Patents by Inventor Dirk van Dyck
Dirk van Dyck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11543501Abstract: The invention pertains to a method for subtracting background light from an exposure value of a first pixel in an imaging array, said first pixel receiving a reflection of a spot from a scenery illuminated by a periodically pulsed pattern of spots, said periodically pulsed pattern comprising in alternation an illuminated phase and a non-illuminated phase, the method comprising: accumulating in said first pixel a charge in proportion to a first quantity of incident light, received in said first pixel while detecting said spot during a predetermined amount of time; and decreasing said charge in proportion to a second quantity of incident light received during said predetermined amount of time in absence of said spot. The invention also pertains to a pixel and an imaging array.Type: GrantFiled: October 3, 2017Date of Patent: January 3, 2023Assignee: XENOMATIX NVInventors: Dirk Van Dyck, Rik Paesen
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Patent number: 11513199Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representating a second amount of light reflected during a second time window. The system projects and detects for at least two consecutive sequences of pulses, each being operated with a different duration of said first time window and said second time window.Type: GrantFiled: October 3, 2017Date of Patent: November 29, 2022Assignee: XENOMATIX NVInventors: Dirk Van Dyck, Johan Van Den Bossche
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Publication number: 20220326358Abstract: A method and device for determining distances to a scene determines a laser light pulse width PW that is smaller than a maximum time of flight TOFmax corresponding to a maximum distance Dmax by using a pulse width reduction factor N such that PW=(TOFmax?TDL)/N wherein TDL is a predefined delay window, determines a pulse frequency FP such that FP?1/((N+1)×PW+TDL), illuminates the scene with an illuminating pattern comprising a plurality of spatially separated pulsed laser beams having the determined pulse width and frequency, performs the detection as function of time during a detection time period TD divided in M=?×(N+1) consecutive detection time windows, with ??1, such that TD=M×(PW/?), identifies in what detection time windows reflected laser light is detected, and calculates a distance to the scene based on this identification.Type: ApplicationFiled: September 23, 2020Publication date: October 13, 2022Applicant: XENOMATIX NVInventors: Rik PAESEN, Dirk VAN DYCK, Stijn VANDEWIELE, Nick VAN DEN BROECK
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Patent number: 11029391Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representing a second amount of light reflected during a second time window. The solid-state radiation source emits substantially monochromatic light having a wavelength spread of less than ±20 nm and the detector is equipped with a corresponding narrow bandpass filter.Type: GrantFiled: October 3, 2017Date of Patent: June 8, 2021Assignee: XENOMATIX NVInventors: Rik Paesen, Dirk Van Dyck
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Patent number: 10921454Abstract: A system for determining a distance to an object including a solid-state light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector having a plurality of picture elements, for detecting light representing the pattern of discrete spots as reflected by the object in synchronization with the pulses; and a processor to calculate the distance to the object as a function of exposure values generated by the picture elements. The picture elements are configured to generate exposure values by accumulating, for each pulse of the sequence, a first amount of electrical charge representative of a first amount of light reflected by the object during a first time window and a second electrical charge representative of a second amount of light reflected by the object during a second time window, the second time window occurring after the first time window.Type: GrantFiled: October 24, 2016Date of Patent: February 16, 2021Assignee: XENOMATIX NVInventors: Dirk Van Dyck, Johan Van Den Bossche
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Patent number: 10852400Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate the exposure values by accumulating a first amount of electrical charge representative of a first amount of light reflected during a first time window and a second electrical charge representative of a second amount of light reflected during a second time window, the second time window occurring after the first time window. The picture elements comprise at least two sets of charge storage wells, each configured as a cascade.Type: GrantFiled: October 3, 2017Date of Patent: December 1, 2020Assignee: XenomatiX NVInventors: Dirk Van Dyck, Johan Van Den Bossche
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Patent number: 10768301Abstract: A system for determining a distance to an object including a solid-state light source, a detector having a plurality of picture elements, and a processor to calculate the distance to the object as a function of exposure values generated by picture elements in response to the detected light. The picture elements generate exposure values by accumulating a first amount of electrical charge representative of reflected light during a first time window and a second electrical charge representative of reflected light during a second predetermined time window. The detecting occurs at the two charge storage wells; and the system interleaves the predetermined time windows with time windows during which the picture elements are used in a function different from the detecting and/or the picture elements include at least one further charge storage well to perform the function different from the detecting of the first and second amount of light.Type: GrantFiled: December 17, 2018Date of Patent: September 8, 2020Assignee: XENOMATIX NVInventors: Filip Geuens, Dirk Van Dyck, Rik Paesen, Johan Van Den Bossche
