Patents by Inventor Dirk van Dyck

Dirk van Dyck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11543501
    Abstract: The invention pertains to a method for subtracting background light from an exposure value of a first pixel in an imaging array, said first pixel receiving a reflection of a spot from a scenery illuminated by a periodically pulsed pattern of spots, said periodically pulsed pattern comprising in alternation an illuminated phase and a non-illuminated phase, the method comprising: accumulating in said first pixel a charge in proportion to a first quantity of incident light, received in said first pixel while detecting said spot during a predetermined amount of time; and decreasing said charge in proportion to a second quantity of incident light received during said predetermined amount of time in absence of said spot. The invention also pertains to a pixel and an imaging array.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: January 3, 2023
    Assignee: XENOMATIX NV
    Inventors: Dirk Van Dyck, Rik Paesen
  • Patent number: 11513199
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representating a second amount of light reflected during a second time window. The system projects and detects for at least two consecutive sequences of pulses, each being operated with a different duration of said first time window and said second time window.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: November 29, 2022
    Assignee: XENOMATIX NV
    Inventors: Dirk Van Dyck, Johan Van Den Bossche
  • Publication number: 20220326358
    Abstract: A method and device for determining distances to a scene determines a laser light pulse width PW that is smaller than a maximum time of flight TOFmax corresponding to a maximum distance Dmax by using a pulse width reduction factor N such that PW=(TOFmax?TDL)/N wherein TDL is a predefined delay window, determines a pulse frequency FP such that FP?1/((N+1)×PW+TDL), illuminates the scene with an illuminating pattern comprising a plurality of spatially separated pulsed laser beams having the determined pulse width and frequency, performs the detection as function of time during a detection time period TD divided in M=?×(N+1) consecutive detection time windows, with ??1, such that TD=M×(PW/?), identifies in what detection time windows reflected laser light is detected, and calculates a distance to the scene based on this identification.
    Type: Application
    Filed: September 23, 2020
    Publication date: October 13, 2022
    Applicant: XENOMATIX NV
    Inventors: Rik PAESEN, Dirk VAN DYCK, Stijn VANDEWIELE, Nick VAN DEN BROECK
  • Patent number: 11029391
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representing a second amount of light reflected during a second time window. The solid-state radiation source emits substantially monochromatic light having a wavelength spread of less than ±20 nm and the detector is equipped with a corresponding narrow bandpass filter.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: June 8, 2021
    Assignee: XENOMATIX NV
    Inventors: Rik Paesen, Dirk Van Dyck
  • Patent number: 10921454
    Abstract: A system for determining a distance to an object including a solid-state light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector having a plurality of picture elements, for detecting light representing the pattern of discrete spots as reflected by the object in synchronization with the pulses; and a processor to calculate the distance to the object as a function of exposure values generated by the picture elements. The picture elements are configured to generate exposure values by accumulating, for each pulse of the sequence, a first amount of electrical charge representative of a first amount of light reflected by the object during a first time window and a second electrical charge representative of a second amount of light reflected by the object during a second time window, the second time window occurring after the first time window.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: February 16, 2021
    Assignee: XENOMATIX NV
    Inventors: Dirk Van Dyck, Johan Van Den Bossche
  • Patent number: 10852400
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate the exposure values by accumulating a first amount of electrical charge representative of a first amount of light reflected during a first time window and a second electrical charge representative of a second amount of light reflected during a second time window, the second time window occurring after the first time window. The picture elements comprise at least two sets of charge storage wells, each configured as a cascade.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: December 1, 2020
    Assignee: XenomatiX NV
    Inventors: Dirk Van Dyck, Johan Van Den Bossche
  • Patent number: 10768301
    Abstract: A system for determining a distance to an object including a solid-state light source, a detector having a plurality of picture elements, and a processor to calculate the distance to the object as a function of exposure values generated by picture elements in response to the detected light. The picture elements generate exposure values by accumulating a first amount of electrical charge representative of reflected light during a first time window and a second electrical charge representative of reflected light during a second predetermined time window. The detecting occurs at the two charge storage wells; and the system interleaves the predetermined time windows with time windows during which the picture elements are used in a function different from the detecting and/or the picture elements include at least one further charge storage well to perform the function different from the detecting of the first and second amount of light.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: September 8, 2020
    Assignee: XENOMATIX NV
    Inventors: Filip Geuens, Dirk Van Dyck, Rik Paesen, Johan Van Den Bossche
  • Patent number: 10764518
    Abstract: The present invention pertains to a pixel for use in a system for determining a distance to an object by range gating, said pixel comprising: a first charge storage well (221) and a second charge storage well (222) for accumulating electrical charges representative of amounts of light impinging on said pixel during respective sets of exposure intervals, wherein said first charge storage well (221) has a charge capacity that is at least 50% greater than a charge capacity of said second charge storage well (222). The invention also pertains to a range gating system comprising such a pixel.
