Patents by Inventor DIRK RUDOLPH

DIRK RUDOLPH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250020515
    Abstract: In some examples, an array sensor temperature control system is provided. The system may include an array sensor for generating a two-dimensional image, the two-dimensional image including a plurality of pixels or cells indicative of a temperature of a monitored component; a controller for controlling a heating or cooling device to adjust the temperature of the monitored component; and an array sensor controller activated by a power source and being in communication with the array sensor and controller.
    Type: Application
    Filed: September 30, 2024
    Publication date: January 16, 2025
    Inventors: David Michael French, Christopher-James Parker, Keith Joseph Batryn, Dirk Rudolph
  • Patent number: 12146795
    Abstract: In some examples, an array sensor temperature control system is provided. The system may include an array sensor for generating a two-dimensional image, the two-dimensional image including a plurality of pixels or cells indicative of a temperature of a monitored component; a controller for controlling a heating or cooling device to adjust the temperature of the monitored component; and an array sensor controller activated by a power source and being in communication with the array sensor and controller.
    Type: Grant
    Filed: November 11, 2020
    Date of Patent: November 19, 2024
    Assignee: Lam Research Corporation
    Inventors: David Michael French, Christopher-James Parker, Keith Joseph Batryn, Dirk Rudolph
  • Patent number: 12000887
    Abstract: Various embodiments include methods and apparatuses to test production tools and related electrical components therefor including individual printed-circuit boards (PCBs). In one example, a test-plug hardware-platform includes at least one input/output (I/O) connector, and a configurable control system to provide command and operational signals through the I/O connector and collect data through the I/O connector from at least one PCB under test. A wireless-mesh network within the test-plug hardware-platform can interface wirelessly with at least the PCB under test. The at least one PCB operating within a production tool or other piece of equipment. Other methods and systems are disclosed.
    Type: Grant
    Filed: November 20, 2019
    Date of Patent: June 4, 2024
    Assignee: Lam Research Corporation
    Inventors: Christopher-James Parker, Dirk Rudolph, Mark James Garfield Hnatiuk
  • Patent number: 11853026
    Abstract: Various embodiments include methods and apparatuses to provide human safety and machine safety and operations. In one example, a distributed interlock system includes at least one master device coupled to a number of slave device. The slave devices receive signals from one or more tools and provide the signals to the master device. The master device evaluates the signals and prevents unsafe conditions prior to one or more command executions, related to the unsafe conditions, being transmitted to one or more of the slave devices. Other methods and systems are disclosed.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: December 26, 2023
    Assignee: Lam Research Corporation
    Inventors: Eric Tu, Dirk Rudolph, Ales Janhar, John Folden Stumpf, Justin Remulla
  • Publication number: 20220404208
    Abstract: In some examples, an array sensor temperature control system is provided. The system may include an array sensor for generating a two-dimensional image, the two-dimensional image including a plurality of pixels or cells indicative of a temperature of a monitored component; a controller for controlling a heating or cooling device to adjust the temperature of the monitored component; and an array sensor controller activated by a power source and being in communication with the array sensor and controller.
    Type: Application
    Filed: November 11, 2020
    Publication date: December 22, 2022
    Inventors: David Michael French, Christopher-James Parker, Keith Joseph Batryn, Dirk Rudolph
  • Publication number: 20220011364
    Abstract: Various embodiments include methods and apparatuses to test production tools and related electrical components therefor including individual printed-circuit boards (PCBs). In one example, a test-plug hardware-platform includes at least one input/output (I/O) connector, and a configurable control system to provide command and operational signals through the I/O connector and collect data through the I/O connector from at least one PCB under test. A wireless-mesh network within the test-plug hardware-platform can interface wirelessly with at least the PCB under test. The at least one PCB operating within a production tool or other piece of equipment. Other methods and systems are disclosed.
