Abstract: A method to estimate remaining lifespan of a storage device is provided. The method includes obtaining first time series data for a set of metrics associated with operation of a set of flash storage devices, obtaining second time series data for one or more health metrics associated the set of storage devices, providing the first time series data for the set of metrics associated with operation of the plurality of flash storage devices and the second time series data for the one or more health metrics associated with the set of storage devices as training data to a machine learning model, and training the machine learning model to estimate a time to failure of a flash storage device based on the first time series data and the second time series data.