    Type: Grant
    Filed: April 23, 2018
    Date of Patent: September 1, 2020
    Assignee: XENOMATIX NV
    Inventors: Dirk Van Dyck, Rik Paesen
  • Publication number: 20200137330
    Abstract: The present invention pertains to a pixel for use in a system for determining a distance to an object by range gating, said pixel comprising: a first charge storage well (221) and a second charge storage well (222) for accumulating electrical charges representative of amounts of light impinging on said pixel during respective sets of exposure intervals, wherein said first charge storage well (221) has a charge capacity that is at least 50% greater than a charge capacity of said second charge storage well (222). The invention also pertains to a range gating system comprising such a pixel.
    Type: Application
    Filed: April 23, 2018
    Publication date: April 30, 2020
    Applicant: XENOMATIX NV
    Inventors: Dirk VAN DYCK, Rik PAESEN
  • Publication number: 20200124726
    Abstract: A system for determining a distance to an object including a solid-state light source, a detector having a plurality of picture elements, and a processor to calculate the distance to the object as a function of exposure values generated by picture elements in response to the detected light. The picture elements generate exposure values by accumulating a first amount of electrical charge representative of reflected light during a first time window and a second electrical charge representative of reflected light during a second predetermined time window. The detecting occurs at the two charge storage wells; and the system interleaves the predetermined time windows with time windows during which the picture elements are used in a function different from the detecting and/or the picture elements include at least one further charge storage well to perform the function different from the detecting of the first and second amount of light.
    Type: Application
    Filed: December 17, 2018
    Publication date: April 23, 2020
    Applicant: XENOMATIX NV
    Inventors: Filip GEUENS, Dirk VAN DYCK, Rik PAESEN, Johan VAN DEN BOSSCHE
  • Publication number: 20200034644
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representing a second amount of light reflected during a second time window. The solid-state radiation source emits substantially monochromatic light having a wavelength spread of less than ±20 nm and the detector is equipped with a corresponding narrow bandpass filter.
    Type: Application
    Filed: October 3, 2017
    Publication date: January 30, 2020
    Applicant: XENOMATIX NV
    Inventors: Rik PAESEN, Dirk VAN DYCK
  • Publication number: 20200033478
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representating a second amount of light reflected during a second time window. The system projects and detects for at least two consecutive sequences of pulses, each being operated with a different duration of said first time window and said second time window.
    Type: Application
    Filed: October 3, 2017
    Publication date: January 30, 2020
    Applicant: XENOMATIX NV
    Inventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
  • Publication number: 20200033457
    Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate the exposure values by accumulating a first amount of electrical charge representative of a first amount of light reflected during a first time window and a second electrical charge representative of a second amount of light reflected during a second time window, the second time window occurring after the first time window. The picture elements comprise at least two sets of charge storage wells, each configured as a cascade.
    Type: Application
    Filed: October 3, 2017
    Publication date: January 30, 2020
    Applicant: XenomatiX NV
    Inventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
  • Publication number: 20200025894
    Abstract: The invention pertains to a method for subtracting background light from an exposure value of a first pixel in an imaging array, said first pixel receiving a reflection of a spot from a scenery illuminated by a periodically pulsed pattern of spots, said periodically pulsed pattern comprising in alternation an illuminated phase and a non-illuminated phase, the method comprising: accumulating in said first pixel a charge in proportion to a first quantity of incident light, received in said first pixel while detecting said spot during a predetermined amount of time; and decreasing said charge in proportion to a second quantity of incident light received during said predetermined amount of time in absence of said spot. The invention also pertains to a pixel and an imaging array.