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Patent number: 10764518Abstract: The present invention pertains to a pixel for use in a system for determining a distance to an object by range gating, said pixel comprising: a first charge storage well (221) and a second charge storage well (222) for accumulating electrical charges representative of amounts of light impinging on said pixel during respective sets of exposure intervals, wherein said first charge storage well (221) has a charge capacity that is at least 50% greater than a charge capacity of said second charge storage well (222). The invention also pertains to a range gating system comprising such a pixel.Type: GrantFiled: April 23, 2018Date of Patent: September 1, 2020Assignee: XENOMATIX NVInventors: Dirk Van Dyck, Rik Paesen
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Publication number: 20200137330Abstract: The present invention pertains to a pixel for use in a system for determining a distance to an object by range gating, said pixel comprising: a first charge storage well (221) and a second charge storage well (222) for accumulating electrical charges representative of amounts of light impinging on said pixel during respective sets of exposure intervals, wherein said first charge storage well (221) has a charge capacity that is at least 50% greater than a charge capacity of said second charge storage well (222). The invention also pertains to a range gating system comprising such a pixel.Type: ApplicationFiled: April 23, 2018Publication date: April 30, 2020Applicant: XENOMATIX NVInventors: Dirk VAN DYCK, Rik PAESEN
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Publication number: 20200124726Abstract: A system for determining a distance to an object including a solid-state light source, a detector having a plurality of picture elements, and a processor to calculate the distance to the object as a function of exposure values generated by picture elements in response to the detected light. The picture elements generate exposure values by accumulating a first amount of electrical charge representative of reflected light during a first time window and a second electrical charge representative of reflected light during a second predetermined time window. The detecting occurs at the two charge storage wells; and the system interleaves the predetermined time windows with time windows during which the picture elements are used in a function different from the detecting and/or the picture elements include at least one further charge storage well to perform the function different from the detecting of the first and second amount of light.Type: ApplicationFiled: December 17, 2018Publication date: April 23, 2020Applicant: XENOMATIX NVInventors: Filip GEUENS, Dirk VAN DYCK, Rik PAESEN, Johan VAN DEN BOSSCHE
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Publication number: 20200034644Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representing a second amount of light reflected during a second time window. The solid-state radiation source emits substantially monochromatic light having a wavelength spread of less than ±20 nm and the detector is equipped with a corresponding narrow bandpass filter.Type: ApplicationFiled: October 3, 2017Publication date: January 30, 2020Applicant: XENOMATIX NVInventors: Rik PAESEN, Dirk VAN DYCK
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Publication number: 20200033478Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate exposure values by accumulating a first amount of electrical charge representing a first amount of light reflected during a first time window and a second electrical charge representating a second amount of light reflected during a second time window. The system projects and detects for at least two consecutive sequences of pulses, each being operated with a different duration of said first time window and said second time window.Type: ApplicationFiled: October 3, 2017Publication date: January 30, 2020Applicant: XENOMATIX NVInventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
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Publication number: 20200033457Abstract: The invention pertains to a system for determining a distance, comprising: a light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector comprising picture elements, for detecting light representing the pattern as reflected by the object in synchronization with the sequence of pulses; and processing means to calculate the distance to the object as a function of exposure values generated by said picture elements. The picture elements generate the exposure values by accumulating a first amount of electrical charge representative of a first amount of light reflected during a first time window and a second electrical charge representative of a second amount of light reflected during a second time window, the second time window occurring after the first time window. The picture elements comprise at least two sets of charge storage wells, each configured as a cascade.Type: ApplicationFiled: October 3, 2017Publication date: January 30, 2020Applicant: XenomatiX NVInventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
