Abstract: In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. A voltage divider network is coupled to the second stage. The circuit includes an output transistor having first and second terminals, in which the first terminal of the output transistor is coupled to the first stage, and the second terminal of the output transistor is coupled to the voltage divider network.

Abstract: A circuit (70) includes a voltage reference circuit (72) that includes an output terminal (74), wherein the voltage reference circuit (72) is configured to generate an output voltage at the output terminal (74) having a first transfer function of voltage with respect to strain. The circuit (70) also includes a strain compensation circuit (78) having an input terminal connected to the output terminal (74) of the voltage reference circuit, and having a strain compensation circuit output terminal (80). The strain compensation circuit (78) is configured to receive the output voltage comprising the first transfer function at the input terminal. The strain compensation circuit (78) has a second transfer function of voltage with respect to strain that is substantially opposite that of the first transfer function, thereby outputting a compensated voltage at the strain compensation circuit output terminal (80) that is substantially independent of strain.

Abstract: In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. A voltage divider network is coupled to the second stage. The circuit includes an output transistor having first and second terminals, in which the first terminal of the output transistor is coupled to the first stage, and the second terminal of the output transistor is coupled to the voltage divider network.

Abstract: Techniques for providing amplifier overdrive protection. In an example, a circuit configured to determine the difference between the amplifier output voltage and the amplifier power supply voltage, so as to sense an overdrive condition. Responsive to the difference exceeding a threshold, the circuit is configured to limit the amplifier drive capability, which in turn limits the maximum amplifier output current. The circuit may restore the amplifier drive capability, responsive to cessation of the overdrive condition. In some such cases, the circuit may be configured with hysteresis, so as to provide stability when transitioning to and from the reduced drive state. Another example circuit operates in a similar fashion but is configured to determine the difference between the amplifier input voltage and a reference voltage, so as to sense an overdrive condition. In some such cases, the reference voltage may be equal to amplifier power supply voltage divided by amplifier gain.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: A circuit includes a load circuit and a voltage regulator circuit. The load circuit includes a load voltage input, a first transistor and a second transistor. The first transistor has a first threshold voltage, and the second transistor has a second threshold voltage. The voltage regulator circuit includes a load voltage output and a tracking circuit. The load voltage output is coupled to the load voltage input. The tracking circuit is configured to provide a load voltage at the load voltage output in which the load voltage tracks the first threshold voltage and the second threshold voltage.

Abstract: A float detector includes a latch and a float detection circuit. The latch includes a latch output and an input/output (I/O) terminal. The I/O terminal is coupled to an input terminal. The float detection circuit includes a detection input, a drive output, and a float detection circuit. The detection input is coupled to the latch output. The drive output is coupled to the I/O terminal. The float detector is configured to provide a drive signal at the drive output, and determine that the input terminal is floating based on a latch output signal received at the detection input responsive to the drive signal.

Abstract: In described examples, a circuit includes a switch. The switch includes first transistors and second transistors. A voltage generation circuit is coupled to the switch. A level shifter is coupled to the voltage generation circuit and is configured to receive a control signal. A logic unit is coupled to the level shifter and the voltage generation circuit. The logic unit is configured to generate a secondary signal. The first transistors are configured to receive the control signal, and the second transistors are configured to receive the secondary signal.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: In described examples, a circuit includes a switch. The switch includes first transistors and second transistors. A voltage generation circuit is coupled to the switch. A level shifter is coupled to the voltage generation circuit and is configured to receive a control signal. A logic unit is coupled to the level shifter and the voltage generation circuit. The logic unit is configured to generate a secondary signal. The first transistors are configured to receive the control signal, and the second transistors are configured to receive the secondary signal.

Abstract: In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. A voltage divider network is coupled to the second stage. The circuit includes an output transistor having first and second terminals, in which the first terminal of the output transistor is coupled to the first stage, and the second terminal of the output transistor is coupled to the voltage divider network.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: A power-on-reset (POR) circuit includes an NFET branch and a PFET branch. The NFET branch includes: an n-channel field effect transistor (NFET) having a first threshold voltage; and a first quiescent bias current source coupled between a supply terminal and the NFET. The PFET branch includes: a p-channel field effect transistor (PFET) having a second threshold voltage; and a second quiescent bias current source coupled between a ground terminal and the PFET. The POR circuit is configured to provide a POR signal at an output terminal based on: the first threshold voltage or the second threshold voltage, whichever is larger; and a voltage margin. The output terminal is coupled between the PFET branch and the second quiescent bias current source.