    Type: Application
    Filed: October 3, 2017
    Publication date: January 23, 2020
    Applicant: XENOMATIX NV
    Inventors: Dirk VAN DYCK, Rik PAESEN
  • Patent number: 10183541
    Abstract: The invention pertains to a system comprising: a source to generate a pulsed radiation pattern; a detector; a processor to process data from the detector when radiation is reflected by an object; a synchronization means interfacing between the detector and the source; wherein: the detector is synchronized with the source so that radiation to be processed is detected only during the pulses, the processor determines a characteristic of the object by determining displacement of detected spots with reference to predetermined positions, the source emits monochromatic light and the detector is equipped with a bandpass filter and optics arranged so as to modify an angle of incidence onto said filter to confine light to a predetermined range around a normal of said filter, said optics comprising an image-space telecentric lens.
    Type: Grant
    Filed: December 31, 2015
    Date of Patent: January 22, 2019
    Assignee: XENOMATIX NV
    Inventors: Johan Van Den Bossche, Dirk Van Dyck, Liesbet Conings
  • Publication number: 20180299554
    Abstract: A system for determining a distance to an object including a solid-state light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector having a plurality of picture elements, for detecting light representing the pattern of discrete spots as reflected by the object in synchronization with the pulses; and a processor to calculate the distance to the object as a function of exposure values generated by the picture elements. The picture elements are configured to generate exposure values by accumulating, for each pulse of the sequence, a first amount of electrical charge representative of a first amount of light reflected by the object during a first time window and a second electrical charge representative of a second amount of light reflected by the object during a second time window, the second time window occurring after the first time window.
    Type: Application
    Filed: October 24, 2016
    Publication date: October 18, 2018
    Applicant: XENOMATIX NV
    Inventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
  • Patent number: 9551791
    Abstract: A system for detecting the profile of an object. The system having a radiation source for generating a radiation pattern. The system also having a detector which has a plurality of pixels and a processor for processing data from the detector when radiation from the radiation source is reflected by an object and detected by the detector. The system also has a synchronization device for interfacing between the detector and the radiation source. The radiation source is designed for operating in pulsed mode and the synchronization device can synchronize the pulses of the radiation source with the sampling of the detector.
    Type: Grant
    Filed: July 9, 2014
    Date of Patent: January 24, 2017
    Assignee: XENOMATIX NV
    Inventors: Johan Van Den Bossche, Dirk Van Dyck
  • Patent number: 9412558
    Abstract: A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.
    Type: Grant
    Filed: February 14, 2014
    Date of Patent: August 9, 2016
    Assignees: UNIVERSITEIT ANTWERPEN, FEI COMPANY
    Inventors: Dirk Van Dyck, Uwe Lucken, Holger Stark, Sara Bals
  • Publication number: 20160200161
    Abstract: The invention pertains to a system comprising: a source to generate a pulsed radiation pattern; a detector; a processor to process data from the detector when radiation is reflected by an object; a synchronization means interfacing between the detector and the source; wherein: the detector is synchronized with the source so that radiation to be processed is detected only during the pulses, the processor determines a characteristic of the object by determining displacement of detected spots with reference to predetermined positions, the source emits monochromatic light and the detector is equipped with a bandpass filter and optics arranged so as to modify an angle of incidence onto said filter to confine light to a predetermined range around a normal of said filter, said optics comprising an image-space telecentric lens.
    Type: Application
    Filed: December 31, 2015
    Publication date: July 14, 2016
    Applicant: XenomatiX NV
    Inventors: Johan VAN DEN BOSSCHE, Dirk VAN DYCK, Liesbet CONINGS
  • Publication number: 20160018526
    Abstract: A system for detecting the profile of an object. The system having a radiation source for generating a radiation pattern. The system also having a detector which has a plurality of pixels and a processor for processing data from the detector when radiation from the radiation source is reflected by an object and detected by the detector. The system also has a synchronization device for interfacing between the detector and the radiation source. The radiation source is designed for operating in pulsed mode and the synchronization device can synchronize the pulses of the radiation source with the sampling of the detector.
    Type: Application
    Filed: July 9, 2014
    Publication date: January 21, 2016
    Applicant: XENOMATIX BVBA
    Inventors: Johan VAN DEN BOSSCHE, Dirk VAN DYCK