    Type: Application
    Filed: November 20, 2019
    Publication date: January 13, 2022
    Inventors: Christopher-James Parker, Dirk Rudolph, Mark James Garfield Hnatiuk
  • Publication number: 20210232115
    Abstract: Various embodiments include methods and apparatuses to provide human safety and machine safety and operations. In one example, a distributed interlock system includes at least one master device coupled to a number of slave device. The slave devices receive signals from one or more tools and provide the signals to the master device. The master device evaluates the signals and prevents unsafe conditions prior to one or more command executions, related to the unsafe conditions, being transmitted to one or more of the slave devices. Other methods and systems are disclosed.
    Type: Application
    Filed: May 6, 2019
    Publication date: July 29, 2021
    Inventors: Eric Tu, Dirk Rudolph, Ales Janhar, John Folden Stumpf, Justin Remulla
  • Patent number: 11028482
    Abstract: A method for controlling temperature of a substrate support includes receiving first and second currents corresponding to first and second heater elements, respectively, of a substrate support, receiving first and second voltages corresponding to the first and second heater elements, respectively, calculating a first resistance of the first heater element based on the first voltage and the first current, calculating a second resistance of the second heater element based on the second voltage and the second current, calculating a first temperature of a first zone of the substrate support based on the first resistance and stored data correlating resistances to temperatures, calculating a second temperature of a second zone of the substrate support based on the second resistance and the stored data, and selectively adjusting the stored data based on a comparison between a sensed temperature and at least one of the calculated first temperature and second temperature.
    Type: Grant
    Filed: April 27, 2020
    Date of Patent: June 8, 2021
    Assignee: Lam Research Corporation
    Inventors: Aaron Durbin, Ramesh Chandrasekharan, Dirk Rudolph, Thomas G. Jewell
  • Patent number: 10770263
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: September 8, 2020
    Assignee: Lam Research Corporation
    Inventor: Dirk Rudolph
  • Publication number: 20200255945
    Abstract: A method for controlling temperature of a substrate support includes receiving first and second currents corresponding to first and second heater elements, respectively, of a substrate support, receiving first and second voltages corresponding to the first and second heater elements, respectively, calculating a first resistance of the first heater element based on the first voltage and the first current, calculating a second resistance of the second heater element based on the second voltage and the second current, calculating a first temperature of a first zone of the substrate support based on the first resistance and stored data correlating resistances to temperatures, calculating a second temperature of a second zone of the substrate support based on the second resistance and the stored data, and selectively adjusting the stored data based on a comparison between a sensed temperature and at least one of the calculated first temperature and second temperature.
    Type: Application
    Filed: April 27, 2020
    Publication date: August 13, 2020
    Inventors: Aaron DURBIN, Ramesh Chandrasekharan, Dirk Rudolph, Thomas G. Jewell
  • Patent number: 10633742
    Abstract: A controller for a substrate processing system includes a resistance calculation module configured to receive a first current and a second current corresponding to a first heater element and a second heater element, respectively, of a substrate support, receive a first voltage and a second voltage corresponding to the first heater element and the second heater element, respectively, calculate a first resistance of the first heater element based on the first voltage and the first current, and calculate a second resistance of the second heater element based on the second voltage and the second current. A temperature control module is configured to separately control power provided to the first heater element and the second heater element based on the first resistance and the second resistance, respectively, and respective relationships between the first and second resistances and first and second temperatures of the substrate support.
    Type: Grant
    Filed: May 7, 2018
    Date of Patent: April 28, 2020
    Assignee: LAM RESEARCH FOUNDATION
    Inventors: Aaron Durbin, Ramesh Chandrasekharan, Dirk Rudolph, Thomas G. Jewell
  • Publication number: 20200098542
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Application
    Filed: October 7, 2019
    Publication date: March 26, 2020
    Inventor: Dirk Rudolph
  • Publication number: 20190338422
    Abstract: A controller for a substrate processing system includes a resistance calculation module configured to receive a first current and a second current corresponding to a first heater element and a second heater element, respectively, of a substrate support, receive a first voltage and a second voltage corresponding to the first heater element and the second heater element, respectively, calculate a first resistance of the first heater element based on the first voltage and the first current, and calculate a second resistance of the second heater element based on the second voltage and the second current. A temperature control module is configured to separately control power provided to the first heater element and the second heater element based on the first resistance and the second resistance, respectively, and respective relationships between the first and second resistances and first and second temperatures of the substrate support.
