Abstract: A quadrupole mass filter assembly comprises five quadrupole segments. An entrance quadrupole segment is configured to receive RF voltages, a secondary quadrupole segment is arranged downstream of the entrance quadrupole segment and is configured to receive RF and resolving DC voltages. A middle quadrupole segment is arranged downstream of the secondary quadrupole segment and is configured to receive RF voltages. A primary quadrupole segment is arranged downstream of the middle quadrupole segment and is configured to receive RF and resolving DC voltages. An end quadrupole segment is arranged downstream of the primary quadrupole segment and is configured to receive RF voltages.

Abstract: The present invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer wherein the time-of-flight mass spectrometer is contained within the vacuum chamber. The time-of-flight mass spectrometer comprising a first electrode and a second electrode, the second electrode being spaced apart from the first electrode at a distance defining a portion of an ion-flight path therebetween. The assembly further comprising a first support for supporting the first electrode, the first support arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to permit relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The present invention also relates to a multi-reflection time-of-flight mass analyser.

Abstract: A multi-reflection mass analyser comprises a pair of opposed ion-optical mirrors elongated linearly along a longitudinal axis that extends centrally through the mass analyser, and either one or both ion-optical mirrors comprises a series of spaced apart electrodes. Each electrode is elongated along the longitudinal axis. The series of electrodes extend in a direction transverse to the longitudinal axis and the electrodes are spaced apart by a series of gaps. The series of electrodes comprises a first pair of adjacent electrodes and a second pair of adjacent electrodes. The first pair of adjacent electrodes are separated by a straight gap defined by respective straight edges of the adjacent electrodes. The second pair of adjacent electrodes are separated by a curved gap defined by respective curved edges of the adjacent electrodes.

Abstract: A mass spectrometer comprises: a first ion optical device in a relatively low gas pressure region; a second ion optical device in a relatively high gas pressure region, the first and second ion optical devices receiving respective RF voltages from respective RF power supplies for generating respective RF fields that confine ions in respective trapping regions of the ion optical devices; and a gas conductance restriction, restricting gas flow from the relatively high gas pressure region to the relatively low gas pressure region, the gas conductance restriction having an aperture to allow ions to pass from the second to the first ion optical device. The first and second RF power supplies are independent to allow the RF voltages for generating the first RF field to have a different amplitude from the RF voltages for generating the second RF field.

Abstract: A multi-reflection time-of-flight mass analyser includes two ion mirrors spaced apart and opposing each other in a first direction X, each mirror elongated generally along a drift direction Y between a first end and a second end, the drift direction Y being orthogonal to the first direction X; an ion injector for injecting ions into a space between the ion mirrors, the ion injector located in proximity with the first end of the ion mirrors; a detector for detecting ions after they have completed a plurality of reflections between the ion mirrors, the detector located in proximity with the first end of the ion mirrors; a deflector located in proximity with the first end of the ion mirrors; and a control system.

Abstract: A Time of Flight (TOF) mass analyser comprises an ion source, a detector, an electrode, and a resistive divider comprising first and second resistors. The ion source and the detector define an ion flight path from the ion source to the detector. The electrode is arranged along the ion flight path and receives an output voltage. Thermal expansion produces a first mass shift/Kelvin of detected ions. The resistive divider is thermally coupled to the TOF mass analyser to receive an input voltage and output an output voltage to the electrode. The first and second resistors have respective first and second temperature coefficients that provide a voltage shift/Kelvin to the output voltage to the electrode producing a second mass shift/Kelvin of detected ions, compensating for the first mass shift/Kelvin.

Abstract: An ion trap 1 comprises one ejection electrode 2 for ion trapping having an opening 4, through which ions in the ion trap 1 can be ejected in an ejection direction E and further electrodes 3 for ion trapping, wherein the ejection electrode 2 and the further electrodes 3 are elongated in a longitudinal direction L. The angle ? between the longitudinal direction L and the ejection direction E is nearly 90°. The ion trap 1 comprises a primary winding 5 connected to an RF power supply 6, a secondary winding 7 coupling with the primary winding 5 for transforming the RF voltage of the RF power supply 6 supplying the transformed RF signals to the ejection electrode 2 and secondary windings 7? coupling with the primary winding 5 for transforming the RF voltage of the RF power supply 6 supplying the transformed RF signals to the further electrodes 3.

Abstract: A method for determining an initial abundance of one or more of a plurality of ions in an ion sample is provided. The ion sample is analysed by a Fourier Transform Mass Spectrometer with the plurality of ions decaying over time during the analysis. The method comprises obtaining a mass spectrum of the ion sample. The mass spectrum includes a plurality of peaks indicating the abundance of each of the plurality of ions in the ion sample over an analysis time duration. The method further comprises calculating the initial amplitude of a transient signal of a first ion of the plurality of ions using a fit of an inverse Fourier Transform, FT, of a first peak of the plurality of peaks.

Abstract: A method of operating an instrument which comprises a first and second ion stores, comprising determining whether a target accumulation time for the second ion store is greater than a threshold accumulation time. When the target accumulation time is less than the threshold accumulation time, ions are accumulated within the second ion store using an accumulation time that is based on the target accumulation time. When the target accumulation time is greater than the threshold accumulation time, ions are accumulated within the first ion store using a first accumulation time, the ions accumulated in the first ion store are passed to the second ion store, and further ions are accumulated within the second ion store using a second accumulation time.

