Patents by Inventor Dirk Frederik De Lange

Dirk Frederik De Lange has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11010504
    Abstract: Design of lattice structures for additive manufacturing The present embodiments relate to additive manufacturing, such as three-dimensional printing. By way of introduction, the present embodiments described below include methods and systems for designing, modeling and manufacturing lattice structures. Lattice cells are modeled as parametrized representative unit cell (RUC) models providing a virtual material characterization for a lattice structure. The parametrized RUC models include phase functions for the virtual material characterization and identification of corresponding normalized material curves fit with polynomial functions for each lattice cell structure. Parametrized lattice models with underlying normalized lattice material curves provide design and simulation of true lattice material behavior for use in topology optimization.
    Type: Grant
    Filed: September 26, 2016
    Date of Patent: May 18, 2021
    Assignee: SIEMENS INDUSTRY SOFTWARE NV
    Inventors: Dirk Frederik De Lange, Hunor Erdelyi, Wim Van Paepegem, Alain Remouchamps
  • Publication number: 20190205499
    Abstract: Design of lattice structures for additive manufacturing The present embodiments relate to additive manufacturing, such as three-dimensional printing. By way of introduction, the present embodiments described below include methods and systems for designing, modeling and manufacturing lattice structures. Lattice cells are modeled as parametrized representative unit cell (RUC) models providing a virtual material characterization for a lattice structure. The parametrized RUC models include phase functions for the virtual material characterization and identification of corresponding normalized material curves fit with polynomial functions for each lattice cell structure. Parametrized lattice models with underlying normalized lattice material curves provide design and simulation of true lattice material behavior for use in topology optimization.
    Type: Application
    Filed: September 26, 2016
    Publication date: July 4, 2019
    Inventors: Dirk Frederik De Lange, Hunor Erdelyi, Wim Van Paepegem, Alain Remouchamps