Abstract: An image sensor device has a first region configured to sense only infrared illumination and a second region configured to not sense visible and infrared illumination.

Abstract: An image sensor device has a first region configured to sense only infrared illumination and a second region configured to not sense visible and infrared illumination.

Abstract: A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.

Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.

Abstract: A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.

Abstract: A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.

Abstract: A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.

Abstract: A method includes receiving image data, generating a low-pass image and a high-pass image from the image data, applying dynamic range compression to the low-pass image and not the high-pass image, and adding the high-pass image to the low-pass image after dynamic range compression to create an output image.

Abstract: A method and apparatus for applying color correction to image signals provides different color corrections depending on a characterization associated with a pixel signal being processed or the gain applied to the pixel signal such as a value of a pixel signal being processed. The color corrections may be configured such that darker pixels have less color correction applied to them.

Abstract: A method includes receiving image data, generating a low-pass image and a high-pass image from the image data, applying dynamic range compression to the low-pass image and not the high-pass image, and adding the high-pass image to the low-pass image after dynamic range compression to create an output image.

Abstract: A method and apparatus for reducing false color artifacts in digital images. Aperture correction and color saturation values are determined for a portion of an image surrounding a subject pixel. A color attenuation value is determined based at least in part on the aperture correction and color saturation values. A color value of the subject pixel is adjusted by an amount based at least in part on the color attenuation value. In one exemplary embodiment, the method and apparatus operate in the YUV color space and adjust U and V values of the subject pixel proportionally to the color attenuation value.

Abstract: Methods, apparatuses and systems are disclosed for accelerating the operation of the automatic functions of an imager, e.g. a camera system. The automatic functions may, for example, include one or more of auto-focus, auto-exposure and auto-white balance. A special “windowing mode” is implemented in which information is acquired from only a subset of defined windows from the full pixel array area in order to set image capture parameters of the imager in accordance with current scene conditions.

Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.

Abstract: An improved non-uniform sensitivity correction algorithm for use in an imager device (e.g., a CMOS APS). The algorithm provides zones having flexible boundaries which can be reconfigured depending upon the type of lens being used in a given application. Each pixel within each zone is multiplied by a correction factor dependent upon the particular zone while the pixel is being read out from the array. The amount of sensitivity adjustment required for a given pixel depends on the type of lens being used, and the same correction unit can be used with multiple lenses where the zone boundaries and the correction factors are adjusted for each lens. In addition, the algorithm makes adjustments to the zone boundaries based upon a misalignment between the centers of the lens being used and the APS array.

Abstract: A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.

Abstract: Presented invention describes the approach for manufacturing of the pixels for solid state imaging devices possessing a photon detection efficiency superior to those currently available. Formation of a bipolar junction transistor (BJT) in close vicinity of the photodiode in such a way that accumulation area of the photodiode also represents its collector region allows for conversion of the photo carriers which cannot be accumulated in a regular 4T pixel, usually holes, into complimentary type carriers, usually electrons, that can be stored, read out and converted to electric signal. This transistor can be formed, for example, by creating a n+ region inside the surface p layer of the pinned photodiode. In the described structure the accumulation region is isolated from the surface and operation of the new pixel is otherwise similar to the 4T pixel operation. As a result, both main advantages of 4T pixel: low dark current and kTC noise cancellation are, therefore, preserved.

Abstract: A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.

Abstract: Methods, systems and apparatuses proving a high dynamic range imager. Multiple photosensor integration periods are used to capture pixel signal information. A transistor gate is used to remove electrons from the photosensor between the two successive integration periods providing a non-linear pixel response characteristic having a knee point. Each pixel is calibrated for the knee point which is used during adjustment of the pixel output signal. Each pixel may also be calibrated with an arbitrary signal response curve for multiple light intensities.

Abstract: An imaging device and processes to provide image stabilization by controlling analog gain and integration time. Analog gain and integration time for images are determined by comparing an image in various frames, whether full frames or hidden frames, where the image is provided with differently set analog gain and integration time settings to determine settings for stabilized image capture.

Abstract: Methods and apparatuses for noise reduction include embodiments that use a weighted combination based on the presence of edges of two calculated demosaiced signals to produce a noise reduced signal. The noise reduced signal may be sharpened based on a calculated luminance of the two demosaiced signals.