Patents by Inventor Dmitry Lysenkov

Dmitry Lysenkov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Specimen holder having alignment marks
    Patent number: 8304745
    Abstract: For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.
    Type: Grant
    Filed: May 31, 2011
    Date of Patent: November 6, 2012
    Assignees: Carl Zeiss MicroImaging GmbH, Carl Zeiss AG, Carl Zeiss NTS GmbH
    Inventors: Heino Heise, Andreas Nolte, Christian Thomas, Martin Edelmann, Uwe Wolf, Ulrich Kohlhaas, Dmitry Lysenkov
  • SPECIMEN HOLDER HAVING ALIGNMENT MARKS
    Publication number: 20120126115
    Abstract: For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.
    Type: Application
    Filed: May 31, 2011
    Publication date: May 24, 2012
    Inventors: Heino Heise, Andreas Nolte, Christian Thomas, Martin Edelmann, Uwe Wolf, Ulrich Kohlhaas, Dmitry Lysenkov