Abstract: A mass spectrometer comprises: a first ion optical device in a relatively low gas pressure region; a second ion optical device in a relatively high gas pressure region, the first and second ion optical devices receiving respective RF voltages from respective RF power supplies for generating respective RF fields that confine ions in respective trapping regions of the ion optical devices; and a gas conductance restriction, restricting gas flow from the relatively high gas pressure region to the relatively low gas pressure region, the gas conductance restriction having an aperture to allow ions to pass from the second to the first ion optical device. The first and second RF power supplies are independent to allow the RF voltages for generating the first RF field to have a different amplitude from the RF voltages for generating the second RF field.

Abstract: Systems, methods, and computer-readable media described provide multi-reflection time-of-flight analyser (e.g. of a type in which the ion beam is allowed to spread out relatively broadly) and methods for use in a zoom mode, in which time-of-flight perturbations induced by reflections at the deflector are cancelled out or removed, such that they do not give rise to a significant increase in the arrival time spread of ions at the detector. This accordingly facilitates high resolution operation of the analyser in the zoom mode. Furthermore, this is done in a way which allows the analyser to remain drift focused, which in turn means that the analyser can be straightforwardly and seamlessly switched between its normal mode of operation and the zoom mode of operation.

Abstract: An electrostatic ion trap or an array of electrostatic ion traps are provided having a longitudinal length of no more than 10 mm and/or at least one electrode with a capacitance to ground of no more than 1 pF. First and second sets of planar electrodes may be distributed along the longitudinal axis, at least some of the which are configured to receive an electrostatic potential for confinement of ions received in the space between the first and second sets of planar electrodes. An array may comprise an inlet for receiving an ion beam such that a portion of the ion beam can be trapped in each of the ion traps. Signals indicative of ion mass and charge data may be obtained from multiple electrostatic ion traps in the array. This mass and charge data may be combined for identification of components of a mixture of different analyte ions.

Abstract: A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor.

Abstract: A method of operating an instrument which comprises a first and second ion stores, comprising determining whether a target accumulation time for the second ion store is greater than a threshold accumulation time. When the target accumulation time is less than the threshold accumulation time, ions are accumulated within the second ion store using an accumulation time that is based on the target accumulation time. When the target accumulation time is greater than the threshold accumulation time, ions are accumulated within the first ion store using a first accumulation time that is based on a difference between the target accumulation time and the threshold accumulation time, the ions accumulated in the first ion store are passed to the second ion store, and further ions are accumulated within the second ion store using a second accumulation time that is based on the threshold accumulation time.

Abstract: An electrostatic ion trap or an array of electrostatic ion traps are provided having a longitudinal length of no more than 10 mm and/or at least one electrode with a capacitance to ground of no more than 1 pF. First and second sets of planar electrodes may be distributed along the longitudinal axis, at least some of the which are configured to receive an electrostatic potential for confinement of ions received in the space between the first and second sets of planar electrodes. An array may comprise an inlet for receiving an ion beam, configured such that a portion of the ion beam can be trapped in each of the ion traps. Signals indicative of ion mass and charge data may be obtained from multiple electrostatic ion traps in the array. This mass and charge data may be combined for identification of components of a mixture of different analyte ions.

Abstract: A multi-reflection time-of-flight (MR-ToF) mass analyser comprises two opposing ion mirrors spaced apart in a first direction, each mirror elongated generally along a drift direction between a first end and a second end, the drift direction being orthogonal to the first direction. An ion injector injects ions into a space between the ion mirrors, and the ions are detected after a plurality of reflections between the ion mirrors. A first deflector and/or a lens is between the ion mirrors, proximate the first end of the ion mirrors, a second deflector and/or lens is arranged between the ion mirrors proximate the second end of the ion mirrors or between the first and second ends of the ion mirrors. One or more trapping deflector(s) and/or lens(es) are between the ion mirrors, proximate the second end of the ion mirrors or between the first and second ends of the ion mirrors.

Abstract: A method for correcting mass spectral data obtained for a sample is described, where the mass spectral data is a time-of-flight mass spectral data. The method includes receiving mass spectral data obtained from a sample, the mass spectral data being indicative of an ion abundance. The method further includes applying a correction function to the mass spectral data based on the ion abundance indicated by the mass spectral data and on one or more trapping parameters associated with the mass spectral data. The correction function defines correction values for the mass spectral data for a range of ion abundances and for a range of trapping parameters.

Abstract: Provided herein are methods and systems for controlling the number of ions in a batch of ions accumulated in an ion trap. The ion trap comprises one or more detection electrodes configured to detect image current signals from ions accumulated within the ion trap. An ion or group of ions passed to the ion trap is caused to impact upon one or more of the detection electrode(s) of the ion trap so as to provide a detected signal. An ion current or charge of the ion or group of ions is determined from the detected signal, and the determined ion current or charge of the ion or group of ions is used to control the number of ions in a batch of ions subsequently accumulated in the ion trap.

Abstract: A multi-reflection time of flight mass spectrometer comprises a mass analyser with opposing mirror electrodes and a focal plane correction electrode. Each mirror electrode is elongated generally along a drift direction. The focal plane correction electrode extends along at least a portion of the drift direction in or adjacent the space between the mirror electrodes. Ions are injected into the mirror electrodes and an electrical potential provided to the mirror electrodes reflects the ions in the resulting ion beam and causes the ions to follow a zig zag path as they drift along the mirror electrodes. An electrical potential is also provided to the focal plane correction electrode to set the focal plane position of the ion beam to coincide with a detector surface of an ion detector placed at the end of the ions' path.

Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.