Abstract: A power-on-reset (POR) circuit includes an NFET branch and a PFET branch. The NFET branch includes: an n-channel field effect transistor (NFET) having a first threshold voltage; and a first quiescent bias current source coupled between a supply terminal and the NFET. The PFET branch includes: a p-channel field effect transistor (PFET) having a second threshold voltage; and a second quiescent bias current source coupled between a ground terminal and the PFET. The POR circuit is configured to provide a POR signal at an output terminal based on: the first threshold voltage or the second threshold voltage, whichever is larger; and a voltage margin. The output terminal is coupled between the PFET branch and the second quiescent bias current source.

Abstract: A device for monitoring voltage in a battery-operated system, the device including: a ladder selector configured to select between a first resistive ladder and a second resistive ladder; the first resistive ladder includes: a first string of resistors coupled between a sensing input node and a first node of the ladder selector; and a first set of transistors configured to tap intermediate nodes of a set of resistors in the first string of resistors; the second resistive ladder includes: a second string of resistors coupled between the sensing input node and a second node of the ladder selector; and a second set of transistors configured to tap intermediate nodes of a set of resistors in the second string of resistors; and wherein a selected transistor in one of the first set of transistors or the second set of transistors is turned on, and non-selected transistors of the first set of transistors and the second set of transistors are turned off to set a threshold voltage for a sensing output node.

Abstract: A supply voltage supervisor circuit includes a comparator circuit. The comparator circuit includes a first input terminal, a second input terminal, a first transistor, and a second transistor. The first transistor has a first threshold voltage, and includes a first terminal coupled to the first input terminal. The second transistor has a second threshold voltage that is different from the first voltage threshold, and includes a first terminal coupled to the second input terminal, and a second terminal coupled to a second terminal of the first transistor. A trip point of the comparator circuit is based on a difference of the first threshold voltage and the second threshold voltage.

Abstract: A device for monitoring voltage in a battery-operated system, the device comprising: a ladder selector configured to select between a first resistive ladder and a second resistive ladder; the first resistive ladder comprising: a first string of resistors coupled between a sensing input node and a first node of the ladder selector; and a first set of transistors configured to tap intermediate nodes of a set of resistors in the first string of resistors; the second resistive ladder comprising: a second string of resistors coupled between the sensing input node and a second node of the ladder selector; and a second set of transistors configured to tap intermediate nodes of a set of resistors in the second string of resistors; and wherein a selected transistor in one of the first set of transistors or the second set of transistors is turned on, and non-selected transistors of the first set of transistors and the second set of transistors are turned off to set a threshold voltage for a sensing output node.

Abstract: A voltage detector circuit including a ladder selector that includes a first node, a second node and a selector node. The voltage detector circuit also includes a first resistive ladder that includes a first string of resistors coupled between a sensing input node and the first node of the ladder selector and a first set of transistors. An input node of each transistor in the first set of transistors is coupled to a respective intermediate node between two resistors in a subset of resistors in the first string of resistors and an output node of each transistor in the first set of transistors is coupled to a sensing output node. The voltage detector circuit also includes a second resistive ladder that includes a second string of resistors coupled between the sensing input node and the second node of the ladder selector and a second set of transistors.

Abstract: A voltage detector circuit is disclosed. The voltage detector circuit includes a ladder selector that includes a first node, a second node and a selector node. The voltage detector circuit also includes a first resistive ladder that includes a first string of resistors coupled between a sensing input node and the first node of the ladder selector and a first set of transistors. An input node of each transistor in the first set of transistors is coupled to a respective intermediate node between two resistors in a subset of resistors in the first string of resistors and an output node of each transistor in the first set of transistors is coupled to a sensing output node. The voltage detector circuit also includes a second resistive ladder that includes a second string of resistors coupled between the sensing input node and the second node of the ladder selector and a second set of transistors.