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Publication number: 20200025894Abstract: The invention pertains to a method for subtracting background light from an exposure value of a first pixel in an imaging array, said first pixel receiving a reflection of a spot from a scenery illuminated by a periodically pulsed pattern of spots, said periodically pulsed pattern comprising in alternation an illuminated phase and a non-illuminated phase, the method comprising: accumulating in said first pixel a charge in proportion to a first quantity of incident light, received in said first pixel while detecting said spot during a predetermined amount of time; and decreasing said charge in proportion to a second quantity of incident light received during said predetermined amount of time in absence of said spot. The invention also pertains to a pixel and an imaging array.Type: ApplicationFiled: October 3, 2017Publication date: January 23, 2020Applicant: XENOMATIX NVInventors: Dirk VAN DYCK, Rik PAESEN
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Patent number: 10183541Abstract: The invention pertains to a system comprising: a source to generate a pulsed radiation pattern; a detector; a processor to process data from the detector when radiation is reflected by an object; a synchronization means interfacing between the detector and the source; wherein: the detector is synchronized with the source so that radiation to be processed is detected only during the pulses, the processor determines a characteristic of the object by determining displacement of detected spots with reference to predetermined positions, the source emits monochromatic light and the detector is equipped with a bandpass filter and optics arranged so as to modify an angle of incidence onto said filter to confine light to a predetermined range around a normal of said filter, said optics comprising an image-space telecentric lens.Type: GrantFiled: December 31, 2015Date of Patent: January 22, 2019Assignee: XENOMATIX NVInventors: Johan Van Den Bossche, Dirk Van Dyck, Liesbet Conings
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Publication number: 20180299554Abstract: A system for determining a distance to an object including a solid-state light source for projecting a pattern of discrete spots of laser light towards the object in a sequence of pulses; a detector having a plurality of picture elements, for detecting light representing the pattern of discrete spots as reflected by the object in synchronization with the pulses; and a processor to calculate the distance to the object as a function of exposure values generated by the picture elements. The picture elements are configured to generate exposure values by accumulating, for each pulse of the sequence, a first amount of electrical charge representative of a first amount of light reflected by the object during a first time window and a second electrical charge representative of a second amount of light reflected by the object during a second time window, the second time window occurring after the first time window.Type: ApplicationFiled: October 24, 2016Publication date: October 18, 2018Applicant: XENOMATIX NVInventors: Dirk VAN DYCK, Johan VAN DEN BOSSCHE
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Patent number: 9551791Abstract: A system for detecting the profile of an object. The system having a radiation source for generating a radiation pattern. The system also having a detector which has a plurality of pixels and a processor for processing data from the detector when radiation from the radiation source is reflected by an object and detected by the detector. The system also has a synchronization device for interfacing between the detector and the radiation source. The radiation source is designed for operating in pulsed mode and the synchronization device can synchronize the pulses of the radiation source with the sampling of the detector.Type: GrantFiled: July 9, 2014Date of Patent: January 24, 2017Assignee: XENOMATIX NVInventors: Johan Van Den Bossche, Dirk Van Dyck
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Patent number: 9412558Abstract: A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.Type: GrantFiled: February 14, 2014Date of Patent: August 9, 2016Assignees: UNIVERSITEIT ANTWERPEN, FEI COMPANYInventors: Dirk Van Dyck, Uwe Lucken, Holger Stark, Sara Bals
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Publication number: 20160200161Abstract: The invention pertains to a system comprising: a source to generate a pulsed radiation pattern; a detector; a processor to process data from the detector when radiation is reflected by an object; a synchronization means interfacing between the detector and the source; wherein: the detector is synchronized with the source so that radiation to be processed is detected only during the pulses, the processor determines a characteristic of the object by determining displacement of detected spots with reference to predetermined positions, the source emits monochromatic light and the detector is equipped with a bandpass filter and optics arranged so as to modify an angle of incidence onto said filter to confine light to a predetermined range around a normal of said filter, said optics comprising an image-space telecentric lens.Type: ApplicationFiled: December 31, 2015Publication date: July 14, 2016Applicant: XenomatiX NVInventors: Johan VAN DEN BOSSCHE, Dirk VAN DYCK, Liesbet CONINGS
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Publication number: 20160018526Abstract: A system for detecting the profile of an object. The system having a radiation source for generating a radiation pattern. The system also having a detector which has a plurality of pixels and a processor for processing data from the detector when radiation from the radiation source is reflected by an object and detected by the detector. The system also has a synchronization device for interfacing between the detector and the radiation source. The radiation source is designed for operating in pulsed mode and the synchronization device can synchronize the pulses of the radiation source with the sampling of the detector.Type: ApplicationFiled: July 9, 2014Publication date: January 21, 2016Applicant: XENOMATIX BVBAInventors: Johan VAN DEN BOSSCHE, Dirk VAN DYCK