    Type: Application
    Filed: May 7, 2018
    Publication date: November 7, 2019
    Inventors: Aaron DURBIN, Ramesh CHANDRASEKHARAN, Dirk RUDOLPH, Thomas G. JEWELL
  • Patent number: 10453651
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: October 22, 2019
    Assignee: Lam Research Corporation
    Inventor: Dirk Rudolph
  • Patent number: 10294560
    Abstract: A throttle valve includes a throttle body including a housing having an inner surface. The throttle body includes first and second stop surfaces arranged on the inner surface. A throttle plate is rotatable inside the housing of the throttle body about a shaft between closed and open positions. A first projection is located on a first surface of the throttle plate adjacent to a radially outer end of the throttle plate. A second projection is located on a second surface of the throttle plate adjacent to a radially outer end of the throttle plate. The second surface is opposite the first surface. The first and second projections extend outwardly from the throttle plate in opposite directions and in corresponding directions of rotational movement of the throttle plate during closing to bias against the second stop surface when the throttle valve is closed.
    Type: Grant
    Filed: September 3, 2013
    Date of Patent: May 21, 2019
    Assignee: LAM RESEARCH CORPORATION
    Inventors: Dirk Rudolph, Antonio Xavier
  • Patent number: 10210977
    Abstract: A power converter module is connected to an electrical power supply and is configured to generate a first voltage and a second voltage for controlling operation of a valve, where the valve includes a solenoid for affecting opening and closing of the valve. The first voltage is a boost voltage for accelerating opening of the valve. The second voltage is a holding voltage for maintaining the valve in an open state. A boost control module is configured to control supply of the first voltage to the solenoid of the valve in accordance with a first state of an opening boost control signal when a valve control signal directs opening of the valve, and is configured to control supply of the second voltage to the solenoid of the valve in accordance with a second state of the opening boost control signal when the valve control signal directs opening of the valve.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: February 19, 2019
    Assignee: Lam Research Corporation
    Inventors: Devon Pelkey, Dirk Rudolph
  • Publication number: 20180247792
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Application
    Filed: April 27, 2018
    Publication date: August 30, 2018
    Inventor: Dirk Rudolph
  • Patent number: 9960009
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Grant
    Filed: July 17, 2015
    Date of Patent: May 1, 2018
    Assignee: Lam Research Corporation
    Inventor: Dirk Rudolph
  • Publication number: 20170352461
    Abstract: A power converter module is connected to an electrical power supply and is configured to generate a first voltage and a second voltage for controlling operation of a valve, where the valve includes a solenoid for affecting opening and closing of the valve. The first voltage is a boost voltage for accelerating opening of the valve. The second voltage is a holding voltage for maintaining the valve in an open state. A boost control module is configured to control supply of the first voltage to the solenoid of the valve in accordance with a first state of an opening boost control signal when a valve control signal directs opening of the valve, and is configured to control supply of the second voltage to the solenoid of the valve in accordance with a second state of the opening boost control signal when the valve control signal directs opening of the valve.
    Type: Application
    Filed: June 3, 2016
    Publication date: December 7, 2017
    Inventors: Devon Pelkey, Dirk Rudolph
  • Publication number: 20170018401
    Abstract: Systems and methods for determining a fault in a gas heater channel are described. One of the methods includes receiving measured parameters associated with a plurality of heater elements of the gas heater channel. The gas heater channel transfers one or more gases from a gas supply to a plasma chamber. The method further includes calculating a measured parallel resistance of the plurality of heater elements from the measured parameters, comparing the measured parallel resistance to an ideal parallel resistance of the heater elements of the gas heater channel, and determining based on the comparison that a portion of the gas heater channel is inoperational. The method includes selecting an identity of one of the heater elements from a correspondence between a plurality of identities of the heater elements and the measured parallel resistance.
    Type: Application
    Filed: July 17, 2015
    Publication date: January 19, 2017
    Inventor: Dirk Rudolph