Abstract: A method of initializing and programming a 3D non-volatile memory device includes applying a first program voltage to a selected string selection line coupled to a selected memory layer among the plurality of memory layers; verifying whether threshold voltages of a plurality of string selection transistors reach a target value to determine the plurality of string selection transistors as programmed string selection transistors or unprogrammed string selection transistors; programming memory cell transistors of one or more of memory strings coupled with the programmed string selection transistors to have a predetermined threshold voltage, by applying a second program voltage to a selected wordline among the plurality of wordlines; and program-inhibiting channel lines of the programmed string selection transistors using the programmed memory cell transistors as screening transistors and applying a third program voltage to the selected string selection line to selectively program the unprogrammed string selectio

Abstract: A method of initializing and programming a 3D non-volatile memory device includes applying a first program voltage to a selected string selection line coupled to a selected memory layer among the plurality of memory layers; verifying whether threshold voltages of a plurality of string selection transistors reach a target value to determine the plurality of string selection transistors as programmed string selection transistors or unprogrammed string selection transistors; programming memory cell transistors of one or more of memory strings coupled with the programmed string selection transistors to have a predetermined threshold voltage, by applying a second program voltage to a selected wordline among the plurality of wordlines; and program-inhibiting channel lines of the programmed string selection transistors using the programmed memory cell transistors as screening transistors and applying a third program voltage to the selected string selection line to selectively program the unprogrammed string selectio

Abstract: A method of initializing and programming a 3D non-volatile memory device includes applying a first program voltage to a selected string selection line coupled to a selected memory layer among the plurality of memory layers; verifying whether threshold voltages of a plurality of string selection transistors reach a target value to determine the plurality of string selection transistors as programmed string selection transistors or unprogrammed string selection transistors; programming memory cell transistors of one or more of memory strings coupled with the programmed string selection transistors to have a predetermined threshold voltage, by applying a second program voltage to a selected wordline among the plurality of wordlines; and program-inhibiting channel lines of the programmed string selection transistors using the programmed memory cell transistors as screening transistors and applying a third program voltage to the selected string selection line to selectively program the unprogrammed string selectio

Abstract: A method of controlling a 3D non-volatile memory device includes initially leveling threshold voltages of the string selection transistors disposed in one or more of the plurality of memory layers to have a predetermined target level; applying a first time varying erase voltage signal having a first time varying section to a first plurality of channel lines of a first memory layer selected among the plurality of memory layers comprising the initially leveled string selection transistors; and setting threshold voltages of the initially leveled string selection transistors in the first memory layer by controlling each of the plurality of string selection lines respectively coupled with the initially leveled string selection transistors during the first time varying section of the first time varying erase voltage signal.

Abstract: A 3D non-volatile memory device may include a dummy string selection line, string selection lines, wordlines, bitlines, a ground selection line, and memory layers. Each of the memory layers comprising channel lines respectively coupled to the bitlines via first ends and coupled to a common source line of the memory layer via second ends. The dummy string selection line, the string selection lines, the wordlines, and the ground selection line intersect with the channel lines, and each of the channel lines defines a memory string. Initializing the 3D non-volatile memory device may include programming string selection transistors coupled with the string selection lines to have one or more threshold values, and programming a dummy string selection transistor coupled with the dummy string selection line to have a predetermined threshold value, such that the dummy string selection transistor together with the string selection transistors function as string selection transistors.

Abstract: A 3D non-volatile memory device may include a dummy string selection line, string selection lines, wordlines, bitlines, a ground selection line, and memory layers. Each of the memory layers comprising channel lines respectively coupled to the bitlines via first ends and coupled to a common source line of the memory layer via second ends. The dummy string selection line, the string selection lines, the wordlines, and the ground selection line intersect with the channel lines, and each of the channel lines defines a memory string. Initializing the 3D non-volatile memory device may include programming string selection transistors coupled with the string selection lines to have one or more threshold values, and programming a dummy string selection transistor coupled with the dummy string selection line to have a predetermined threshold value, such that the dummy string selection transistor together with the string selection transistors function as string selection transistors.

Abstract: A method of initializing and programming a 3D non-volatile memory device includes applying a first program voltage to a selected string selection line coupled to a selected memory layer among the plurality of memory layers; verifying whether threshold voltages of a plurality of string selection transistors reach a target value to determine the plurality of string selection transistors as programmed string selection transistors or unprogrammed string selection transistors; programming memory cell transistors of one or more of memory strings coupled with the programmed string selection transistors to have a predetermined threshold voltage, by applying a second program voltage to a selected wordline among the plurality of wordlines; and program-inhibiting channel lines of the programmed string selection transistors using the programmed memory cell transistors as screening transistors and applying a third program voltage to the selected string selection line to selectively program the unprogrammed string selectio

Abstract: A method of controlling a 3D non-volatile memory device includes initially leveling threshold voltages of the string selection transistors disposed in one or more of the plurality of memory layers to have a predetermined target level; applying a first time varying erase voltage signal having a first time varying section to a first plurality of channel lines of a first memory layer selected among the plurality of memory layers comprising the initially leveled string selection transistors; and setting threshold voltages of the initially leveled string selection transistors in the first memory layer by controlling each of the plurality of string selection lines respectively coupled with the initially leveled string selection transistors during the first time varying section of the first time varying erase voltage signal.