Patents by Inventor Dmitry Rudoy

Dmitry Rudoy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220398780
    Abstract: Methods, apparatus, systems, and articles of manufacture are disclosed to calibrate a stereo camera. An example apparatus includes means for determining a motion grid between a first image and a second image captured by the stereo camera; means for determining a calibration value to calibrate the stereo camera based on a prior calibration value, a relative orientation between the first image and the second image based on the motion grid, and a metric indicative of calibration improvement; and means for estimating a depth based on the calibration value.
    Type: Application
    Filed: June 21, 2022
    Publication date: December 15, 2022
    Inventors: Oskar Pelc, Dmitry Rudoy, Noam Levy
  • Publication number: 20220092400
    Abstract: A method, system, and article of highly efficient neural network video image processing uses temporal correlations.
    Type: Application
    Filed: December 6, 2021
    Publication date: March 24, 2022
    Applicant: Intel Corporation
    Inventors: Noam Elron, Ben Berlin, Dmitry Rudoy, Amir Goren, Noam Levy
  • Patent number: 9826149
    Abstract: Methods, apparatuses and systems may provide for operating a machine learning device by obtaining training image data, conducting an offline prediction analysis of the training image data with respect to one or more real-time parameters of an image capture device, and generating one or more parameter detection models based on the offline prediction analysis. Additionally, methods, apparatuses and systems may provide for operating the image capture device by obtaining a candidate image associated with the image capture device, determining that the candidate image corresponds to a particular type of scene represented in a parameter prediction model, and adjusting one or more real-time parameters of the image capture device based at least in part on one or more parameter values associated with the particular type of scene.
    Type: Grant
    Filed: March 27, 2015
    Date of Patent: November 21, 2017
    Assignee: Intel Corporation
    Inventors: Edmond Chalom, Dmitry Rudoy, Noam Levy, Harish Essaky Sankaran, Jarno Nikkanen, Joni-Matti Maatta, German Voronov
  • Publication number: 20160284095
    Abstract: Methods, apparatuses and systems may provide for operating a machine learning device by obtaining training image data, conducting an offline prediction analysis of the training image data with respect to one or more real-time parameters of an image capture device, and generating one or more parameter detection models based on the offline prediction analysis. Additionally, methods, apparatuses and systems may provide for operating the image capture device by obtaining a candidate image associated with the image capture device, determining that the candidate image corresponds to a particular type of scene represented in a parameter prediction model, and adjusting one or more real-time parameters of the image capture device based at least in part on one or more parameter values associated with the particular type of scene.
    Type: Application
    Filed: March 27, 2015
    Publication date: September 29, 2016
    Inventors: Edmond Chalom, Dmitry Rudoy, Noam Levy, Harish Essaky Sankaran, Jarno Nikkanen, Joni-Matti Maatta, German Voronov
  • Publication number: 20110235910
    Abstract: Disclosed is a system and method for image processing and image subject matching. A circuit and system may be used for matching/correlating an object/subject or person present (i.e. visible within) within two or more images. An object or person present within a first image or a first series of images (e.g. a video sequence) may be characterized and the characterization information (i.e. one or a set of parameters) relating to the person or object may be stored in a database, random access memory or cache for subsequent comparison to characterization information derived from other images.
    Type: Application
    Filed: June 30, 2010
    Publication date: September 29, 2011
    Inventors: Omri Soceanu, Guy Berdugo, Yair Moshe, Dmitry Rudoy, Itsik Dvir, Dan Raudnitz
  • Patent number: 7586281
    Abstract: Methods, apparatus, and articles of manufacture control a device or system that has an operational limit related to the rate or frequency of operation. The frequency of operation is controlled at a variable rate calculated to maximize the system or apparatus performance over a calculated period of time short enough that a controlling factor, such as power consumption, does not vary significantly during the period. Known system parameters, such as thermal resistance and capacitance of an integrated circuit (IC) and its package, and measured values, such as current junction temperature in an IC, are used to calculate a time-dependent frequency of operation for the upcoming time period that results in the best overall performance without exceeding the operational limit, such as the junction temperature.
