Abstract: Embodiments detect data drift associated with machine learning (“ML”) models. Embodiments identify a first feature stored by a feature store, where the feature store includes an offline store and an online store. Embodiments determine one or more first trained ML models that are using the first feature. For each of the first trained ML models, embodiments invoke the first trained ML model using synthetic data or validation data, generate metrics to determine an accuracy of the first trained ML model and, when the accuracy is below a threshold, generate an alert notifying of a first data drift for the first trained ML model.

Abstract: Systems and methods provide acquisition of a plurality of code artifacts and one or more code review comments associated with each code artifact, generation of a set of code features based on each of the plurality of code artifacts, input of each set of code features to a neural network to generate code review comments respectively associated with each of the plurality of code artifacts, determination of a loss by comparing each generated code review comment respectively associated with one of plurality of code artifacts with the one or more review comments associated with the one of plurality of code artifacts, and modification of the neural network based on the loss.

Abstract: Various implementations described herein are directed to an integrated circuit. The integrated circuit may include dummy wordline circuitry having a dummy wordline driver coupled to a dummy wordline load via a dummy wordline. The integrated circuit may include underdrive circuitry coupled to the dummy wordline between the dummy wordline driver and the dummy wordline load. The underdrive circuitry may generate an underdrive on the dummy wordline when the dummy wordline is selected and driven by the dummy wordline driver.

Abstract: Various implementations described herein are directed to an integrated circuit. The integrated circuit may include dummy wordline circuitry having a dummy wordline driver coupled to a dummy wordline load via a dummy wordline. The integrated circuit may include underdrive circuitry coupled to the dummy wordline between the dummy wordline driver and the dummy wordline load. The underdrive circuitry may generate an underdrive on the dummy wordline when the dummy wordline is selected and driven by the dummy wordline driver.