the under-sampled scan data by dividing the computed Fourier coefficients by Fourier coefficients representative of the one or more PCT system contributions, obtaining at least one of an absorption sinogram, a differential phase sinogram, and a dark field sinogram from the corrected Fourier coefficients, and performing tomographic reconstruction on the obtained absorption sinogram, the obtained differential phase sinogram, and the obtained dark field sinogram. A system and non-transitory computer readable medium are also disclosed.
    Type: Grant
    Filed: January 22, 2016
    Date of Patent: October 31, 2017
    Assignee: General Electric Company
    Inventors: Jonathan Immanuel Sperl, Dirk Beque
  • Patent number: 9014333
    Abstract: An image reconstruction method for differential phase contrast imaging includes receiving data corresponding to a signal produced by an X-ray detector and corresponding to X-rays that passed through a subject and a grating system to reach the X-ray detector. The method also includes performing a fringe analysis on the received data. The fringe analysis includes a non-integer fringe fraction correction utilizing one or more adapted basis functions in the Fourier domain to determine one or more Fourier coefficients. A differential phase image of the subject is generated by utilizing the one or more Fourier coefficients.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: April 21, 2015
    Assignee: General Electric Company
    Inventors: Jonathan Immanuel Sperl, Dirk Beque
  • Publication number: 20140185757
    Abstract: An image reconstruction method for differential phase contrast imaging includes receiving data corresponding to a signal produced by an X-ray detector and corresponding to X-rays that passed through a subject and a grating system to reach the X-ray detector. The method also includes performing a fringe analysis on the received data. The fringe analysis includes a non-integer fringe fraction correction utilizing one or more adapted basis functions in the Fourier domain to determine one or more Fourier coefficients. A differential phase image of the subject is generated by utilizing the one or more Fourier coefficients.
    Type: Application
    Filed: December 31, 2012
    Publication date: July 3, 2014
    Applicant: General Electric Company
    Inventors: Jonathan Immanuel Sperl, Dirk Beque
  • Publication number: 20080123803
    Abstract: A CT imaging system includes a rotatable gantry having an opening to receive an object to be scanned. A plurality of x-ray emission sources are attached to the rotatable gantry, each x-ray emission source configured to emit x-rays in a conebeam toward the object. The CT imaging system also includes a plurality of x-ray detector arrays attached to the gantry and positioned to receive x-rays passing through the object. At least one x-ray detector array of the plurality of x-ray detector arrays is configured to receive x-rays from more than one x-ray emission source.
    Type: Application
    Filed: November 24, 2006
    Publication date: May 29, 2008
    Inventors: Bruno K.B. De Man, Colin R. Wilson, Bernhard Claus, Maria Iatrou, James W. LeBlanc, Dirk Beque, Samit Kumar Basu, Mark Vermilyea, Zhye Yin