    Type: Grant
    Filed: July 24, 2006
    Date of Patent: September 8, 2009
    Assignee: Intel Corporation
    Inventors: Aviad Cohen, Lev Finkelstein, Avi Mendelson, Ronny Ronen, Dmitry Rudoy
  • Patent number: 7464278
    Abstract: The operating rate of an electronic system is maximized without exceeding a thermal constraint, such as a maximum junction temperature of an integrated circuit (IC) or other portion of the electronic system. An operating parameter of the system that controls the thermal output of the system is calculated for an upcoming time period based upon the previously measured thermal performance relationship to the operating parameter level. If the predicted thermal performance will exceed a maximum allowable level of the thermal constraint, then the operating parameter is reduced by an amount calculated to keep the thermal constraint at a level just below the maximum allowable level, thus resulting in an optimal control approach to maximizing the system performance while not exceeding the thermal constraint.
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: December 9, 2008
    Assignee: Intel Corporation
    Inventors: Aviad Cohen, Adam De La Zerda, Lev Finkelstein, Ronny Ronen, Dmitry Rudoy
  • Publication number: 20070061021
    Abstract: The operating rate of an electronic system is maximized without exceeding a thermal constraint, such as a maximum junction temperature of an integrated circuit (IC) or other portion of the electronic system. An operating parameter of the system that controls the thermal output of the system is calculated for an upcoming time period based upon the previously measured thermal performance relationship to the operating parameter level. If the predicted thermal performance will exceed a maximum allowable level of the thermal constraint, then the operating parameter is reduced by an amount calculated to keep the thermal constraint at a level just below the maximum allowable level, thus resulting in an optimal control approach to maximizing the system performance while not exceeding the thermal constraint.
    Type: Application
    Filed: September 12, 2005
    Publication date: March 15, 2007
    Inventors: Aviad Cohen, Adam De La Zerda, Lev Finkelstein, Ronny Ronen, Dmitry Rudoy
  • Publication number: 20060273753
    Abstract: Methods, apparatus, and articles of manufacture control a device or system that has an operational limit related to the rate or frequency of operation. The frequency of operation is controlled at a variable rate calculated to maximize the system or apparatus performance over a calculated period of time short enough that a controlling factor, such as power consumption, does not vary significantly during the period. Known system parameters, such as thermal resistance and capacitance of an integrated circuit (IC) and its package, and measured values, such as current junction temperature in an IC, are used to calculate a time-dependent frequency of operation for the upcoming time period that results in the best overall performance without exceeding the operational limit, such as the junction temperature.
    Type: Application
    Filed: July 24, 2006
    Publication date: December 7, 2006
    Inventors: Aviad Cohen, Lev Finkelstein, Avi Mendelson, Ronny Ronen, Dmitry Rudoy
  • Patent number: 7141953
    Abstract: Methods, apparatus, and articles of manufacture control a device or system that has an operational limit related to the rate or frequency of operation. The frequency of operation is controlled at a variable rate calculated to maximize the system or apparatus performance over a calculated period of time short enough that a controlling factor, such as power consumption, does not vary significantly during the period. Known system parameters, such as thermal resistance and capacitance of an integrated circuit (IC) and its package, and measured values, such as current junction temperature in an IC, are used to calculate a time-dependent frequency of operation for the upcoming time period that results in the best overall performance without exceeding the operational limit, such as the junction temperature.
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: November 28, 2006
    Assignee: Intel Corporation
    Inventors: Aviad Cohen, Lev Finkelstein, Avi Mendelson, Ronny Ronen, Dmitry Rudoy
  • Publication number: 20050088137
    Abstract: Methods, apparatus, and articles of manufacture control a device or system that has an operational limit related to the rate or frequency of operation. The frequency of operation is controlled at a variable rate calculated to maximize the system or apparatus performance over a calculated period of time short enough that a controlling factor, such as power consumption, does not vary significantly during the period. Known system parameters, such as thermal resistance and capacitance of an integrated circuit (IC) and its package, and measured values, such as current junction temperature in an IC, are used to calculate a time-dependent frequency of operation for the upcoming time period that results in the best overall performance without exceeding the operational limit, such as the junction temperature.
    Type: Application
    Filed: September 3, 2004
    Publication date: April 28, 2005
    Inventors: Aviad Cohen, Lev Finkelstein, Avi Mendelson, Ronny Ronen, Dmitry Rudoy